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  6. PIC (Photonic Integrated Circuit) Test Solution

PIC (Photonic Integrated Circuit) Test Solution

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last updated:Nov 17, 2025

セブンシックス
セブンシックス
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Customize the optical integrated circuit you want to measure! Introducing our testing solutions.

We provide a wide range of PIC testing environments, including passive and active component testing and BER testers. Based on your requirements, we can customize the configuration for each optical integrated circuit you wish to measure. Please feel free to contact us when you need assistance. 【Features】 ■ We offer testing environments for a wide range of optical integrated circuits at the wafer level, die level, and component level. ■ We provide a one-stop solution from automation software and probe systems to optical/electrical/performance measurement systems. * You can download the Japanese and English versions of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

    Tester
PIC(光集積回路)テストソリューション1.png

PIC (Photonic Integrated Circuit) Test Solution

PIC(光集積回路)テストソリューション1.png
PIC(光集積回路)テストソリューション1.png 8d0ff5c23f816e4c6280ca4032d391db.png
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*You can download the Japanese and English versions of the catalog. *For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

【Applications】 ■ Characteristic testing of Photonic Integrated Circuits (PIC) (IL, RL, PDL) ■ Spectral analysis (wavelength, optical power, OSNR, etc.) ■ Functional testing (BERT, eye diagram measurement, etc.) * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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PIC (Photonic Integrated Circuit) Test Solution <Japanese Version>

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セブンシックス

セブンシックス

Optical Instruments

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