SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.
The 『TH281』 is a compact test handler designed for room temperature/high temperature measurements compatible with devices such as SOP, SSOP, and TSSOP. It features a structure that allows for docking with large test heads and is compatible with various sockets including standard sockets, high-frequency sockets, and flat contacts. Additionally, each component has been modularized to achieve quick changeover between different types. 【Features】 ■ High throughput, low jam rate, space-saving ■ Large-capacity loader and unloader suitable for mass production ■ Structure compatible with docking large test heads ■ Modularized components for quick changeover ■ Compatible with various sockets *For more details, please refer to the PDF materials or feel free to contact us.
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【Specifications (Excerpt)】 ■Target Devices: SOP, SSOP, TSSOP, DIP ■Target Magazine: Aluminum multi-tube magazine *Single tube compatible ■Utilities ・Power Supply: AC200V 1φ 50/60Hz, 4KVA max ・Air: Clean, dry compressed air at 0.5MPa or higher ■External Dimensions: 900mm(W) × 900mm(D) × 1600mm(H) ■Weight: Approximately 500Kg *For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■SOP, SSOP, TSSOP *For more details, please refer to the PDF document or feel free to contact us.
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We design, manufacture, and sell semiconductor inspection equipment, particularly for power semiconductors. In addition to inspection equipment, we also design and manufacture production equipment tailored to our customers' needs. We can also accommodate equipment outside of the semiconductor field. Please feel free to contact us with your requests.