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Measuring Instrument(co) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Last Updated： Aggregation Period:Mar 11, 2026～Apr 07, 2026
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Measuring Instrument Product List

271～300 item / All 486 items

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Commissioned Part Program Creation Service for Mitutoyo 3D Measuring Machines

Commissioned Part Program Creation Service for Mitutoyo 3D Measuring Machines

If you are having trouble finding a contractor for creating measurement programs, please consult us. We can transition inspection results from paper to data management! Contributing to the improvement of the operating rate of three-dimensional measuring machines.

We offer part program creation services using Mitutoyo's three-dimensional measuring machine (MCOSMOS). By creating programs, anyone can use the three-dimensional measuring machine, which can increase operational efficiency. There are benefits such as being able to perform other tasks while outsourcing the program creation. In addition to creating programs as requested by customers, we can also provide suggestions on how to make them more user-friendly. 【Solving these issues】 ■ Technical challenges such as a shortage of personnel to create measurement programs ■ Management challenges such as wanting to compile inspection results as data ■ Lack of time to create part programs, etc. *For more details, please download the PDF or feel free to contact us.

  • 3D measuring device
  • Measuring Instrument

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EddyCus(R) TF portable

EddyCus(R) TF portable

Data management on PC via Bluetooth! A user-friendly and efficient testing solution.

The "EddyCus(R) TF portable" is a portable contact-type sheet resistance meter that accurately measures the sheet resistance of conductive films at a single point. It features user-friendly software that allows for real-time measurements. Measurement results from multiple devices are managed and visualized using a data sensor. Additionally, wireless data transfer via Bluetooth is possible. 【Features】 ■ Portable ■ Non-destructive contact measurement ■ Real-time & user-friendly ■ Data recording function ■ Accurate & reliable *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Practical verification possible! Contract measurement (X-ray CT, three-dimensional measuring machine, optical comb laser)

Practical verification possible! Contract measurement (X-ray CT, three-dimensional measuring machine, optical comb laser)

[Shinwa Co., Ltd. Measurement Technology Department] Capable of actual machine verification [2D/3D inspection and internal observation] We will introduce a lineup of measurement devices for contact and non-contact measurements.

At Shinwa's Measurement Technology Department, we own multiple measuring instruments and provide services ranging from contract measurements, test trials, equipment sales, to setup. We will propose inspection methods tailored to our customers' needs. If you have any measurement themes, please feel free to consult with us. <Keywords> 2D/3D Contact/Non-contact Inline/At-line (Near-line)/Offline Image/Point cloud data/STL data Internal shape/External shape Measurement accuracy Measurement speed ↓For inquiries, contact us here↓ Shinwa Co., Ltd. Measurement Technology Department ●TEL: 052-796-2025 ●Mail: keisoku＠shinwa-jpn.co.jp

  • 3D measuring device
  • Measuring Instrument

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All-in-one type high-precision linear gauge ATG1 series

All-in-one type high-precision linear gauge ATG1 series

An all-in-one type high-precision linear gauge with the signal processing unit built into the main body of Φ20!

This is an all-in-one type high-precision linear gauge with a Φ20 body that integrates the signal processing unit. It outputs A/B phase pulse signals simply by supplying power. Inside the sensor, a magnetic tape with high precision alternating N and S poles and a magnetoresistive element are implemented, allowing for non-contact detection of the magnetic pattern, and high-precision pulse signals are output from the obtained SIN/COS signals using a dedicated LSI. *For more details, please contact us or download the catalog.

  • Sensors
  • Servo
  • Measuring Instrument

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PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

Measurement time within 4 seconds! A semi-automatic measuring device that is easy to operate and allows for simple measurements.

The "MTY-7000" is a measuring device that measures the mouth dimensions compatible with both PET bottles and PET preforms. It measures the inner diameter (2 points), outer diameter, thread diameter, bead height, and neck support height of PCO1716, 1810, and 1881 type PETROL bottles using a linear gauge and a special measuring head. The set condition of the work (PET bottle & preform) can be confirmed with a small CCD camera. 【Features】 ■ Measurement time within 4 seconds ■ Measurement accuracy within 5μm ■ Repeatability within 4μm ■ Dedicated for mouth (inner diameter and outer diameter) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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LCD/Illumination Brightness, Illuminance, and Flicker Measuring Instrument ASTERIA

LCD/Illumination Brightness, Illuminance, and Flicker Measuring Instrument ASTERIA

A compact casing that enables simple and highly practical high-speed measurements.

Asteria quickly measures brightness, illuminance, and flicker. Admesy has newly developed Asteria as a device capable of faster measurements that are simpler and more practical, based on their previously offered ultra-compact color luminance meter, MSE. The measurement speed, stability, and design of Asteria are ideal for inline measurements.

  • Other inspection equipment and devices
  • Measuring Instrument

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VERSATILE TEC / Automatic Coating Thickness Measurement Machine

VERSATILE TEC / Automatic Coating Thickness Measurement Machine

It is possible to measure the thickness of the varnish and the distribution of the coating thickness while ignoring the ink from the state of ink + varnish.

Versatile Technology's automatic film thickness measurement device adopts the probe from SpecMetrix in the United States, allowing for the measurement of varnish thickness and film thickness distribution while ignoring the ink, starting from a state of ink + varnish (foam ink is also possible). 360° scanning is conducted using a non-contact probe. It also accommodates film thickness on rim-coated surfaces. The cans that can be measured include standard cans with diameters of 202, 204, 206, and 211, and no mold change is necessary.

  • Other inspection equipment and devices
  • Measuring Instrument

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No.606 Oxygen Index Measurement Device "Candle Combustion Tester"

No.606 Oxygen Index Measurement Device "Candle Combustion Tester"

It measures the limiting oxygen concentration (oxygen index) at which the material can barely continue to burn, and it can also measure the temperature inside the column.

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  • Testing Equipment and Devices
  • Measuring Instrument

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Moisture Measurement Device CA-200 Model (Old Type)

Moisture Measurement Device CA-200 Model (Old Type)

The color LCD display has further evolved with two channels.

This is the latest model of a Karl Fischer moisture meter. It allows for accurate measurement of trace moisture in samples. ● It is a highly expandable device that enables simultaneous measurement on two channels. The measurement status of both channels can be displayed at the same time. ● Stepwise temperature rise measurement is possible (when connected to a vaporization device), making it easy to find the optimal heating temperature for the sample. ● Bromine value and bromine index measurements are standard features. *For more details, please download the catalog or contact us.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Contact Resistance Tester "DUORES"

Contact Resistance Tester "DUORES"

Handheld sheet resistance meter!

"DUORES" is a handy type sheet resistance measuring device that is easy to carry and easy to use for measurements. It features two types of probes (non-destructive and contact) that can be exchanged according to the measurement target. Simply place or touch the probe, and it will automatically measure. It can be customized in various ways according to customer requests. Additionally, it is available for purchase as just the main unit with the non-destructive probe or just the main unit with the contact probe. [Features] ■ Contact type ■ Exchangeable 2 probes ■ Handy type *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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VERSATILE TEC / Automatic Shell Measuring Machine

VERSATILE TEC / Automatic Shell Measuring Machine

The can lid anchor and curl end measurement can be measured without changing the mold!

The Versatile Technology automatic shell measuring machine can measure anchors and curl ends with diameters ranging from 200 to 206 (209 diameter is optional) without changing the mold. The measurement items include curl height, countersink, unit height, panel depth, curl opening, and curl diameter (inner and outer diameter). An automatic detection function for the rolling direction is standard equipment.

  • Other inspection equipment and devices
  • Measuring Instrument

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RLC Series Reflective Off-Center Measurement Device

RLC Series Reflective Off-Center Measurement Device

Ensure sufficient resolution and enable measurement. Eccentricity can be automatically measured at up to 20 measurement points.

The "RLC Series" is a reflection eccentricity measurement device that uses a Laser Auto Collimator. It is a reflection eccentricity measurement designed to improve the eccentricity accuracy during lens unit assembly, ensuring sufficient resolution for the required accuracy and enabling measurements. We provide support to adjust it suitably to the customer's assembly conditions. Additionally, we offer a measurement device for the eccentricity of individual aspheric lenses, which consists of a high-precision rotating spindle and a light source and detection optical system for observing reflected light. 【Features】 ■ Measurement lens diameter: φ1 to 40mm ■ Automatic measurement of eccentricity at up to 20 measurement points ■ Monitoring of Z stage movement on the measurement software ■ Automatic measurement of actual values of eccentricity (X-axis, Y-axis) ■ Automatic adjustment of shutter speed to ensure the spot peak value reaches the target brightness value *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Space Charge Measurement Device "Q-PEA"

Space Charge Measurement Device "Q-PEA"

Sample measurements are also possible! We can accommodate customizations as much as possible, including measurements using a constant temperature bath and changes to sample holds.

The "Q-PEA" is a space charge measurement device that uses the Pulsed Electro Acoustic method (PEA method) to non-destructively and easily measure the distribution of space charges accumulated inside dielectric and insulating materials in real-time. The PEA method involves applying a pulsed voltage between upper and lower electrodes to vibrate the internal space charges, generating pressure waves that are detected by sensors. By observing and analyzing these sensor signals, the distribution, location, and amount of space charges can be understood non-destructively. 【Standard Configuration (Partial)】 ■ Upper Electrode / Lower Electrode ■ Electrical Box (Pulse Generator / 15V Amplifier Power Supply / Analog Unit) ■ Bias Power Supply (HEOPS-10B2-42 High-Speed Type ~1kHz ±10kV ±2mA) ■ Oscilloscope (HDO4034A 350MHz 10GS/s 4ch) ■ Rack *For more details, please refer to the related links or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Laser Flash Method Thermal Property Measurement Device 'DLF'

Laser Flash Method Thermal Property Measurement Device 'DLF'

Measurable over a wide temperature range! A thermal property measurement device with excellent accuracy and precision.

The "DLF" is a laser flash method thermal property measurement device that can measure thermal diffusivity over a wide temperature range, allowing for the measurement of specific heat capacity and thermal conductivity of materials with a broad range of thermal characteristics. All systems include a multi-sample testing function that significantly improves productivity and enhances specific heat capacity measurements. With a modular structure, they offer high flexibility, allowing for the addition of other environmental modules or light source modules to adapt to changing needs. We offer a tabletop model "DLF 1200" capable of measuring samples up to 1200°C, and a standalone model "DLF 1600" capable of measuring samples up to 1600°C. 【Features】 ■ Measurement over a wide temperature range ■ High accuracy and precision ■ Easy operation ■ Generates collimated monochromatic energy pulses with pulse widths of 300μs to 400μs

  • 超高温セラミック.PNG
  • Analytical Equipment and Devices
  • Measuring Instrument

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Measuring Instrument

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[Demo unit available for loan] Digital line width measurement device

[Demo unit available for loan] Digital line width measurement device

Demo units available for loan! A new tool for measuring conductor width and insulation spacing of printed circuit boards!

The "AccuLine II" is a digital line width measurement device that can measure the conductor width (top and bottom) and insulation spacing of printed circuit boards. It can automatically measure conductor widths (maximum 900μm, minimum 30μm) in a standalone mode. Manual measurement of TH diameter (maximum 700μm) is also possible. Additionally, the operability, alignment with measurement targets, and memory functions have been significantly improved. There are three types available: "Advanced Type," "Basic Type," and "Manual Type," allowing customers to choose according to their needs. 【Features】 ■ Standalone ■ Capable of automatic and manual measurement ■ Simultaneous measurement of bottom and top widths of conductors ■ Equipped with a 3.5-inch color LCD ■ Pass/fail judgment display possible based on settings *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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RI moisture density meter ANDES SRDM-2SV rental

RI moisture density meter ANDES SRDM-2SV rental

A source rod with a radioactive isotope chip is inserted into the soil, and the moisture content and density of the soil are determined from the attenuation rate of the radiation.

***Features*** - Soil field density moisture meter with built-in microcomputer (RI instrument). - Can determine compaction status on-site. - Capable of measuring any soil type. - Measures quickly in just 1 minute. - Safe due to low-level radiation source, and easy to use. - Equipped with computational functions for data analysis. - Comes with a printer for saving measurement data.

  • others
  • Measuring Instrument

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Positron annihilation lifetime measurement / Doppler broadening measurement device

Positron annihilation lifetime measurement / Doppler broadening measurement device

High-efficiency digital measurement. Lifespan spectrum and waveform file storage are possible!

Integration of measurement and power supply equipment necessary for positron annihilation method measurements that can analyze molecular-level nanoscale spatial structures. Settings and data reading for each module are performed via a network from a dedicated application installed on a computer. PALS captures and calculates high-speed pulse signals from two BaF2 scintillation detectors using a 3 Gsps module. CDB takes coincidences from two germanium semiconductor detectors and generates a two-dimensional histogram from each of their pulse height values. Furthermore, the combination of these devices also enables the measurement of the correlation between lifetime and momentum using AMOC.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Phase difference, biological microscope [UT503-PH]

Phase difference, biological microscope [UT503-PH]

★High-performance phase contrast microscope. ★Plan achromatic objective lens ★Includes bright field, dark field, and polarized light observation, etc.

It is a phase contrast microscope. - High quality that withstands use for research and high-level amateurs. - Excellent optical and mechanical performance. - Options for bright field observation, dark field observation, and polarized observation are also available. - High cost performance. * The camera shown in the product photo (blue) is sold separately.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Other physicochemical equipment
  • Optical microscope
  • Measuring Instrument

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