List of Contract Services products

  • classification:Contract Services

721~765 item / All 4802 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

Estimation of film thickness using the average free path of photoelectrons.

  • Contract Analysis

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I have summarized the process from request to delivery.

  • 打ち合わせ.jpg
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  • Contract Analysis

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We have compiled frequently asked questions about the sample in an FAQ format.

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  • Contract Analysis

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I have summarized how to send samples for analysis to MST.

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  • セミナー.jpg
  • Contract Analysis

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We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Proposal for the use of standard samples with aligned thermal history.

  • Contract Analysis

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Structural estimation of degradation components by LC/MS/MS analysis.

  • Contract Analysis
  • Contract measurement

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Suppression of component alteration through measurement surface finishing under atmosphere control.

  • Contract Analysis

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Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'

  • Contract Analysis

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Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

  • Contract Analysis

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Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.

  • Contract Analysis

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Quantitative evaluation of metal components is possible near the bevel area.

  • Contract Analysis

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XRD measurement can be performed while increasing the temperature.

  • Contract Analysis

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It is possible to evaluate the change in crystallinity while increasing the temperature.

  • Contract Analysis

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Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

  • Contract Analysis

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Quantitative analysis of the main components of sheet-like active substances is possible.

  • Contract Analysis
  • Contract measurement

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It is possible to evaluate the structure of the Si anode after charging through sample cooling.

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  • Contract Analysis
  • Contract measurement

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Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.

  • Contract Analysis
  • Contract measurement

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Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

  • Contract Analysis

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Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.

  • Contract Analysis

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Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

  • Contract Analysis

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Analysis is possible after selectively removing the compound layer through preprocessing.

  • Contract Analysis

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Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.

  • Contract Analysis

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Capable of nano-order morphological observation and elemental analysis.

  • Contract Analysis

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Quantification of Si-H and N-H in SiN films using infrared absorption method.

  • Contract Analysis

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Tracking evaluation of phase transitions and crystallinity changes during the heating process.

  • Contract Analysis

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Information about valence bands and intra-gap levels can be obtained by element.

  • Contract Analysis

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"Technical Information: Analysis of Dental Implants Using TOF-SIMS" and two other items have been released.

We have published the following three analysis case studies on the MST website: - Analysis of dental implants using TOF-SIMS - Evaluation of GaN using soft X-ray emission spectroscopy For more details, please visit the MST website. http://www.mst.or.jp/

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MST.png

Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.

We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/

Depth direction analysis will be conducted to a depth of several micrometers.

  • Contract Analysis
  • Contract manufacturing

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We will evaluate the internal structure of the device in a comprehensive manner.

  • Contract Analysis
  • Other electronic parts

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Evaluation of GFRP is possible according to the purpose.

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  • Contract Analysis
  • Contract measurement

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It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).

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  • Contract Analysis

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The molecular weight distribution of hyaluronic acid can be evaluated by electrophoresis.

  • Contract measurement

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It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

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  • Contract measurement
  • Transistor
  • Memory

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Lipid mapping of mouse brain using MALDI-MS.

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  • Contract measurement
  • Animal cells
  • Imaging and image analysis equipment

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It is effective for checking the impact of packaging materials on samples and the residues before and after changes to equipment.

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  • Contract measurement
  • Paper and pulp

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Simultaneous measurement of inorganic and organic components in minute specific areas.

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  • Contract measurement
  • Wafer
  • Memory

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