High-speed multi-inspection has become possible.
The vertical probe VBP-C method enables high-speed multi-testing.
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basic information
【Features】 ○Electrical characteristics: Capable of over 500MHz depending on substrate specifications ○Number of multi: Can perform bulk inspection of wafers ○Number of pins: Proven track record of over 5000 pins ○Min pitch: 80um matrix ●For other functions and details, please download the catalog or contact us.
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Company information
Koyo Technos has been engaged in the manufacturing of inspection fixtures for printed circuit boards, semiconductor packages, and other advanced inspection devices, which can be considered the heart of cutting-edge inspection equipment, since its establishment. As market demands for multifunctionality, high density, high performance, and ultra-compactness continue to rise, our product lineup, backed by advanced technology, consistently receives unwavering recognition in all advanced fields. Our consistent theme is to accurately respond to user demands with foresight that captures the trends of the times. This micron-level precision technology, which does not allow competitors to catch up, has generated strong trust in the market.