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Test Systems Product List and Ranking from 35 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  3. ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン Tokyo//Automobiles and Transportation Equipment
  4. 4 Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  5. 4 アルファクス Kanagawa//Industrial Electrical Equipment
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Test Systems Product ranking

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. Tabletop Gross Leak Test System | MSA-0101 series フクダ
  2. ITU-T P.1140 eCall Voice Quality Test Narrowband ヘッドアコースティクスジャパン
  3. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  4. Head Impact Test System "E-Liner FMH NG" ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン
  5. 4 Helium Leak Test System | HES-2000 series フクダ

Test Systems Product List

61～75 item / All 90 items

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Automated Test System "PXI High-Density Multiplexer Module"

Automated Test System "PXI High-Density Multiplexer Module"

A multiplexer ideal for switching voltages up to 300V.

The "PXI High-Density Multiplexer Module" offers products with various combinations of channel counts and pole counts. It includes relays for isolation that can be used to bundle multiple channels together to achieve larger configurations. It is compatible with Pickering's eBIRST switching system test tool, allowing for rapid identification of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Up to 198 channels, 1 to 20 banks, and 1 to 32 poles ■ Solutions for reed relays, mechanical relays, and semiconductor relays ■ Option for screened relays ■ Large-scale BRIC multiplexer ideal for multipole applications ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.

  • switch

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Automated Test System "PXI High Power Multiplexer Module"

Automated Test System "PXI High Power Multiplexer Module"

Supports a maximum of 10A/40A switching current! High-power multiplexer module.

The "PXI High-Power Multiplexer Module" includes products that use mechanical relays and semiconductor relays capable of handling switching currents up to 40A. Each module has one input/output terminal and multiple selectable input/output terminals for one or more channels of the multiplexer. It is compatible with the eBIRST switching system test tool, allowing for the rapid detection of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Configurations from 3:1 to 48:1, with 1 to 8 banks, available in single-pole or double-pole versions ■ The switching current for the mechanical relay version is up to 10A ■ The switching current for the semiconductor relay version is up to 40A ■ Power & Sense MUX for power distribution and regulation circuits ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.

  • switch

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Automated Test System "PXI High Voltage Multiplexer Module"

Automated Test System "PXI High Voltage Multiplexer Module"

Usable for 1000V voltage applications! High voltage multiplexer module.

The "PXI High Voltage Multiplexer Module" is a high voltage module that can be used for switching applications handling voltages up to 1000V. The 40-320 module operates at a maximum voltage of 13mA and is ideal for hot/cold switching applications up to 0.5A. The 40-331 module has a current rating of 5A at 1000V. The high voltage relay module is designed to withstand high common mode voltages. 【Features】 ■ Hot switching up to 750VDC or 750VAC peak ■ Cold switching up to 1000VDC or 1000VAC peak ■ Mechanical relay version available with a maximum opening and closing current of up to 5A for hot/cold switching ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments ■ Compatible with eBIRST switching system test tool For more details, please contact us.

  • switch

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Automated Test System "PXI Selectable Resistor Module"

Automated Test System "PXI Selectable Resistor Module"

Up to 48 channels! A module with a built-in switchable resistor.

The "PXI Selectable Resistor Module" is manufactured by Pickering and is a cost-effective product tailored for applications with limited required resistance values. It is ideal for adjusting resistance values and emulating sensors that operate at specified values. It incorporates selectable resistors that can be used for necessary offsets and voltage division purposes. 【Features】 ■ Built-in selectable resistors for offset and voltage division purposes ■ User-specified resistors (standard products are not implemented) ■ Resistors specified and implemented at factory shipment ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.

  • Other electronic parts

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Automated Test System "PXI Programmable Load Resistor Module"

Automated Test System "PXI Programmable Load Resistor Module"

A module for applications requiring a minimum decomposition resistance of 1Ω and a maximum rated power of 15W.

The "PXI Programmable Load Resistor Module" is manufactured by Pickering and is a solution designed for applications requiring a rating of up to 15W in a single PXI slot. By combining two channels, it can be used as a high-power potentiometer. Cables for connecting the module are also provided. Pickering products come with a 3-year warranty. 【Features】 ■ Selectable from a specified range of resistance values via software ■ Resolution of at least 1Ω, with a resistance range of 10Ω to 2.56kΩ ■ Bypassable offset resistor for applications requiring low resistance values ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.

  • Other electronic parts

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In-Circuit Test System "i3070"

In-Circuit Test System "i3070"

An in-circuit test system characterized by easy operability through a GUI.

The Agilent Medalist i3070 is the latest in-circuit test system that combines the high flexibility of the widely used 3070 series with the advanced graphical user interface of the i5000. It is equipped with new features that enhance test throughput and test coverage, enabling further efficiency in board inspection. 【Features】 ○ Easy operability through GUI ○ High test throughput ○ Highly flexible system architecture ○ Compatibility with existing systems For more details, please contact us or download the catalog.

  • Circuit Board Inspection Equipment

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Laser Diode Test System [LD2920TB]

Laser Diode Test System [LD2920TB]

Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state.

