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Measuring Instrument(co) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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Measuring Instrument Product List

76～90 item / All 241 items

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Film tester thickness measuring device - handheld type *Demo available!

Film tester thickness measuring device - handheld type *Demo available!

Compact body, easy-to-hold handy series.

Handy Series The original air release ensures a constant descent speed of the measuring device. It reduces damage to the film and minimizes variability caused by the operator. 【Features】 ■ Easy to measure anywhere ■ Low measuring pressure minimizes damage to the film, allowing for accurate measurements. ■ A wide range of options available *Testing is currently available at the Shin-Yokohama demo room! Online demos are also being conducted. Please feel free to contact us. Download the catalog here▼ https://www.matsuo-sangyo.co.jp/catalogs/ For product details, click here▼ https://www.matsuo-sangyo.co.jp/products/continuous-film-handy/

  • Coating thickness gauge

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High-frequency compatible AC magnetic measurement device "Bcon-HF"

High-frequency compatible AC magnetic measurement device "Bcon-HF"

Accurate evaluation requires sinusoidal control of the magnetic flux density waveform! We will meet your requests for various testing equipment frameworks.

"Bcon-HF" is a high-frequency compatible alternating magnetic measurement device that achieves magnetic flux density waveform control up to 20kHz. By using digital feedback technology for magnetic flux density waveform control, it regulates the magnetic flux density waveform to a sine wave. Additionally, we also manufacture a stress-loaded single-plate magnetic tester frame that allows for magnetic measurements under applied stress. 【Features】 ■ Achieves magnetic flux density waveform control up to 20kHz ■ Utilizes digital feedback technology for magnetic flux density waveform control ■ Controls the magnetic flux density waveform to a sine wave ■ Distortion rate and amplitude ratio of the sine wave control waveform can be set arbitrarily ■ Clear user interface *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Strain gauge

Strain gauge

Strain gauge

■ 4 1/2 digital display ■ Initial balance (including resistance and capacitance) is electronic auto-balance method ■ Output is dual output ■ Frequency response: DC to 2 kHz Manufacturer link http://www.minebea-mcd.com/product/s-amp/dsa631.html

  • Weight related measuring instruments
  • Testing Equipment and Devices
  • Other measurement, recording and measuring instruments

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Oil vapor measuring instrument "METPOINT OCV compact"

Oil vapor measuring instrument "METPOINT OCV compact"

TÜV certified! Online system for detecting oil vapor components.

The "METPOINT OCV compact" is an oil vapor measuring device designed to measure vaporous and gaseous hydrocarbons in compressed air system applications. This online monitoring system continuously monitors residual oil content at a detection level of 0.001 mg/m³ (minimum unit), providing reliability for the quality of compressed air and production processes. Additionally, the measurement data can be utilized for documenting compressed air quality and identifying sources of oil contamination. 【Features】 ■ First certification obtained from TÜV ■ Online monitoring of oil vapor concentration ■ Ability to visualize all measurement values ■ Simple and safe operation *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Non-contact sheet resistance measurement device 'DELCOM'

Non-contact sheet resistance measurement device 'DELCOM'

Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!

"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.

  • Insulation Tester

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Comprehensive Physical Property Measurement Device RHEO METER COMPAC-100

Comprehensive Physical Property Measurement Device RHEO METER COMPAC-100

A trusted machine born from years of experience and achievements.

It is a compact-type comprehensive physical property measuring instrument.

  • Food Testing/Analysis/Measuring Equipment
  • Analytical Equipment and Devices

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Light Image Particle Measurement Device "HAVER CPA System"

Light Image Particle Measurement Device "HAVER CPA System"

Accurately measure the quality of materials! High-precision optical image particle analysis is possible!

The "HAVER CPA System" is energy-efficient and low-maintenance. It also reduces operational costs. It can be easily connected to a PLC control system and can be integrated into online processes without modifications later on. The measurement results are equivalent to or better than traditional sieve analysis, offering high reproducibility of results, significant time savings, and information on particle shape and count, among various other advantages. [Features] - Accurately measures material quality - High-precision measurements in all situations - Comprehensive peripheral devices - Special solutions for special tasks - Extensive lineup *For more details, please refer to the PDF materials or feel free to contact us.

  • Food Testing/Analysis/Measuring Equipment

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Wafer Flatness Measurement Device "Wafercom 300"

Wafer Flatness Measurement Device "Wafercom 300"

Using a silicon transmission displacement sensor, the thickness of the silicon wafer is detected non-contactly.

The "Wafercom 300" is a multifunctional measurement device compatible with bare wafers. It uses a silicon transmissive displacement sensor to detect the thickness of silicon wafers non-contactly. To minimize vibrations during measurement, high-precision air bearings made of Indian black granite are employed for the Y-axis (front-back axis) and θ-axis (rotation axis), allowing for accurate detection of wafer thickness data. Additionally, the data captured by the PC can be analyzed for global flatness, site flatness, warp, bow, and edge roll-off shape evaluation. 【Features】 ■ Compatible with bare wafers ■ Multifunctional ■ High-precision air bearings used for the Y-axis (front-back axis) and θ-axis (rotation axis) ■ Capable of accurately detecting wafer thickness data *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Zeta potential and particle size distribution measurement device 'ZEECOM (ZC-3000)'

Zeta potential and particle size distribution measurement device 'ZEECOM (ZC-3000)'

Measurement of zeta potential for individual fine particles using visible particle measurement! Measurement of particle size distribution through Brownian motion is possible!

The "ZEECOM (ZC-3000)" is a zeta potential and particle size distribution measurement device that automatically tracks the movement of microparticles in real-time through image processing. It measures the surface charge state that changes with the solvent. The isoelectric point is determined from the responsiveness of the zeta potential to pH. Additionally, it evaluates colloidal particles from multiple angles through measurements of particle size and zeta potential. 【Features】 ■ Advanced image processing added to microscopic electrophoresis ■ Particle size distribution measurement through automatic tracking of Brownian motion (optional) ■ Histogram analysis using individual data of microparticles ■ Real-time measurement / Archive measurement capability ■ Particle size distribution measurement via Brownian motion *For more details, please refer to the PDF document or feel free to contact us.

  • Electrical Instruments/Electrometers
  • Other inspection equipment and devices

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