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Consumables for ICP-MS

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last updated:Apr 18, 2022

アジレント・テクノロジー株式会社
アジレント・テクノロジー株式会社
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Parts and consumables that improve the performance and analytical quality of ICP-MS! Supports rapid screening of large samples.

Agilent ICP-MS parts and consumables are designed, manufactured, and tested based on strict specifications, supporting your analysis with comprehensive support. They are powerful tools that simplify analysis and help you achieve the necessary results. They enable reliable trace analysis, reduce interference, and contribute to increased productivity. Additionally, the "Agilent Cone Care Kit and Magnifier" enhance the reliability of ICP-MS interface cone inspections and reduce the burden. 【Features of the Agilent Cone Care Kit and Magnifier】 - Inspection of the condition of the sampling cone or gap cone - Check for the presence of matrix accumulation on the chip - Confirmation of the success of cleaning and maintenance procedures - Check the necessity for cone replacement (especially due to enlargement or damage of the opening) - Elimination of the hassle of removing the cone from the lab for inspection under a microscope *For more details, please refer to the PDF materials or feel free to contact us.

    Analytical Equipment and DevicesSpectroscopic Analysis Equipment
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Consumables for ICP-MS

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  • Related Link - https://www.chem-agilent.com/contents.php?id=10049…

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【Lineup】 ■Nebulizer ■Spray Chamber ■Torch ■Gas Line Supply ■Interface Cone ■Electron Multiplier ■Consumables for Vacuum System ■Standard Liquid *For more details, please refer to the PDF document or feel free to contact us.

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Improving the reliability of interface cone inspection and reducing the burden <Consumables for ICP-MS>

Improving the reliability of interface cone inspection and reducing the burden <Consumables for ICP-MS>

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Consumables for spectroscopic analysis

Consumables for spectroscopic analysis

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Starting from here: Analysis of ICP-OES and ICP-MS - Measurement Edition

Starting from here: Analysis of ICP-OES and ICP-MS - Measurement Edition

  • Seminar・Event

【In response to requests, a re-broadcast has been decided!】 For those who want to see the highly acclaimed "Starting with ICP-OES and ICP-MS Analysis" again, as well as for newcomers, this is a must-see!! The content is a re-broadcast of the webinar recording held in July 2024. Please note that it will contain overlapping content for those who have already participated. ============= Day 2 Measurement Edition Overview Recent analytical instruments, not limited to ICP-OES and ICP-MS, have become easier to operate, allowing anyone to perform measurements. However, is the measurement method optimal for the analysis you require? In this seminar, we will review the minimum things you should confirm when constructing measurement methods for ICP-OES and ICP-MS together. Additionally, we will introduce the latest technologies in ICP-OES and ICP-MS that support your measurements. This content is suitable for those who are just starting with ICP-OES and ICP-MS analysis, those who are using their usual measurement methods somewhat casually, and those who want to confirm things again. By participating in this seminar, you will gain confidence in your analysis starting today.

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Starting from here: Analysis and Measurement of ICP-OES and ICP-MS

Starting from here: Analysis of ICP-OES and ICP-MS

  • Seminar・Event

【In response to requests, a re-broadcast has been decided!】 For those who want to see again the highly acclaimed "Starting with ICP-OES and ICP-MS Analysis," as well as for newcomers, this is a must-see!! The content is a re-broadcast of the webinar recording held in July 2024. Please note that it will be duplicate content for those who have already participated. ============= Day 1 Analysis Section Recent analytical instruments, not limited to ICP-OES and ICP-MS, can provide some measurement values when measured, but are those measurement values what you are looking for in your analysis? In this seminar, we will review together the minimum things that need to be confirmed to turn the measurement values obtained from ICP-OES and ICP-MS into analytical values. This content is suitable for those who are starting to analyze with ICP-OES and ICP-MS, those who have concerns about their usual measurement results, and those who want to gain more confidence. By participating in this seminar, you can gain confidence in your analysis starting today. The content is not dependent on the instruments or manufacturers you own. We look forward to your participation.

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[3/6 Webinar] Inorganic Analysis Automation and Labor-saving Seminar 2025 - Future Analysis of ICP-MS and ICP-OES

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The preparation of standard solutions and the dilution of samples require time and effort, and can also lead to human error. Therefore, automation and labor-saving measures are gaining attention in various fields such as environmental analysis and materials analysis. The automatic dilution device ADS2 released by Agilent enables the automatic dilution of standard solutions and samples, achieving automation and labor-saving in laboratories. In this seminar, Agilent will present proposals for automation and labor-saving using ADS2, and Mr. Yoshihiro Kumazawa, a technical advisor specialist from BL Tech Co., Ltd., will give a lecture titled "Proposal for Automation and Labor-Saving from Pretreatment to Measurement of Environmental Water and Wastewater Samples Using AATM from BL Tech Co., Ltd." 【Program】 15:05 - 15:45 "Proposal for Automation and Labor-Saving Using the Automatic Dilution Device ADS2" Agilent Technologies, Elemental Analysis Sales Department, Yasuki Odomari, Shota Shimada 15:45 - 16:05 "Proposal for Automation and Labor-Saving from Pretreatment to Measurement of Environmental Water and Wastewater Samples Using AATM from BL Tech Co., Ltd." BL Tech Co., Ltd., Osaka Sales Department, Technical Advisor Specialist, Yoshihiro Kumazawa

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Latest Analysis Cases of LA-ICP-MS - Agilent LA-ICP-MS Seminar 2024

Latest Analysis Cases of LA-ICP-MS - Agilent LA-ICP-MS Seminar 2024

  • Seminar・Event

LA-ICP-MS (Laser Ablation Inductively Coupled Plasma Mass Spectrometry) is gaining attention as a highly effective method for trace element analysis of solid samples. This technique allows for the analysis of solid samples without the need for prior dissolution by directly introducing tiny particles (aerosols) generated by laser irradiation of the solid sample into the ICP-MS via a flow of He or Ar gas. LA-ICP-MS features high sensitivity analysis, simultaneous multi-element analysis, and localized analysis, demonstrating its power in applications such as materials analysis, semiconductor analysis, life sciences, and forensic science. In this seminar, a wide range of analysis cases from customers already using LA-ICP-MS will be presented, along with the latest technologies from laser ablation manufacturers, and Agilent will also provide the latest information. An information exchange session is also planned at the seminar venue, offering a valuable opportunity to speak directly with speakers and Agilent's application engineers.

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アジレント・テクノロジー株式会社

アジレント・テクノロジー株式会社

Testing, Analysis and Measurement

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Agilent was born out of the Hewlett-Packard Company's spin-off in 1999. Since then, we have received numerous awards related to innovation and have obtained patents for inventions that surpass those accolades. More importantly, the number of customers we serve has been increasing year by year, demonstrating the strength of our partnerships. Agilent has become a leader in the life sciences, diagnostics, and applied chemistry markets. We provide instruments, services, consumables, applications, and expertise to laboratories around the world, contributing to the discovery of insights that our customers are exploring. Through our expertise and reliable collaboration, we offer highly dependable solutions to our customers.

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