List of Contract analysis and evaluation products
- classification：Contract analysis and evaluation
91～105 item / All 273 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Introducing how to differentiate the use of FT-IR and GC/MS when conducting component analysis!
- Other analysis and evaluation services
- Contract Analysis
- Ingredient analysis
Component analysis of organic matter (FT-IR and GC/MS)
Our "component analysis of organic substances" often utilizes FT-IR and GC/MS. In FT-IR measurements, it is possible to analyze the main components of organic substances by comparing the IR spectrum of known substances. Additionally, if you want to analyze not only the main components of unknown substances but also trace amounts of organic substances such as additives, we recommend conducting GC/MS measurements.
GxP compliance! An environmental monitoring system that centrally manages inspection-related environmental parameters.
- Other environmental analysis equipment
- Environmental Analysis
Analyze and evaluate development data! We support feedback for design. We also implement proposals for improving business workflows!
- Embedded system design service
- Other analysis and evaluation services
- Business Intelligence and Data Analysis
The detection depth increases, allowing for the evaluation of deeper areas!
- Other analysis and evaluation services
A method for evaluating the effects of X-rays on materials and their resistance!
- Other analysis and evaluation services
Non-destructive defect evaluation of large-diameter wafers from 4 inches to 6 inches with high resolution is possible!
- Other analysis and evaluation services
Moisture accumulated inside the component vaporizes due to thermal stress! Stress occurs due to volume expansion.
- Other analysis and evaluation services
By using infrared heating, it is possible to heat only the sample, allowing for a lower background!
- Other analysis and evaluation services
Successfully captured the n-buffer layer thickness and nitrogen (N) concentration using D-SIMS!
- Other analysis and evaluation services
Successfully captured impurity diffusion from the upper side of the gate oxide film using D-SIMS!
- Other analysis and evaluation services
If the membrane structure and composition information is known in advance, multilayer membranes can also be evaluated through simulation!
- Other analysis and evaluation services
Established a method for high-precision component evaluation using sensitivity and quantification-focused SIMS (D-SIMS)!
- Other analysis and evaluation services
Calculate the oxide film thickness of the SiO2 surface oxide film on the Si substrate using photoelectron spectroscopy!
- Other analysis and evaluation services
Under the condition of total reflection, the penetration depth of X-rays is shorter than the escape depth of photoelectrons, so the detection depth of HAXPES is determined by the penetration depth of ...
- Other analysis and evaluation services
In the investigation of the discoloration of metal components, qualitative analysis of the surface condition and evaluation using XPS of the thickness and depth distribution of the surface oxide film ...
- Other analysis and evaluation services