List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
511～525 item / All 726 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
This is the "IB303XP," a high-voltage power supply for FIB ion guns that also helps shorten the development period!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
This is the drive power supply 'XE303XP' exclusively for soft X-ray tubes using a thermal FE emitter!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
It is a high-precision high-voltage power supply device for TFE electron guns!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
It is the high-voltage power supply unit "FE103XP" for CD-SEM and review SEM!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
Achieving high-precision inspection! Fully compatible with appearance inspection of chip components from fine chips to special sizes.
- Semiconductor inspection/test equipment
- Inspection robot
Achieving a flatness accuracy of 0.001mm or less (for φ12 inches).
- Semiconductor inspection/test equipment
- Wafer processing/polishing equipment
- Processing Jig
The second installment of the TDC introduction video has been completed!
The introduction video part 2 of TDC has been completed. This time, it features an introduction to management by our president, Akabane. It's a short movie of about one minute, so please take a look. You can watch the video from the "Related Information" section below. Title: TDC Management Now, we are exhibiting at "Nanotech 2018," which is being held at Tokyo Big Sight starting today. We are showcasing not only mirror samples of various materials but also finely crafted precision parts and inner diameter mirror products created through lap polishing. Additionally, we have mirror plates of size 400 and large rolls of about one meter, so please take this opportunity to check them out. Since today is Valentine's Day, we will be providing coffee and chocolate for three days. Feel free to stop by. <Exhibitors> 2/14 (Wed): President, Fujino, Arisa 2/15 (Thu): President, Fujino, Maeda 2/16 (Fri): President, Fujino, Arisa, Maeda ★ Technical meetings are also possible ★ All of our staff are looking forward to your visit.
It is a positioning support unit that allows for precise positioning of workpieces and other items at each stage of the manufacturing process quickly and simply.
- Conveyor
- Semiconductor inspection/test equipment
- Wafer processing/polishing equipment
SiC semiconductor evaluation device using photoluminescence (PL) imaging method
- Semiconductor inspection/test equipment
This device measures the thickness of wafers fixed to ceramic plates without contact, using optical probes/sensors.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This machine is a device for measuring the thickness of φ8” silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device for drying wafers that have been stripped and cleaned.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a semi-automatic device for visual inspection of 8-inch silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a fixture for visual inspection of the front and back surfaces of the quartz mask.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment