Unifying the semiconductor testing phase to improve work efficiency.
SIVA is a test framework specialized for semiconductor testing. By managing it with a unified framework, it enhances the reusability of programs and enables the development of new tests with reduced time and cost. Testing is conducted under a unified framework from development to production, allowing for high-quality management. At Peritec, we create modular programs using the LabVIEW programming language for each function, build test sequences with TestStand, and further develop a highly functional and extensible test system in a short period through management by SIVA.
Inquire About This Product
basic information
[Features] - Easy setting of measurement parameters - Increased reusability through templates - Visualization of debug tests
Price range
Delivery Time
Applications/Examples of results
Test framework application
catalog（1）
Download All Catalogs
Company information
Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.
![[Development Case] RFID Test System - Solving UHF Band Null Points -](https://image.mono.ipros.com/public/product/image/fd7/260049/IPROS_17446819669983183000.jpg?w=280&h=280)
![Laser Diode Test System [LD2920TB]](https://image.mono.ipros.com/public/product/image/929/2000619945/IPROS86506555519922643512.png?w=280&h=280)
