You can perform in-circuit testing and JTAG boundary testing seamlessly.
Noah Corporation's in-circuit tester is a product that can perform both in-circuit testing and JTAG boundary testing simultaneously, which were previously conducted separately. There is no need to have two inspection devices, allowing for testing to be completed in one go, thereby reducing labor costs and saving space on the factory line. It also minimizes errors in management, making it a practical tester. For more details, please contact us or refer to the catalog.
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basic information
【Features】 ○ Easily confirm the connection of JTAG-compatible devices, eliminating the "troublesome" and "complicated" aspects of traditional JTAG testing. ○ Supports FPGA configuration via JTAG as an option. ○ Seamlessly perform in-circuit testing and JTAG boundary testing. ○ Achieves faster inspection speeds through a unique high-speed interface board. ○ Space-saving design through high-density switching board. ○ Utilizes the latest Windows 7 as the operating system. ○ User-friendly operation through automatic analysis of BSDL files. ● For more details, please contact us or refer to the catalog.
Price information
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Delivery Time
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Applications/Examples of results
【Purpose】 ○ Inspection of implementation boards, FPGA programming, and cable harness checks ● For more details, please contact us or refer to the catalog.
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Company information
Noah Corporation Co., Ltd. primarily engages in the design, development, and manufacturing of various inspection devices and semiconductor manufacturing equipment. We aim to improve our existing products by reducing "costs," making them "easier to use," and increasing processing "speed." We do not settle for the current status and continuously challenge ourselves with new endeavors. Utilizing our technology, experience, and enthusiasm, we respond to our customers' diverse needs.
