Example: Conduction OPEN Monitoring System

Ideal for drop impact tests! It monitors the moment of mechanical stress!

- A system that can monitor the moment when the electrical resistance in the conduction path of electronic components increases or becomes open (OPNE) due to mechanical stress occurring at regular intervals, such as during drop impact tests. - Based on trigger information from impact signals (such as acceleration), resistance value data is collected for a fixed period before and after the trigger for 10 msec at intervals of 1 μsec (10,000 points). - By comparing with management standards, if the peak resistance value of each channel exceeds the management value, an event signal can be generated. - The stored information can be re-read using the Viewer function, regardless of whether it is during or after data collection. Additionally, results such as peak resistance values can be extracted as text data.

Other temperature and humidity measuring instruments