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Test Systems Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  3. 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社 Tokyo//Testing, Analysis and Measurement
  4. 4 ジャパンマシナリー Tokyo//Trading company/Wholesale
  5. 5 日本ハイドロパック Gifu//Industrial Machinery
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Test Systems Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Tabletop Gross Leak Test System | MSA-0101 series フクダ
  2. Dedicated Leak Test System for Small Electronic Components | MS Series フクダ
  3. Helium Leak Test System | HES-2000 series フクダ
  4. 4 ITU-T P.1140 eCall Voice Quality Test Wideband ヘッドアコースティクスジャパン
  5. 5 Druck 『ADTS 405 MkII』 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社

Test Systems Product List

76～89 item / All 89 items

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VCSEL wafer test system

VCSEL wafer test system

Simple positioning operation! It can automatically measure within a specified area on the wafer.

We would like to introduce the "VCSEL Wafer Test System" handled by Fukuhara System. This product can automatically measure the specified area on the wafer with simple positioning operations. It can be utilized for I-L/I-V measurements, spectrum measurements, temperature dependence evaluations of each measurement, and evaluations of optical output/driving current dependence in spectrum measurements. 【The following measurements necessary for VCSEL characteristic evaluation are possible】 (1) I-L/I-V measurement (2) Spectrum measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Optical output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Muelcy Test System 'μLC Test System'

Muelcy Test System 'μLC Test System'

Portable compact HILS! Achieves easy operation and evaluation.

The "μLC Test System" is a very compact HILS test system, palm-sized, designed for simple verification in control device development. It addresses challenges such as "HILS is very expensive and difficult to handle" and "I don't need a large-scale HILS; I want to perform simple simulations at my desk," allowing for a simple setup. By simulating and outputting the behavior of a vehicle's engine function or any unit, it enables a simplified simulation that replicates the actual device. Furthermore, a user-friendly interface allows for easy operation and evaluation. 【Features】 ■ Compact size and easy setup ■ User-friendly interface ■ Integration of simulations for common automotive interfaces in one unit ■ Highly versatile I/O ports ■ Control via scripts or Simulink is possible *For more details, please refer to the PDF materials or feel free to contact us.

  • Automotive catalyst evaluation test equipment

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Test Burn-In Tester

Test Burn-In Tester

A wide variety of package burn-in test systems are available!

The "Test Burn-In Tester" inherits Ando Electric's burn-in testing and is a package burn-in test system that realizes diverse testing conditions and functions through upgrades tailored to new customer needs. We offer a lineup that includes the "AF8652D6," which provides high power with added Mask-ROM testing capabilities, as well as the "AF8862C7" with a 10MHz, 60-slot specification, and the "DM8827," which allows for individual control operation in 4 zones. 【Lineup】 ■AF8652D6 ■AF8862C7 ■DM8827/DM8857 ■AF8651A5/AF8651A7/AF8655C7 ■AF8610E6 *You can download the English version of the catalog. *For more details, please refer to the PDF materials or feel free to contact us.

  • Semiconductor inspection/test equipment

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Function Test System

Function Test System

Equipped with highly practical and convenient features! We cater to a wide range of needs from jig manufacturing to measurement systems.

Fine Tech Co., Ltd. handles the "Function Test System." We cater to a wide range of needs, from jig manufacturing to measurement systems. You can freely build systems tailored to your applications. Additionally, with remote support, we can promptly respond to issues such as recovery from NG (no good) and urgent specification changes. 【Highly Practical and Convenient Features】 ■ Remote Support ■ Log Analysis Tool ■ Notification Function *For more details, please refer to the PDF materials or feel free to contact us.

  • others

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Dedicated Leak Test System for Small Electronic Components | MS Series

Dedicated Leak Test System for Small Electronic Components | MS Series

Introducing our lineup of fully automatic machines, dedicated machines, and tabletop types! We present a specialized airtight inspection device for small electronic components.

The "MS series" is a leak test system for small electronic components that require airtightness, including: - Crystal devices - Ceramic oscillators - Optical devices - Power semiconductors - CAN devices - Laser diodes - Capacitors Leak testing of sealed products may involve both gross leak and fine leak inspections, depending on product specifications and characteristics. We offer a lineup that includes fully automatic machines capable of performing the entire process in one unit, custom-built dedicated machines, and convenient tabletop types for sampling inspections. 【Lineup (excerpt)】 <Fully Automatic Devices> ■ Gross Leak Test System - MSZ-6200 - MS-6086 ■ Bombing Gross and Fine Leak Test System - MSX-6110 - MSX-6200 - MSX-7000 *For more details, please refer to the PDF document or feel free to contact us.

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  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

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Bombing Gloss Finely Leak Test System | MSX-0101

Bombing Gloss Finely Leak Test System | MSX-0101

This is a composite airtightness testing device that completes filling by bombing, gross leak detection through pressure change confirmation, and fine leak detection using mass spectrometry, all in one unit.

The "MSX-0101 series" is a compact leak testing device specifically designed for electronic components such as MEMS, crystal devices, and SMDs. It is fully equipped with helium filling, gross leak testing, and fine leak testing in a single system. By managing the filling time and waiting time, it allows for proper gross and fine leak testing. 【Features】 ■ Ideal for leak testing of electronic components such as MEMS and SMDs ■ Quantifies gross and fine leak amounts while managing filling time and waiting time ■ Capable of performing both gross leak testing and fine leak testing with one device ■ Enables highly accurate fine leak measurement by appropriately setting bonding conditions and gross leak conditions *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

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Ultrafine Leak Test System | MUH-0100

Ultrafine Leak Test System | MUH-0100

High-sensitivity leak testing for small electronic components! We offer solutions down to ultra-fine leaks [patented technology].

