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  4. Other measuring instruments
  5. Other measurement, recording and measuring instruments
  6. Contact/Non-contact Hybrid Thickness Measurement Application 'P3CF'

Contact/Non-contact Hybrid Thickness Measurement Application 'P3CF'

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P3CF

last updated:Feb 13, 2025

マーポス
マーポス
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Realizing non-contact thickness measurement of various materials that transmit white light.

The P3CF is a measurement system that combines traditional contact probes with a non-contact probe using confocal technology (hybrid measurement). It can directly measure the distance of various materials and the thickness of transparent materials in white light. The thickness of thin and delicate materials (such as ceramics, semiconductor wafers, and epoxy resin mold compounds for packaging) requires precise measurement in the finishing process, but it is challenging to measure with contact methods. The P3CF, which employs confocal technology, measures the thickness non-contact by determining the distance from the reference plane to the work surface. *For more details, please refer to the PDF document or feel free to contact us.*

    SensorsWaferOther measurement, recording and measuring instruments
P3CF_product.png

Contact/Non-contact Hybrid Thickness Measurement Application 'P3CF'

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P3CF_product.png P3CF_01s.jpg P3CR_02s.jpg
  • Related Link - https://www.marposs.com/jpn/product/hybrid-measure…
  • Special site - Product/service details - https://pr.mono.ipros.com/marposs/product/

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Contact/Non-contact Measurement (Chromatic Confocal Technology) Hybrid Application 'P3CF'

Contact/Non-contact Measurement (Chromatic Confocal Technology) Hybrid Application 'P3CF'

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Universal Gauge "UNIMAR" for Machine Tools

Universal Gauge "UNIMAR" for Machine Tools

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Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

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Notice of Participation in SEMICON JAPAN 2024

  • Seminar・Event

Our company will exhibit at "SEMICON JAPAN 2024," which will be held at Tokyo Big Sight starting December 11, 2024 (Booth number: 2705). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of the ever-evolving semiconductor manufacturing process and the improvement of semiconductor performance. We cordially invite you to visit our booth and take a look at our offerings. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Contact/non-contact (confocal technology) hybrid applications - Optical 3D surface roughness and shape measuring instruments - High-end 3D surface measurement for probe card inspection - Visual blade inspection system for dicing processes

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Testing, Analysis and Measurement

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Marpos Co., Ltd. was established in 1970 as the Japanese subsidiary of the Italian Marpos Group, aiming to be a partner in global manufacturing. For over 50 years, we have been providing precision measurement, inspection, and process management systems used during and after machining in manufacturing processes. We are a main supplier to major automotive manufacturers for both ICE (internal combustion engine) and EV (electric vehicle) and also extend our services to the semiconductor, aerospace, medical, energy, and home appliance industries. Regardless of the size or industry of our customers, we continue to boldly contribute to quality improvement, rationalization, flexibility, and productivity enhancement with Marpos's technology and know-how. Furthermore, in line with Marpos's corporate philosophy, we strive for total quality improvement, have obtained ISO 9001:2015 certification, and conduct design, manufacturing, and assembly in Japan. We have six domestic locations and two overseas locations, providing closely connected services to local customers.

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