List of Contract Services products
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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
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HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
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XPS: X-ray photoelectron spectroscopy, etc.
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TEM: Transmission Electron Microscopy
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EBSD: Electron Backscatter Diffraction
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Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low...
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Processing under atmosphere control, cryo-processing, cooling, TEM: transmission electron microscopy and others.
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Processing under atmosphere control, cryo-processing, cooling, SEM: scanning electron microscopy and others.
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Cryo-processing cooling SEM: Scanning Electron Microscopy method
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Photoluminescence method
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XPS: X-ray Photoelectron Spectroscopy
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XRD: X-ray diffraction method
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TEM: Transmission Electron Microscopy
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LC/MS: Liquid Chromatography-Mass Spectrometry
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SIMS: Secondary Ion Mass Spectrometry
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GC/MS: Gas Chromatography-Mass Spectrometry
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Technical Information "Evaluation of Organic Contamination Using a Wafer Analyzer (B0230)" Released
We have published the following analysis case on the MST website: - Evaluation of organic contamination using a wafer analyzer (B0230) For more details, please visit the MST website. http://www.mst.or.jp/