High-speed line inspection at SWIR 2K×1, 110kHz
The LiSa SWIR 2048-M-STE2 is a high-sensitivity InGaAs line scan camera that captures the 0.9 to 1.7µm band. With a 2048×1 pixel global shutter, it achieves high-speed reading at full resolution of over 110kHz and a minimum exposure time of 1µs. It supports 14-bit A/D (output 8/10/12/14-bit) and can optimize throughput with ROI. Standard features include histogram-based AGC, 1-point/2-point NUC, defective pixel correction, horizontal inversion, and user presets. It is highly compatible with existing inspection software due to compliance with GenICam/GenCP and can be robustly connected via Camera Link Base. It operates on 6 to 24V, has a C mount, functions in temperatures from -40 to +71°C, and supports stable operation in factory environments with an adjustable TEC (power/trigger cable and 12V power supply included).
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basic information
- Imaging sensor: InGaAs (0.9–1.7µm), 2048×1, pixel pitch 8µm / pixel height 14µm, QE > 80% - Readout: Global shutter, ITR/IWR, full > 110kHz, exposure 1µs〜, 14bit ADC (effective approx. 4400DL), output 8/10/12/14bit, output geometry settings such as 1X_1Y available - Trigger: Internal / external (LVTTL), software, via Camera Link, variable delay - Image correction: AGC (Once/Manual), NUC (1-point/2-point, factory calibrated at 25°C), defective pixel correction, horizontal inversion, user presets ×4, temperature monitor - I/F/Software: Camera Link Base, compliant with GenICam/GenCP, NITGenicamControlTool (Windows) - Mechanism/Environment: 35.4×75×68mm, approx. 280g, C-mount, -40 to +71°C, power supply 6–24V, consumption <4W (TEC max <5W) - Accessories: 12V power supply, power/trigger cable (Hirose HR10)
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Applications/Examples of results
- Solar cell/module inspection (EL/PL) - Wafer/semiconductor line defect and positioning inspection - Appearance and defect inspection of high-temperature glass processes - Moisture and material difference sorting in food/recycling processes (utilizing near-infrared characteristics) - Appearance inspection of films/coatings/prints, foreign matter and contamination detection, etc. By leveraging SWIR characteristics to extract invisible information, it complements the gaps in visible inspections and contributes to improving inspection throughput and yield.
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Company information
The main segments where Chronix is active are semiconductors and electronic components for industrial, space, and defense applications. In the industrial sector, they sell CCD cameras and lenses in the machine vision field, as well as infrared detectors. For space semiconductors, they provide technology trends from major European manufacturers (such as SOFRADIR, Atmel, 3d plus, etc.), and sales of MIL components are also growing at competitive prices.
![Presentation of case materials for appearance inspection using image sensors [Product inspection of printed materials]!](https://image.mono.ipros.com/public/product/image/e78/2001077539/IPROS51988603313483846462.png?w=280&h=280)
