List of Electron microscope products

  • classification:Electron microscope

16~30 item / All 128 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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Achieve everything from macro to distant views with a single device! Strongly supports a wide range of visual inspections with overwhelming clarity.

  • Microscope
  • Electron microscope

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We will perform operation confirmation of the machine tool from a distance. This microscope covers everything from distant views to macro observations with just one unit.

  • Microscope
  • Electron microscope

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Achieve everything from macro to distant views with a single device! A digital microscope that powerfully supports a wide range of visual inspections with overwhelming clarity. Ideal for remote observ...

  • Microscope
  • Electron microscope

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Achieving high-speed 3D/4D imaging measurements of nano-level dynamics!

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  • Electron microscope
  • Optical microscope
  • 3D measuring device

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It is possible to observe cross-sections while observing FIB processing in real time.

  • Contract Analysis
  • Other contract services
  • Electron microscope

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Power device failure location / Slice & View three-dimensional reconstruction

I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.

Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.

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  • Electron microscope

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Analysis of organic-inorganic composite materials using FT-IR and EDX.

We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

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  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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We have published cross-sectional observations in clear vision mode and normal/standard mode!

  • Electron microscope
  • Contract Analysis
  • Contract Inspection

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4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.

  • 3D measuring device
  • Electron microscope
  • Electron microscope

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Far higher resolution than optical microscopes! Suitable for surface observation and checking surface irregularities at the micro level.

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  • Electron microscope

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Work in a clean room is possible! Since the stem is manufactured in-house, we can offer flexible designs.

  • Ceramics
  • Electron microscope

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We can provide consistent production of alumina-based products! Glass coating is also available.

  • Other processing machines
  • Electron microscope

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Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.

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  • Electron microscope

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It is expected that information that has not been obtained until now can be acquired, and improvements can be made to the measurements that are causing difficulties.

  • Electron microscope

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It is a new generation SEM that is compact and capable of unmanned operation.

  • Electron microscope

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