The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.
By measuring the sample, it is possible to evaluate the crystal structure through the combination of results obtained and simulations. This document introduces a case study in which the crystal structure is discussed by comparing the results obtained from HAADF-STEM and EDX measurements on polycrystalline neodymium magnets with simulated images using the respective measurement conditions. The combination of measurement results and computational simulation results allows for a deeper understanding of the crystal structure.
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Analysis of LSI, memory, power devices, optical devices, solar cells, secondary batteries, and oxide semiconductors.
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Download All Catalogs![[Analysis Case] Evaluation of Crystal Structure Using a Combination of STEM/EDX Data and Image Simulation_C0558](https://image.mono.ipros.com/public/catalog/image/01/02e/458116/IPROS12397552870945855898.jpg?w=120&h=170)
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
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