The orientation distribution of the magnet can be understood through SEM and EBSD, allowing for the assessment of product performance and changes over time.
Electron Backscatter Diffraction Pattern (EBSD) allows for the understanding of the crystal orientation distribution of materials when combined with a Scanning Electron Microscope (SEM). This case introduces "EBSD measurement of samarium cobalt magnets." Many customers are utilizing this technology for performance evaluation and improvement of various magnets. Please take a look at the PDF materials. In addition to EBSD and SEM, our company also conducts various cross-sectional analyses using TEM and surface analysis using XPS, providing multifaceted analytical services. Both sales and technical staff are available for direct assistance, so we would be grateful if you could feel free to consult with us. Seiko Future Creation Official Website: https://www.seiko-sfc.co.jp/
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The summary of this case is as follows: ●Objective: Investigate the crystallographic orientation distribution of samarium-cobalt magnets ●Method: SEM EBSD method ●Results: It was confirmed that the samarium-cobalt magnets are oriented in the ND direction.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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