The PN determination of silicon wafers/blocks can be performed instantly.
The PN determination of silicon wafers/blocks can be performed instantly. It is a portable pen-type tester that allows for non-contact and non-destructive P/N determination.
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basic information
The PN tester PN-100 determines the P/N type of semiconductor materials non-contact and non-destructively. It is ideal for PN discrimination applications of silicon ingot materials, including silicon scraps and offcuts.
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Applications/Examples of results
It is ideal for PN discrimination applications of silicon ingot materials, including silicon scraps and offcuts.
Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.