List of 3D measuring device products
- classification：3D measuring device
211～225 item / All 898 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
![[For Research Institutions] Real Na...](https://image.mono.ipros.com/public/product/image/248027/IPROS577054615448303967.jpg?w=280&h=280){kind=small}
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enables nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurements" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical methods enable the measurement of nanoscale fine structures.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale measurements with optical methods. For evaluating reflection characteristics.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Measured nanoscale shape accuracy using optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
3D modeling and drafting of products without drawings (e.g., manufacturing drawings for discontinued parts)
- 3D measuring device
- 3D CAD
Large workpieces can also be measured with high precision without contact!
- 3D measuring device
Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.
- 3D measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor