List of Contract measurement products
- classification：Contract measurement
121～135 item / All 2112 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
The mass array method allows for the simultaneous analysis of multiple genetic polymorphisms.
- Contract measurement
- Contract Analysis
![[MALDI-MS] Matrix-Assisted Laser De...](https://image.mono.ipros.com/public/product/image/fda/2001512022/IPROS11338482308148200208.jpg?w=280&h=280){kind=small}
It is a type of ionization method in mass spectrometry that is a soft ionization technique capable of suppressing the fragmentation of sample molecules.
- Contract measurement
![[PFM] Piezoelectric Response Micros...](https://image.mono.ipros.com/public/product/image/82b/2001512029/IPROS3629037656067593219.jpg?w=280&h=280){kind=small}
By using a probe coated with a conductive film and applying an alternating voltage to the sample surface, the sample surface is vibrated to obtain electromechanical information.
- Contract measurement
It is possible to evaluate the resistance when a certain load (temperature, humidity, pressure, voltage) is applied to materials and components.
- Contract measurement
![[AFM-MA・DMA] Mechanical Property Ev...](https://image.mono.ipros.com/public/product/image/0ec/2001512502/IPROS15276089049362651398.jpg?w=280&h=280){kind=small}
AFM-MA and AFM-DMA are analyses that can provide insights into hardness.
- Contract Analysis
- Contract measurement
A method for removing the surface of a sample by utilizing the sputtering phenomenon, where sample atoms are ejected from the sample surface.
- Contract Analysis
- Contract measurement
By bonding heavy elements to polymer chains, the contrast of structures and forms derived from the polymers can be enhanced, allowing for clearer observation under an electron microscope.
- Contract Analysis
- Contract measurement
TG-DTA-MS Thermogravimetric Differential Thermal Mass Spectrometry
- Contract Analysis
- Contract measurement
It is possible to observe three-dimensional structures under heating/cooling and stress/compression load conditions.
- Contract measurement
- Contract Analysis
Here is an example comparing the analysis results of catechin standard solutions using CAD and UV detectors.
- Contract Analysis
- Contract measurement
It is effective to differentiate between the two methods according to the purpose components and the size of the imaging field.
- Contract Analysis
- Contract measurement
Comparison of spectra obtained from Ga line (HAXPES) and Al line/Mg line (XPS) measurements.
- Contract Analysis
- Contract measurement
Phosphorescence measurement is possible with a fluorometer.
- Contract Analysis
- Contract measurement
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx