List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

526~540 item / All 738 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

It is the high-voltage power supply unit "FE103XP" for CD-SEM and review SEM!

  • Semiconductor inspection/test equipment
  • Electron beam lithography equipment
  • Other processing machines

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Achieving high-precision inspection! Fully compatible with appearance inspection of chip components from fine chips to special sizes.

  • Semiconductor inspection/test equipment
  • Inspection robot

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Achieving a flatness accuracy of 0.001mm or less (for φ12 inches).

  • Semiconductor inspection/test equipment
  • Wafer processing/polishing equipment
  • Processing Jig

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The second installment of the TDC introduction video has been completed!

The introduction video part 2 of TDC has been completed. This time, it features an introduction to management by our president, Akabane. It's a short movie of about one minute, so please take a look. You can watch the video from the "Related Information" section below. Title: TDC Management Now, we are exhibiting at "Nanotech 2018," which is being held at Tokyo Big Sight starting today. We are showcasing not only mirror samples of various materials but also finely crafted precision parts and inner diameter mirror products created through lap polishing. Additionally, we have mirror plates of size 400 and large rolls of about one meter, so please take this opportunity to check them out. Since today is Valentine's Day, we will be providing coffee and chocolate for three days. Feel free to stop by. <Exhibitors> 2/14 (Wed): President, Fujino, Arisa 2/15 (Thu): President, Fujino, Maeda 2/16 (Fri): President, Fujino, Arisa, Maeda ★ Technical meetings are also possible ★ All of our staff are looking forward to your visit.

It is a positioning support unit that allows for precise positioning of workpieces and other items at each stage of the manufacturing process quickly and simply.

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  • Conveyor
  • Semiconductor inspection/test equipment
  • Wafer processing/polishing equipment

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SiC semiconductor evaluation device using photoluminescence (PL) imaging method

  • Semiconductor inspection/test equipment

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This device measures the thickness of wafers fixed to ceramic plates without contact, using optical probes/sensors.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This machine is a device for measuring the thickness of φ8” silicon wafers.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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It is a device for drying wafers that have been stripped and cleaned.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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It is a semi-automatic device for visual inspection of 8-inch silicon wafers.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This is a fixture for visual inspection of the front and back surfaces of the quartz mask.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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It is a device that performs macro inspection of wafers and micro inspection using a microscope.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This is a device for surface inspection of wafers after polishing.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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This is a device for visually inspecting the edges of φ300 mm silicon wafers (chip and chipping inspection).

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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