List of Contract Services products
- classification：Contract Services
1441～1485 item / All 4641 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
- Other machine tools
Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
This is a course for those who want to learn the fundamentals of material properties. It explains the principles and measurement methods of material properties, mechanical property evaluation, materia...
- Distance learning/E-learning
- Contract Analysis
This is a course for those who want to learn surface analysis from the basics. It explains the principles and spectrum examples of TOF-SIMS, RBS, and XPS.
- Contract Analysis
- Distance learning/E-learning
Beginner's Online Course (e-learning) [Surface Analysis]
This is a course designed for those who want to learn about surface analysis from the basics. It provides easy and compact explanations on the following topics: - Surface analysis - TOF-SIMS: Time-of-flight secondary ion mass spectrometry (principles, spectrum examples) - RBS: Rutherford backscattering spectrometry (principles, spectrum examples) - XPS: X-ray photoelectron spectroscopy (principles, spectrum examples) - Measurement case: Organic EL devices As a benefit of taking the course, there is a "question and answer service regarding the course content." If you want to deepen your understanding of the principles of analytical methods or if you have unclear points about measurement cases that are difficult to convey in video lectures, an analysis expert will provide answers. ◎ For details on how to apply, please visit here: https://www.toray-research.co.jp/service/seminar/online/
This is a course for those who want to learn organic composition analysis from the basics. It explains the analysis results and interpretation of infrared spectroscopy, mass spectrometry, and nuclear ...
- Contract Analysis
- Other polymer materials
- Distance learning/E-learning
We will conduct diagnostics for wire rope strand breaks and shape changes, as well as inspections of overhead crane running rails, safely, quickly, and accurately!
- Contract Inspection
We evaluate the durability of electronic components and devices when repeatedly exposed to high and low temperatures.
- Impact Test
- Contract measurement
We evaluate the bonding strength of products and parts.
- Contract measurement
We evaluate the effects of vibrations and durability on electronic components, electronic devices, and other products during use or transportation.
- Contract measurement
We evaluate the impact of shocks and durability that electronic components, electronic devices, and other products experience during use or when dropped.
- Contract measurement
We evaluate and determine the sealing performance of sealed states in hollow structure components and the like.
- Contract measurement
Testing can be conducted using the solder pot balance method, solder ball balance method, and solder paste method.
- Contract measurement
We will evaluate the impact of thermal stress on electronic components in the implementation process.
- Contract measurement
Temperature cycle testing is possible with sample temperature control and air temperature control.
- Contract measurement
By detecting the sound generated when tiny foreign objects inside the hollow structure collide with the wall, it is possible to prevent troubles such as shorts before they occur.
- Contract measurement
We evaluate the effects and destruction tolerance when semiconductors and electronic components are subjected to stress from static electricity.
- Contract measurement
![[TEM ED-Map] TEM Electron Diffracti...](https://image.mono.ipros.com/public/product/image/371/2000823132/IPROS13976815575557580837.jpg?w=280&h=280){kind=small}
This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).
- Contract measurement
- Contract Analysis
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx
XRR：X-ray Reflectivity
- Contract Analysis
- Contract measurement
- Contract Inspection
![[FIB] Focused Ion Beam Processing](https://image.mono.ipros.com/public/product/image/b01/387108030/IPROS7900017760392336423.jpg?w=280&h=280){kind=small}
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Contract Analysis
- Contract measurement
- Contract Inspection
Obtain information about the molecular structure and crystal structure of the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.
We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★
![[EBSD] Electron Backscatter Diffrac...](https://image.mono.ipros.com/public/product/image/bef/387108007/IPROS4688397342881936146.jpg?w=280&h=280){kind=small}
It is possible to easily obtain crystal information over a wide area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EBIC] Electron Beam Induced Curren...](https://image.mono.ipros.com/public/product/image/03a/387108025/IPROS8986659968992890200.jpg?w=280&h=280){kind=small}
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EELS] Electron Energy Loss Spe...](https://image.mono.ipros.com/public/product/image/d11/387108027/IPROS1835117444880261851.jpg?w=280&h=280){kind=small}
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TDS] Thermal Desorption Gas Analys...](https://image.mono.ipros.com/public/product/image/2fd/2000038326/IPROS11345817645571470646.jpg?w=280&h=280){kind=small}
A mass spectrometry method that allows monitoring of gases generated by vacuum heating/warming at different temperatures, with high sensitivity for detecting hydrogen and water.
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
PL：PhotoLuminescence
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
Added PL analysis (photoluminescence method).
We have added PL analysis (photoluminescence method) to the list of handled products. PL analysis is a method that observes the light emitted when excited electrons transition to the ground state after being illuminated by light. For more detailed information, please refer to the catalog.
Ion chromatography is a method for detecting ionic components in liquid samples.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[GDMS] Glow Discharge Mass Spectrom...](https://image.mono.ipros.com/public/product/image/569/2000240719/IPROS13633680634984708159.jpeg?w=280&h=280){kind=small}
Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280){kind=small}
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...
- Contract Analysis
- Contract measurement
- Contract Inspection
![[ED] Electron Diffraction Method](https://image.mono.ipros.com/public/product/image/aa2/2000240821/IPROS81867168414493685965.jpeg?w=280&h=280){kind=small}
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
- Contract Analysis
- Contract measurement
- Contract Inspection
The TOC analyzer is a device that can evaluate the total carbon content, total organic carbon content, and inorganic carbon content (IC) in a sample.
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...
- Contract Analysis
- Contract measurement
- Contract Inspection
Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[C-SAM] Ultrasonic Microscopy Metho...](https://image.mono.ipros.com/public/product/image/dda/2000387315/IPROS30609954037734018246.jpeg?w=280&h=280){kind=small}
C-SAM is a non-destructive method for observing defects such as delamination within a sample.
- Contract Analysis
- Other contract services
- Circuit board design and manufacturing
Nano-simulation is a computational science method that handles atoms and molecules based on the laws of physics and chemistry, and it can be utilized to understand various phenomena.
- Contract Analysis
By measuring the fluorescence lifetime of a substance, we can grasp the luminescent transient phenomena more dynamically.
- Contract measurement
Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.
- Contract Analysis
- Contract measurement
Transient Thermal Resistance Measurement
- Contract Analysis
![[FIB-MS] Focused Ion Beam Mass Spec...](https://image.mono.ipros.com/public/product/image/ed1/2001512012/IPROS1605119332584602334.jpg?w=280&h=280){kind=small}
This is a method that allows simultaneous shape observation and elemental imaging of small areas using a FIB and a TOF mass spectrometer mounted on an SEM device.
- Contract measurement
![[EPMA] Electron Probe Micro Analyze...](https://image.mono.ipros.com/public/product/image/42a/2001512017/IPROS4249942844201920438.jpg?w=280&h=280){kind=small}
By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification o...
- Contract measurement
![[NMR] Nuclear Magnetic Resonance An...](https://image.mono.ipros.com/public/product/image/77d/2001512020/IPROS8993594429222675175.jpg?w=280&h=280){kind=small}
Nuclear Magnetic Resonance
- Contract measurement
- Contract Analysis