List of Semiconductor inspection/test equipment products

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

• air conditioning

Semiconductor device cover

• Semiconductor inspection/test equipment

Semiconductor device chassis

• Semiconductor inspection/test equipment

Responding to the cleanliness required for semiconductor manufacturing equipment. Made of stainless steel 316L, for high-purity lines, welded compact check valve CMW series.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

The stem angle can be selected from 1°, 3°, or 5°, allowing for flow adjustment that better meets customer needs. It can be fixed at the desired flow rate with a locking screw.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

Stainless steel 316, high temperature and high pressure compatible T-type and inline filter 'H-600 series'. This filter allows for element replacement.

• filter
• Piping Materials
• Semiconductor inspection/test equipment

Ideal for small-batch, multi-variety production! Equipment with excellent operability that does not require operator skills.

• Semiconductor inspection/test equipment

It is possible to accommodate various package styles! Achieving easier data management is possible.

• Semiconductor inspection/test equipment

We have standard products available from 2kVA to 15kVA!

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Semiconductor device case

• Semiconductor inspection/test equipment

You can choose between N2 pressurization and pump pressurization!

• Semiconductor inspection/test equipment

We offer a wide range of options to meet various demands from low temperatures to high temperatures.

• Semiconductor inspection/test equipment
• probe
• Other physicochemical equipment

Verify the presence or absence of malfunctions due to signal switching! One input can be distributed to multiple ports!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

We offer a wide range of options to meet various demands from low temperatures to high temperatures.

• Semiconductor inspection/test equipment
• probe
• Other physicochemical equipment

- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.

• Semiconductor inspection/test equipment
• Other physicochemical equipment
• probe