List of Other analysis and evaluation services products
- classification：Other analysis and evaluation services
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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Non-destructive defect evaluation of large-diameter wafers from 4 inches to 6 inches with high resolution is possible!
- Other analysis and evaluation services
Moisture accumulated inside the component vaporizes due to thermal stress! Stress occurs due to volume expansion.
- Other analysis and evaluation services
By using infrared heating, it is possible to heat only the sample, allowing for a lower background!
- Other analysis and evaluation services
Successfully captured the n-buffer layer thickness and nitrogen (N) concentration using D-SIMS!
- Other analysis and evaluation services
Successfully captured impurity diffusion from the upper side of the gate oxide film using D-SIMS!
- Other analysis and evaluation services
If the membrane structure and composition information is known in advance, multilayer membranes can also be evaluated through simulation!
- Other analysis and evaluation services
Established a method for high-precision component evaluation using sensitivity and quantification-focused SIMS (D-SIMS)!
- Other analysis and evaluation services
Calculate the oxide film thickness of the SiO2 surface oxide film on the Si substrate using photoelectron spectroscopy!
- Other analysis and evaluation services
Under the condition of total reflection, the penetration depth of X-rays is shorter than the escape depth of photoelectrons, so the detection depth of HAXPES is determined by the penetration depth of ...
- Other analysis and evaluation services
In the investigation of the discoloration of metal components, qualitative analysis of the surface condition and evaluation using XPS of the thickness and depth distribution of the surface oxide film ...
- Other analysis and evaluation services
It is possible to calculate the shape (such as spherical or elliptical) and size distribution of nanoparticles!
- Other analysis and evaluation services
We will also introduce examples of comparative evaluations of various oxidation states of titanium dioxide!
- Other analysis and evaluation services
You can obtain information about the chemical composition, bonding state, and valence of the outermost surface!
- Other analysis and evaluation services
Introducing backside SIMS analysis conducted from the substrate side!
- Other analysis and evaluation services
There are various types of mass spectrometers, such as magnetic field type, quadrupole type, and time-of-flight type, which are used according to the purpose of the analysis!
- Other analysis and evaluation services