The "MUH-0100 series" is a leak testing device specifically designed for ultra-micro leak measurement that employs the "capsule accumulation method." Our company has developed a high-sensitivity helium leak detection technology called the "capsule accumulation method" for measuring ultra-micro leaks. MEMS components such as angular velocity sensors and infrared image sensors, as well as small electronic components, need to maintain their sealing properties over long periods, requiring high airtightness. 【Capsule Accumulation Method Features】 ■ Capable of measuring up to 4×10⁻¹⁵ Pa·m³/s (He) ■ Significantly reduces background noise ■ Capable of detecting ultra-micro helium leaks ■ Reduces the influence of gases other than helium, which can be sources of error ■ Eliminates the need for heaters or ultra-low temperature pumps, with startup maintenance times comparable to standard helium leak detectors ■ Commercially available standard leaks can be used for calibrating helium accumulation amounts *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

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Tabletop Gross Leak Test System | MSA-0101 series

Tabletop Gross Leak Test System | MSA-0101 series

PFAS-free! Why not switch from using fluorinated inert liquids for liquid immersion testing to pressure leak testing for airtightness inspection?

As an alternative inspection method to liquid immersion testing (leak testing) using per- and polyfluoroalkyl substances (PFAS), Fukuda Corporation has been providing airtight testing equipment using pressure change leak testing methods for some time. The 'MSA-0101 series' is the latest airtight testing equipment for sealed products that confirms gross leaks. It is designed for small-scale applications such as testing during device development and random airtight inspections. (For mass production testing or line integration, we offer fully automated testing equipment in the 'MS series.') The product size for inspection ranges from small devices measuring a few millimeters to medium-sized devices up to 80 × 70 mm, which can be accommodated by manufacturing measurement jigs (cores).

  • Leak Testing Equipment
  • Environmental Test Equipment
  • Other measurement, recording and measuring instruments

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sCT9002 Silicon Photonics Wafer Test System

sCT9002 Silicon Photonics Wafer Test System

A smart test system optimized for mass production screening of silicon photonics.

The Semight sCT9002 is a SiPh wafer testing system that is optimized and integrated in both hardware and software, achieving significant improvements in optical alignment performance and coupling speed. This system adopts a modular structure and supports optical coupling using single-core fibers or fiber arrays. It supports both vertical coupling and edge coupling methods, significantly reducing measurement time through parallel testing configurations and dramatically improving testing efficiency. The high precision and high reliability of the sCT9002's measurement performance provide assured data quality and reproducibility in the research and development as well as mass production verification of silicon photonics wafers.

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  • Tester

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WAT6600 Wafer Acceptance Test

WAT6600 Wafer Acceptance Test

Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.

The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism

  • Other electronic measuring instruments

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Automated Test System "PXI Low-Density General-Purpose Switch Module"

Automated Test System "PXI Low-Density General-Purpose Switch Module"

High-speed operation with an average of 250μs! Highly reliable Pickering Company reed relays.

The "PXI Low-Density General-Purpose Switch Module" is a product suitable for applications that do not require a large number of relays. It can be connected to a test system using a 96-pin male connector. We also offer assembly of the connectors and cables necessary for module connections. The switches for low and medium loads use sputtered ruthenium reed relays, which suppress the dependency of characteristics on very small loads. 【Features】 - 16, 24, or 32 relays per module - SPST, DPST, and SPDT configurations - Switch ratings up to 1500V, 1.2A, and a maximum of 20W - 96-pin front panel connector - Quickly and easily detect relay abnormalities on LXI or PXI switch systems For more details, please contact us.

  • relay

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ITU-T P.1140 eCall Voice Quality Test Wideband

ITU-T P.1140 eCall Voice Quality Test Wideband

ITU-T P.1140 is a voice quality testing system for emergency call (eCall) devices (broadband).

In the event of a car accident, the emergency call system will automatically dial the emergency call center hands-free. To ensure optimal call quality between the car and the response service, the ITU-T specifies a comprehensive testing method for hands-free emergency calls originating from cars in ITU-T Recommendation P.1140. HEAD acoustics has commercialized tests for wideband (WB) calls as the ACQUA standard specification UG P.1140-WB. The ACQUA standard covers the wideband part of ITU-T Recommendation P.1140 (07/2022).

  • Other measurement, recording and measuring instruments

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GB/T 45314-2025 China eCall Test Requirements

GB/T 45314-2025 China eCall Test Requirements

The Standardization Administration of China has established a comprehensive testing standard for voice calls during emergency notifications as GB/T 45314-2025.

The ACQUA standard specification GB/T 45314 eCall has been developed and commercialized to implement the acoustic performance compliance verification tests and requirements for narrowband and wideband voice transmission based on GB/T 45314-2025 (Clause 5). All voice signals used in acoustic measurements are in Chinese. The ACQUA standard specification consists of a single ACQUA project, which includes the measurement and analysis of eCall systems capable of processing narrowband and wideband signals. This project has implemented testing and result analysis tools based on the requirements of GB/T 45314-2025 (Clause 5).

  • Other measurement, recording and measuring instruments

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