This is a device that detects the wafer edge using green LED light and measures the diameter by comparing it with a calibration wafer (reference wafer).
The diameter measurement values (average diameter values, etc.) will be saved in Excel format on the attached computer.
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basic information
- The wafer size that can be measured has increased from the DMC-02 model.*It can accommodate 3", 4", 5", and 6". It also supports multi-point measurements as well as opaque and translucent materials. - This eliminates the measurement variations that traditionally occurred when using calipers and other measuring instruments. - Average diameter, maximum diameter, minimum diameter, relative standard deviation, etc., can also be calculated and saved in Excel format.
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Applications/Examples of results
We have sales achievements in the semiconductor industry and research institutions.
Company information
☆Dedicated Semiconductor Website Now Open!! https://www.wafer-measurement-inspection.com/ At Justem Co., Ltd., we design, manufacture, and sell automation and labor-saving machines for the wafer manufacturing process, including non-contact thickness measurement machines for wafers, wafer thickness sorting machines, automated lapping and polishing machines, and wafer transfer machines, targeting materials such as Si, SiC, and sapphire, through our unique technology development. We have provided these to many customers. We also design, manufacture, and sell specialized machines for electronic component processing and automotive parts processing. We also accept demo measurements for thickness measurement of various materials.
![[Measurement Example] <Insulation substrate material for electronic circuits> Thermal conductivity of polyimide sheet](https://image.mono.ipros.com/public/product/image/42e/2001224182/IPROS57312314899529954238.jpeg?w=280&h=280)
