List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

151~180 item / All 704 items

Displayed results

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

  • Satech - AdaptaGuard_Ipros_2023_JP_1.jpg
  • Satech - BlueGuard_Ipros_2023_JP_1.jpg
  • Satech - EasyGuard_Ipros_2023_JP_1.jpg
  • Satech - FastGuard_Ipros_2023_JP_2.jpg
  • Satech - ImpactGuard_Ipros_2023_JP_1.jpg
  • Satech - EasyGuard_Ipros_2023_JP_Media-gallery_1.jpg
  • Satech - ImpactGuard_Ipros_2023_JP_Media-gallery_2.jpg
  • Satech - AdaptaGuard_Ipros_2023_JP_Media-gallery_1.jpg
  • Satech - BlueGuard_Ipros_2023_JP_Media-gallery_2.jpg
  • Other safety and hygiene products

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Overall alignment accuracy ±2.5μm! Inspection equipment for large individual pieces/quarter panels.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Practical application of ultrasonic ultrasonic technology mounted on a spin sheet device!

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

By conducting a complete visual inspection of the chips before implementation, we can reduce losses in subsequent processes and improve yield! Ideal for acceptance inspection and screening in module a...

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
ServAir_logo.jpeg

ServAir Cloud V4.3 has released the "BI Option."

We are pleased to announce the release of the after-sales service core business package, ServAir Cloud V4.3. In V4.3, we will offer a new BI (Business Intelligence) option. You will be able to analyze various data from ServAir and create graphs using the BI tool QuickSight provided by AWS Japan (Amazon Web Services Japan LLC). ServAir's data will be available in a format that can be easily utilized on QuickSight, allowing you to perform data analysis, forecasting, create various graphs, and manage KPIs on your own. This enables you to manage, analyze, and share data tailored to your business goals. V4.3 is scheduled to go on sale on December 15, 2023, and to start shipping on January 26, 2024. Please feel free to contact us for an introduction to the product, including the new features of V4.3.

We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
セミナー.JPG

We will exhibit at the 2024 Japan Proteomics Society Annual Meeting and the 20th Joint Meeting of the Japanese Clinical Proteogenomics Society.

Our company will be exhibiting at the Joint Conference of the 2024 Annual Meeting of the Japanese Proteomics Society and the 20th Annual Meeting of the Japanese Clinical Proteogenomics Society, which will be held at Link Station Hall Aomori from June 26 to 28, 2024. At our booth, we will showcase a complete set of interfaces that enable high-sensitivity measurements using capillary electrophoresis-mass spectrometry (CE-MS). We invite anyone using CE-MS, as well as those who own an MS and are interested in utilizing capillary electrophoresis, to visit our booth.

CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Sheet substrate electrical testing system! (Continuity testing, insulation testing, four-terminal testing, micro-short detection) FPC, flexible substrates, PCB, PKG

  • DS202.png
  • Other inspection equipment and devices
  • Circuit Board Inspection Equipment
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
DS401.png

【TTL】Board Power-On Test Device 'TY-CHECKER DS401' Semi-Automatic Type, a power-on testing machine for printed circuit boards, capable of high-frequency testing in a semi-automatic manner (continuity testing, insulation testing, four-terminal testing, micro-short detection).

The "TY-CHECKER DS401" is a powered inspection system that adds X-direction movement (horizontal movement) to the conventional Y-direction step-and-repeat transport. Since the device is semi-automatic, the entire front of the machine is almost open, making it easy to handle the workpieces. It is designed to be useful in product development and manufacturing environments. Transitioning to mass production can also be done smoothly by adopting the AT type. *We also assist with the supply of jigs! It supports both a unique dedicated plate holding method that does not apply tension and a tension holding method, allowing selection according to the product. By swapping the measurement unit, high-frequency characteristic testing can be performed either on sheets or individual pieces, leveraging the advantages of jig fixation to achieve stable automatic/semi-automatic high-frequency testing. 【Features】 ■ Maximum substrate size: 305mm x 510mm ■ Step-and-repeat transport in the XY direction ■ Contributes to downsizing of jig head (reducing jig costs) ■ Continuity, insulation, 4-terminal testing, micro-short detection ■ High-frequency characteristic testing compatible with 'VNA, LCR, TDR' *For more details, please refer to the PDF document or feel free to contact us.

Fusing the "design capabilities" of machinery, electronics, and software! We respond to needs in a one-stop manner.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.

  • Fine Ceramics
  • Mounter
  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

IC socket

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • socket

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Anisotropic conductive sheet

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

W-CSP inspection probe card

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Consolidating decades of technology developed with contact probes for semiconductor testing!

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We provide a one-stop service from semiconductor test development to the launch of semiconductor testing and semiconductor testing outsourcing.

  • Semiconductor inspection/test equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

We have a proven track record in static electricity measures and charge prevention, from atmospheric environments to vacuum environments.

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Inline cleaning of particles on the stage - wafer-type stage cleaner

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Other cleaning tools

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Filter

classification
Delivery Time
Location