List of Other microscopes products
- classification：Other microscopes
211～225 item / All 647 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Observe the interior directly on a 1280×720 pixel LCD screen! Ergonomic design.
- Other microscopes
HOPG suitable for observation substrates and test samples for AFM/SPM.
- Other microscopes
- Analytical Equipment and Devices
- probe
Overwhelming beauty on a large screen! The sample holder can be easily set into the device with a sliding mechanism.
- Other microscopes
Even more beautiful with the FE electron gun! Achieving high resolution close to floor models with a tabletop SEM.
- Other microscopes
Achieve high-resolution and high-contrast observation! Non-destructive 3D observation is possible.
- Other microscopes
9.2mm front side view dual camera tip 360-degree rotating fiberscope 1m / Model number M1080MWY-SNS360RT-1M
- Other microscopes
A digital magnifier equipped with an LCD display. It is compact and portable, making it easy to carry in a chest pocket.
- Other microscopes
Introduction to the measuring instruments we possess, such as non-destructive film thickness gauges and metal microscopes!
- Coating thickness gauge
- Other microscopes
Supports free combinations of microscope and stage. Achieves compactness through an integrated design.
- Other microscopes
Notice of participation in the 40th NEPCON Japan "Electronics Development and Manufacturing Show" from January 21 (Wednesday) to January 23 (Friday), 2026.
Miraku Optical Co., Ltd. will be exhibiting at the 40th Nepcon Japan "Electronics Development and Implementation Exhibition" held at Tokyo Big Sight. At this exhibition, cutting-edge electronic components, materials, and manufacturing, implementation, and inspection equipment that support the multifunctionality and high performance of electronic devices will be showcased. It has established itself as a venue for business discussions with electronics, semiconductor, sensor, electronic component, automotive, and electrical equipment manufacturers from both Japan and abroad. We sincerely look forward to your visit.
Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.
- Electron microscope
- Other microscopes
- Other inspection equipment and devices
The ideal scope for rapid and reliable observation of high-precision precision parts.
- Other microscopes
From macro to micro, multi-support capability. This one machine can handle thin and fine samples like semiconductor wafers, as well as molds.
- Other microscopes
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By confirming the shape changes of the metal structure and measuring internal strain using EBSD, it is possible to determine whether the bending processes of leaf springs, hair springs, and others are...
- Other metal materials
- Contract measurement
- Other microscopes
Observing metal microstructures with EBSD allows for smooth consideration of material selection and changes.
- Other metal materials
- Contract measurement
- Other microscopes