Technical Information Magazine 201905-01 Crystal Orientation Analysis with High Spatial Resolution
The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.
**Abstract** Using the TEM-based crystal orientation analysis system "ASTAR," it is possible to achieve higher spatial resolution than that of SEM-based EBSD (with spatial resolution of various EBSD methods being around tens of nanometers, while the ACOM-TEM method using ASTAR achieves 2 to 5 nm). Additionally, it is characterized by the ability to identify a greater variety of crystal structures. By obtaining crystal orientation maps, crystal phase maps, and grain size distributions that are difficult to acquire through conventional TEM analysis, quantitative interpretation becomes possible. Furthermore, since measurements can be taken in the same field of view as TEM observations, it allows for complex analyses combined with (S)TEM-EDX/EELS and the use of in-situ TEM. **Table of Contents** 1. Introduction 2. ACOM-TEM Method Using ASTAR 3. Examples of Analysis Using ASTAR 4. Conclusion
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Technical Information Magazine The TRC News "Crystal Orientation Analysis and Crystal Phase Mapping with High Spatial Resolution - ACOM-TEM Method Using ASTAR*" *ASTAR is a registered trademark of NanoMEGAS. [Abstract] Using the TEM-based crystal orientation analysis system "ASTAR," it is possible to achieve higher spatial resolution than SEM-based EBSD (while the spatial resolution of various EBSD methods is around several tens of nm, the ACOM-TEM method using ASTAR achieves 2-5 nm). It is also characterized by the ability to identify a greater variety of crystal structures. By obtaining crystal orientation maps, crystal phase maps, and particle size distributions that are difficult to acquire with conventional TEM analysis, quantitative interpretation becomes possible. Furthermore, since measurements can be taken in the same field of view as TEM observations, it allows for complex analyses combined with (S)TEM-EDX/EELS and in-situ TEM. [Table of Contents] ACOM-TEM Method Using ASTAR Examples of Analysis Using ASTAR [Figures and Tables] Figures 1-4 Configuration of measurement systems for each method (schematic diagram) ASTAR measurement results on Au deposited films STEM observations and ASTAR measurement results in degraded battery cells containing LiNi1/3Co1/3Mn1/3O2
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At Toray Research Center, Inc., we provide technical support through analytical techniques and physical property analysis to address various challenges in research and development as well as production fields via contract analysis. Based on our long-standing achievements and extensive experience in analysis and physical property evaluation, we continue to strive to meet the advanced and diverse needs of our customers.
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