Lifetime measurement device for single crystal silicon blocks
The lifetime measurement device WT-2000PI uses e-PCD technology to measure minority carrier lifetime in single crystal silicon ingot state without passivation treatment.
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basic information
The lifetime measurement device WT-2000PI uses e-PCD technology to measure minority carrier lifetime in single crystal silicon ingot state without passivation treatment.
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Applications/Examples of results
Manufacturing of semiconductor silicon ingots Manufacturing of silicon ingots for monocrystalline solar cells
Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.
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