List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
211～225 item / All 738 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.
- Semiconductor inspection/test equipment
Sheet substrate electrical testing system! (Continuity testing, insulation testing, four-terminal testing, micro-short detection) FPC, flexible substrates, PCB, PKG
- Other inspection equipment and devices
- Circuit Board Inspection Equipment
- Semiconductor inspection/test equipment
【TTL】Board Power-On Test Device 'TY-CHECKER DS401' Semi-Automatic Type, a power-on testing machine for printed circuit boards, capable of high-frequency testing in a semi-automatic manner (continuity testing, insulation testing, four-terminal testing, micro-short detection).
The "TY-CHECKER DS401" is a powered inspection system that adds X-direction movement (horizontal movement) to the conventional Y-direction step-and-repeat transport. Since the device is semi-automatic, the entire front of the machine is almost open, making it easy to handle the workpieces. It is designed to be useful in product development and manufacturing environments. Transitioning to mass production can also be done smoothly by adopting the AT type. *We also assist with the supply of jigs! It supports both a unique dedicated plate holding method that does not apply tension and a tension holding method, allowing selection according to the product. By swapping the measurement unit, high-frequency characteristic testing can be performed either on sheets or individual pieces, leveraging the advantages of jig fixation to achieve stable automatic/semi-automatic high-frequency testing. 【Features】 ■ Maximum substrate size: 305mm x 510mm ■ Step-and-repeat transport in the XY direction ■ Contributes to downsizing of jig head (reducing jig costs) ■ Continuity, insulation, 4-terminal testing, micro-short detection ■ High-frequency characteristic testing compatible with 'VNA, LCR, TDR' *For more details, please refer to the PDF document or feel free to contact us.
Fusing the "design capabilities" of machinery, electronics, and software! We respond to needs in a one-stop manner.
- Semiconductor inspection/test equipment
Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.
- Fine Ceramics
- Mounter
- Semiconductor inspection/test equipment
OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.
- Semiconductor inspection/test equipment
It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.
- Semiconductor inspection/test equipment
Anisotropic conductive sheet
- Semiconductor inspection/test equipment
- Other semiconductors
- others
W-CSP inspection probe card
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
Consolidating decades of technology developed with contact probes for semiconductor testing!
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.
- Semiconductor inspection/test equipment
- Contract Analysis
- Other semiconductors
We provide a one-stop service from semiconductor test development to the launch of semiconductor testing and semiconductor testing outsourcing.
- Semiconductor inspection/test equipment
We have a proven track record in static electricity measures and charge prevention, from atmospheric environments to vacuum environments.
- Other semiconductors
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Function tester combining Pickering switches and LabVIEW.
- Testing Equipment and Devices
- Semiconductor inspection/test equipment
- Contract Inspection