Long-term monitoring running test device for conducting power-on tests of transistors and FETs (capable of temperature stress response).
The Model 6300A is a semiconductor device running test equipment that records the electrical characteristics of FETs and transistors for extended periods under burn-in test conditions. The detection resistance can be replaced according to the characteristics of the FETs and transistors. *Product specifications are subject to change without notice. Thank you for your understanding.*
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basic information
- 1 unit: 10ch - Maximum gate bias: 15V/100mA - Maximum drain bias: 100V/100mA - Maximum test time: approximately 8,000H - Option: high-temperature device - Option: unit expansion *Product specifications are subject to change without notice. Thank you for your understanding.*
Price information
Please feel free to contact us.
Price range
P5
Delivery Time
※It varies depending on the options.
Applications/Examples of results
- Transistor - FET (Field Effect Transistor)
Company information
Since its establishment in 1977, our company has contributed to the development of semiconductors and electronic components for many leading companies. Based on our know-how related to electrostatics, including high-speed and high-voltage technology, we manufacture and sell various products and systems for accurately measuring and analyzing analog signals.
![Gate Leak Tester [GL Tester]](https://image.mono.ipros.com/public/product/image/bbd/2000097518/IPROS17969377714215099.jpg?w=280&h=280)
