List of Measurement and Analysis products

  • classification:Measurement and Analysis

286~300 item / All 55219 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

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Support for a total of 48K points in both vertical and horizontal directions! A high-speed inspection solution for multi-panel arrangements of large full-panel PCBs (500×620mm).

  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment

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We provide simulation and verification solutions that cater to various applications, from autonomous driving to zero emissions!

  • Other process controls
  • controller
  • Testing Equipment and Devices

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Utilizing image analysis for tablet identification to ensure quality stability and alleviate labor shortages.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Achieving the assembly confirmation of medical device parts through image analysis. Supporting quality improvement and labor reduction.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Support for improving the efficiency of picking operations and stabilizing quality through image analysis.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Achieving apparel size determination through image analysis! Supporting quality stability and alleviating labor shortages.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Achieving defect detection in semiconductor manufacturing through image analysis. Supporting quality stability and alleviating labor shortages.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Achieving quality stability and alleviating labor shortages through image analysis. Also supports dimensional measurement.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Achieving quality stability in food processing and solving labor shortages through image analysis.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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Automating the verification of cosmetic fill levels through image analysis to stabilize quality and alleviate labor shortages.

  • 画像解析による自働化ソリューション2.png
  • Image analysis
  • Other inspection equipment and devices

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[Demo unit available for loan] It can visualize foreign substances, dirt, and scratches on the surface. It is well-received as a daily use tool for yield management, quality control, cleaning manageme...

  • Visual Inspection Equipment
  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Maintenance Resilience 2026 We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity, capable of visualizing the suspended or adhered states of micro and nano-sized particles in real time. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, inside and outside manufacturing equipment, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can cause quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that leads to reduced yield

[Web demo in progress] Ideal for easily visualizing airborne dust, airflow, and surface foreign objects!

  • UV/visible spectrophotometer
  • Leak Testing Equipment
  • Dust Meter

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Maintenance Resilience 2026: We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can lead to quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that causes yield reduction

Easily visualize airflow with good visibility.

  • Fluorescent lamp
  • Testing Equipment and Devices
  • Flow Control

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スライド1.PNG

Maintenance Resilience 2026: We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can lead to quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that causes yield reduction

Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo unit...

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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スライド1.PNG

Maintenance Resilience 2026: We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can lead to quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that causes yield reduction

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