This is an LD test system that automatically and rapidly measures and sorts the electrical and optical characteristics of long-wavelength laser diodes in bare chip condition. <Features> ■ Fully automated transport from supply to measurement and classification ■ Easy monitoring of operating conditions with up to 13 cameras ■ Capable of measuring at any temperature from +20°C to -100°C ■ Simultaneous IL measurement of FRONT light and BACK light. For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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Pitot Static Tester / Multifunction Avionics Radio Test System

Pitot Static Tester / Multifunction Avionics Radio Test System

Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.

Laversab, as an audited and approved subcontractor of the U.S. Department of Defense, supplies extremely robust military-grade products to the U.S. Air Force, U.S. Navy, and other government agencies. Our customers include major aircraft manufacturers, airlines, and certified repair facilities worldwide, including the United States. 【Product Lineup】 ■ Multi-functional Avionics Radio System ARTS7000 - WiFi compatible - ■ Pitot Static Testers - Model 6150, Model 6200, Model 6250, Model 6270, Model 6300, Model 6300L, Model 6600, Model 6600, Model 6600-NG, Model 6300-M3, Model 6300-M4, Model 6600-M4 ■ Laboratory Models - 6500 / 6500-HA, Model 6580 / 6580HA *For more details, please refer to the PDF document or feel free to contact us.

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  • Calibration and repair
  • Tester

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Solar Cell Test System ITS9380

Solar Cell Test System ITS9380

By using it in combination with our electronic load products, the parameter testing of solar cells can be completed automatically. Multiple units can be connected, and long-duration automated testing is possible.

Measurable parameters ◆ Short circuit current ◆ Open circuit voltage ◆ Peak power ◆ Voltage at peak power point ◆ Current at peak power point ◆ Resistance at peak power point ◆ Fill factor *For details, please contact us.*

  • Power Supplies
  • power supply

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Release relaxation test mobile testing system "E-Liner EMIT"

Release relaxation test mobile testing system "E-Liner EMIT"

Even without a preliminary test, it can meet the test speed conditions of hundreds of km/h.

The FronTone E-Liner system is a mobile system powered by electricity for performance testing in accordance with FMVSS 226 for release mitigation tests. <Features> ■ The E-Liner EMIT acceleration device is driven by an electronic linear motor, significantly simplifying handling and testing performance. ■ The linear drive is not affected by room temperature or humidity, eliminating the need for a test matrix. Preliminary tests are also a thing of the past for the same reason. ■ Speed can be continuously adjusted from 1 to 27 km/h. ■ With automatic return, the impactor mounting device returns to the starting position immediately after launch. Therefore, the mounting position is outside the rebound area of the release mitigation thread. ■ Another major advantage is that the E-Liner testing system accelerates smoothly without any jerking force. For more details, please contact us or download the catalog.

  • Testing Equipment and Devices

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Parametric Test System

Parametric Test System

Semiconductor Test Architects

Semiconductor Parametric Instrument, Parametric Switch Matrix, Integrated Test System

  • Other semiconductors

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Open Short Test System "V2048"

Open Short Test System "V2048"

Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.

The "V2048" is a semiconductor tester capable of conducting four simultaneous tests. With its reasonable pricing, it is easy to expand the tester itself. With high fault tolerance and a clear user interface, it helps facilitate efficient mass production. 【Features】 ■ Capable of mounting a 60A high current power supply (HCDPS) ■ Simultaneous measurement of 4 DUTs ■ Equipped with function features that support configuration/information reading via JTAG and other methods *For more details, please refer to the PDF materials or feel free to contact us.

  • Tester
  • Other semiconductors

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『iQ-Automator Solution』

『iQ-Automator Solution』

Fully automatic camera testing is now possible with just one click!

The "iQ-Automator Solution" automatically evaluates the image quality of mobile phone cameras by combining the iQ-Automator software and the iQ-Robot, allowing for more efficient and effective feedback. The iQ-Automator Solution is centered around the advanced iQ-Automator software. By using this software, users can design custom workflows and automatically adjust the positioning of the test camera to fit many of Image Engineering's lighting and measurement devices. Additionally, an API for electric devices (iQ-Drive API) is optionally provided for easy integration into users' proprietary control software. *Currently, the iQ-Automator Solution is no longer available. Image Engineering is collaborating with Sofica in Finland as a strategic partnership to develop a new automation testing solution. For inquiries regarding automation testing solutions, please contact us through the inquiry form below.*

  • Other analyses
  • others

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VCSEL wafer test system

VCSEL wafer test system

Simple positioning operation! It can automatically measure within a specified area on the wafer.

We would like to introduce the "VCSEL Wafer Test System" handled by Fukuhara System. This product can automatically measure the specified area on the wafer with simple positioning operations. It can be utilized for I-L/I-V measurements, spectrum measurements, temperature dependence evaluations of each measurement, and evaluations of optical output/driving current dependence in spectrum measurements. 【The following measurements necessary for VCSEL characteristic evaluation are possible】 (1) I-L/I-V measurement (2) Spectrum measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Optical output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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