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  6. [Development Case] Development of an RF-IC Tester Compatible with Multiple Communication Devices

[Development Case] Development of an RF-IC Tester Compatible with Multiple Communication Devices

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last updated:Jan 08, 2021

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
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Development of an RF-IC tester compatible with multiple communication devices using PXI-RF modules.

Today's communication devices have started to use multiple communication standards within a single product. For example, devices like smartphones are equipped with various protocols such as W-CDMA, GPS, Bluetooth, WiFi, and NFC, with a wide range of frequency bands and inspection items. Additionally, due to the decreasing prices of communication equipment and the shortening of product life cycles, there is a need to reduce the costs of RF testing for a single communication device test. Therefore, Peritec Co., Ltd. has begun the development of an RF-IC tester that supports multiple communication devices, aiming for a price point of less than one-third that of general-purpose RF-IC testers.

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[Development Case] Development of an RF-IC Tester Compatible with Multiple Communication Devices

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During the development of the product, the following challenges were encountered. 1. It needed to be a low-cost RF-IC tester. To reduce the testing costs of devices, we aimed to build a tester that could perform multiple simultaneous measurements while keeping hardware costs low. 2. Consideration for characteristics. Since RF testing deals with high-frequency signals, it is easily affected by wiring and other factors. To minimize this impact, it was necessary to keep the wiring from the measurement object as short as possible. 3. Support for multiple communication standards. When inspecting devices for multiple communication standards, it was necessary to accommodate the testing requirements for each standard.

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RF-IC tester, wireless devices, communication equipment, production line testers, EMC evaluation equipment

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[Development Case] Development of an RF-IC Tester Compatible with Multiple Communication Devices

[Development Case] Development of an RF-IC Tester Compatible with Multiple Communication Devices

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ペリテック

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所

Testing, Analysis and Measurement

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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.

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