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  6. High-speed and high-precision thickness measurement! Precitech non-contact sensor.

High-speed and high-precision thickness measurement! Precitech non-contact sensor.

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last updated:Mar 25, 2025

プレシテック・ジャパン
プレシテック・ジャパン
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In addition to the conventional chromatic aberration confocal method and spectral interference method, a thickness measurement sensor utilizing laser heating has also emerged. It can measure the thickness of both transparent and opaque materials non-contactly.

Presitech is a German manufacturer of non-contact sensors. It develops and manufactures optical sensors using chromatic aberration confocal method and spectral interference method. At the end of 2022, it acquired the French company Enovasense, adding sensors that utilize laser heating to measure the thickness of opaque materials to its lineup. The company specializes in high-speed and high-precision thickness measurement, which is used for inspecting wafers, coatings, films, paint films, anti-corrosion coatings, and more. It offers a wide measurement range, tolerance angles, and can accommodate various materials, including line sensors and area scanners suitable for full surface measurement. There are numerous achievements in integrating these sensors into semiconductor manufacturing equipment, and they are also used in LCD manufacturing equipment and inline inspection of films. Additionally, they are utilized as embedded sensors for tabletop machines such as standalone units. Enovasense's sensors have also demonstrated success in measuring coating thickness for aerospace-related components. *For product details, please refer to the materials available for download in PDF format. Feel free to contact us with any inquiries.*

    Sensors
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High-speed and high-precision thickness measurement! Precitech non-contact sensor.

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  • Related Link - https://www.precitec.com/jp/
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basic information

**Principle** Our products mainly have three types of measurement principles. ■ Chromatic Aberration Confocal Primarily used for measuring surface shapes, but can also be utilized for measuring the thickness of transparent materials. While it is less accurate than spectral interference methods, it is recommended if you are looking for a cost-effective thickness measurement. ■ Spectral Interference Method Mainly used for thickness measurement. It enables high-precision measurements at the sub-micron level, leveraging the strengths of the spectral interference method. High-speed measurements necessary for in-situ, monitoring, or inline applications are possible. ■ Method Utilizing Laser Heating (Sensors from Enovasense) Heats the target object with a laser diode. It takes advantage of the fact that the speed of heat propagation differs depending on thickness. Using a proprietary algorithm, it detects the radiant heat from the target object and converts it into thickness. **Product Lineup** - Single Point Sensors Available in high-precision types as well as more affordable options under 1 million yen. - Line Sensors Using chromatic aberration confocal technology, it can perform full-area measurements in conjunction with an operating stage. - Area Scanner Sensors A type that can perform area scans with a two-axis galvanometer. There are also area scanners that do not require an operating stage and are unaffected by vibrations.

Price range

P5

Delivery Time

Please contact us for details

Applications/Examples of results

Please use for the following thickness measurement applications: wafers, doped wafers, coatings, films, paint films, anti-corrosion coatings, films, battery foils, paint films, wet coatings, dry coatings, alloy coatings for rust prevention, vapor-deposited films, aluminum anodizing, zinc plating, and coatings on fuel cell bipolar plates.

catalog(5)

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New Product - CHRocodile 2 SX Optical Wide-Range Thickness Measurement Sensor

New Product - CHRocodile 2 SX Optical Wide-Range Thickness Measurement Sensor

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Data Sheet - Thickness Measurement Sensor CHRocodile 2LR ver2

Data Sheet - Thickness Measurement Sensor CHRocodile 2LR ver2

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Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

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Prestech's lineup of non-contact thickness measurement sensors

Prestech's lineup of non-contact thickness measurement sensors

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Introduction of UTG (Ultra-Thin Glass) Thickness and Shape Measurement Sensor

Introduction of UTG (Ultra-Thin Glass) Thickness and Shape Measurement Sensor

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News about this product(4)

2026 OPIE Exhibition Information

  • Seminar・Event

We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.

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Nepcon Japan 2026

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We will be exhibiting at Nepcon Japan 2026, which will be held at Tokyo Big Sight from January 21 (Wed) to January 23 (Fri), 2026. If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Chromatic aberration confocal optical line sensor CLS2 3. Non-contact thickness measurement sensor for opaque materials Enovasnese

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The 1st Kyushu Semiconductor Industry Exhibition

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We will be exhibiting at the Kyushu Semiconductor Industry Exhibition held at Marine Messe Fukuoka on September 25 (Wednesday) and September 26 (Thursday), 2024. If you are interested, please come to the venue. ■ Products to be exhibited - Spectral interference optical thickness sensor CHRocodile 2 DW/2IT - Chromatic aberration confocal optical line sensor CLS2.0 - Chromatic aberration confocal optical single-point sensor CHRocodile 2S, C, Mini *This time, there will be no actual display of the FSS for 12" wafer thickness mapping measurement, but if you need an explanation or would like to request a demo, please come to our booth.

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Nepcon Japan 2025

  • Seminar・Event

We will be exhibiting at NEPCON Japan, held at Tokyo Big Sight from January 22 to 24, 2025. If you are interested, please feel free to visit our booth. ■ Products to be exhibited - Spectral interference thickness sensor CHRocodile 2IT - Area scanner FSS80 - Chromatic aberration confocal sensor CHRocodile Mini - Chromatic aberration confocal line sensor CLS2 - Chromatic aberration confocal line camera CVC - Thickness measurement sensor for opaque materials Enovasense - Area sensor for internal defect inspection Field sensor

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プレシテック・ジャパン

プレシテック・ジャパン

Testing, Analysis and Measurement

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Presitech is a specialist in laser material processing and optical measurement technology. We are not just a supplier of systems and components, but a professional partner in ensuring a smooth processing process for our customers. We offer consultations from the foundational stage and accurately consult with customers on their requests and objectives. We understand that the key to success in unique processing processes lies in the four components of exhibition, monitoring, processing, and control. Only by doing so can we provide appropriate solutions for our customers' applications. Our high-quality products, such as laser processing heads, quality monitoring systems, and optical measurement systems for spacing/thickness measurement, allow customers to directly benefit from our decades of experience. Our optical sensors are characterized by the highest precision and dynamic adaptability. Furthermore, they detect accurate values even in high-speed measurements.

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