List of Distance measuring device products

  • classification:Distance measuring device

271~285 item / All 927 items

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It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...

  • Sensors

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We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!

  • Other semiconductors
  • Processing Contract
  • Wafer

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Achieving high stability, high resolution, and versatility for research purposes and system integration!

  • Distance measuring device

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New arrival! Response speed 5 times faster! Ideal capacitive displacement sensor for measuring the blur of rotating objects.

  • Distance measuring device

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No contact medium needed! Non-contact thickness measurement of the substrate from the coating.

  • Distance measuring device

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The measurement is based on ultrasonic waves transmitted from nearby objects and reflected back, providing high-precision distance measurement.

  • Other measurement, recording and measuring instruments
  • Distance measuring device
  • Other security and surveillance systems

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Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!

  • Distance measuring device

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Semicon Japan 2024

We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor

Ideal for automatic inspection of vial shape and thickness - High-speed, high-precision optical sensor.

  • Distance measuring device

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Embedded optical sensor for high-precision and high-speed measurement of thickness and shape.

  • Distance measuring device

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Semicon Japan 2024

We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor

Thoroughly pursue "rationalization" while maintaining the basic concept of the existing JIS inspection methods!

  • Distance measuring device

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Measured in a pasture of about 7 hectares! A demonstration was conducted with a flight time of approximately 13 to 14 minutes.

  • Other measurement, recording and measuring instruments
  • Distance measuring device

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Equipped with a new type of EDM mechanism and a reference point measurement program. A high-spec model packed with features. Certified by the Geospatial Information Authority of Japan as Class 2A and ...

  • Distance measuring device

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