Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
211～240 item / All 391 items
EBSD: Electron Backscatter Diffraction
Measurements can be performed in bulk state without the need for thinning processes like TEM (NBD: Nano Beam Diffraction). It has the high spatial resolution characteristic of SEM and relatively high strain sensitivity. Additionally, there is a possibility of detecting local lattice strain as tensor data.
By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★
When evaluating the particle size and structure of fine particles used in a liquid dispersion, it is common practice to dry the liquid to extract the fine particles as a powder and measure them using an electron microscope. However, this measurement method is not suitable for investigating how the particles are dispersed, as changes in the dispersion state and deformation of the particles can occur due to drying. In MST, to directly assess how fine particles are dispersed within a liquid sample, cryo-processing followed by SEM analysis (cryo-SEM analysis) is performed for evaluation.
UPS: Ultraviolet Photoelectron Spectroscopy
In semiconductors, it is possible to determine the ionization potential from the valence band maximum (VBM) and the rising position on the high binding energy side (Ek(min)). Measurements are conducted after Ar ion sputter cleaning to remove surface organic contamination. ■ Determination of the valence band maximum (VBM) The spectrum near the valence band edge is extrapolated linearly to find the intersection with the background. ■ Calculation of the ionization potential Ionization potential (I.P.) = hν - W hν: Energy of the incident ultraviolet light (He I line 21.22 eV) W: Energy width of the spectrum (Ek(min) - VBM)
![[Analysis Case] Evaluation of Surface Deterioration of Polycarbonate](https://image.mono.ipros.com/public/product/image/8a8/2000246373/IPROS1200907625458542699.jpg?w=280&h=280)
Structural analysis of resin surface degradation using TOF-SIMS.
Polycarbonate (PC) is a type of thermoplastic that has excellent transparency, impact resistance, and heat resistance. It has been reported that degradation occurs due to hydrolysis, leading to the generation of the raw material bisphenol A (BPA). Particularly in solar panels, it is important to understand how the surface of the material changes under UV (ultraviolet) irradiation. Below, we present a case study that evaluated the degree of degradation of the PC surface due to UV irradiation using TOF-SIMS.
XPS: X-ray Photoelectron Spectroscopy
In XPS analysis, the binding state evaluation of the material surface is conducted by observing the energy of photoelectrons obtained through X-ray irradiation. It allows for the assessment of whether metal elements are in an oxidized state, and for elements with significant energy shifts (chemical shifts) due to oxidation, it also enables the evaluation of the presence and proportion of multiple valences. Below are the main metal elements and oxides for which multiple valence evaluations are possible.
XAFS: X-ray Absorption Fine Structure
Self-assembled monolayers (SAMs), which are oriented organic films, have their functions and properties, such as surface wettability and adsorption, altered by orientation and orientation angle. Using XAFS with synchrotron radiation, it is possible to evaluate the orientation and orientation angle of organic film materials by analyzing the X-ray incidence angle dependence of peak intensity.
![[Analysis Case] Evaluation of Additives in Polymer Materials](https://image.mono.ipros.com/public/product/image/afa/2000247128/IPROS8331246627070369094.jpg?w=280&h=280)
Qualitative analysis of components by LC/MS.
Many additives, including plasticizers, are used in polymer materials such as resin products. We present a case study on the qualitative analysis of additives contained in commercially available PVC resin. The components eluted by immersion in an organic solvent were qualitatively analyzed using LC/MS. As a result, components estimated to be DEHP (DOP) as a plasticizer and epoxy fat (plasticizer/stabilizer) were detected. By using standard samples, it is also possible to quantify each detected additive component.
SIMS: Secondary Ion Mass Spectrometry
In the quantitative and compositional evaluation of impurities in the semiconductor material SiGe using SIMS, the following considerations must be taken into account during analysis: ● If appropriate quantification corrections are not made according to the Ge concentration, the impurity quantification values may differ by more than 50% from the actual values. Standard samples corresponding to each composition are necessary for quantitative evaluation. ● It is known that the sputtering rates differ between Si and SiGe. In samples where the composition varies with depth, the sputtering rate changes with depth as well. At MST, high-precision compositional analysis is possible through the preparation of standard samples. Additionally, by using calibration curves, impurity analysis and sputtering rate corrections for each composition of SiGe can be performed.
GC/MS: Gas Chromatography-Mass Spectrometry
The WA (Wafer Analyzer) is a device that heats wafers with a diameter of φ76 to 300mm to elevate their temperature, gasifying organic contaminants adhered to the wafer surface and trapping them in a collection tube. As a result, it can concentrate compounds such as phthalate esters and cyclic siloxanes, which are considered causes of device characteristic impacts and manufacturing troubles, allowing for high-sensitivity measurement using GC/MS. Quantification using hexadecane is also possible. - Evaluation of organic contaminants on one side of the wafer is possible. - Detection of easily volatile components is possible since vacuum pumping is not required. - Organic components can be detected with high sensitivity (for 300mm wafers, on the order of 0.01ng/cm²). - Quantification using hexadecane conversion is possible.
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
The purpose of evaluating metal contamination on the surface of Si wafers using ICP-MS includes not only the contamination assessment of the Si wafers themselves but also the evaluation of contamination within semiconductor devices and the assessment of the working environment due to Si wafer exposure. Therefore, the analysis of the Si wafer surface is conducted for various purposes. ICP-MS analysis can sensitively obtain the amount of metal contamination on the surface of Si wafers, and it is also possible to specify the evaluation area according to the purpose.
Laser microscope
This introduces the evaluation of surface shape using a laser microscope.
TOF-SIMS, D-SIMS: Secondary Ion Mass Spectrometry
In semiconductor manufacturing processes, the contamination of impurities can lead to a decrease in characteristics and manufacturing yield, making the prompt identification and quantification of impurity elements crucial. At MST, we qualitatively analyze impurity elements using TOF-SIMS (Static-SIMS) and quantitatively measure the detected elements in the depth direction using D-SIMS (Dynamic-SIMS), enabling the evaluation of impurities within devices. This document presents a case study of measuring metal impurities in alkali-free glass.
Non-contact three-dimensional measurement device
Non-contact three-dimensional measurement device
It is possible to visualize the phase separation structure of polymers from thermal conductivity information.
The probe tip made of SiO2 is coated with Pd, and the probe itself acts as a resistive element. Therefore, when current flows through the probe tip, a temperature rise occurs, and when it comes into contact with the sample surface, the sample absorbs the heat from the probe. To maintain a constant probe temperature, the amount of electricity supplied to the probe is adjusted, and by plotting the changes in the supplied electricity at each measurement point, the thermal conductivity of the measurement locations (for each material) is visualized as a distribution.
![[Analysis Case] Evaluation of the Composition of Secondary Battery Electrolyte](https://image.mono.ipros.com/public/product/image/56c/2001516658/IPROS4453583165640670135.jpg?w=280&h=280)
Qualitative and quantitative analysis of various components contained in the electrolyte.
In the electrolyte of lithium-ion secondary batteries, a combination of high dielectric constant solvents and low viscosity solvents is used to improve electrical conductivity. Additionally, additives and electrolytes (supporting salts) not only facilitate the transport of Li ions but also have the function of forming a film on the electrode surface, requiring various performance characteristics. This paper presents examples of qualitative and quantitative analysis of various components such as solvents, electrolytes, and additives by evaluating the electrolyte itself using ICP-MS, volatile components during electrolyte heating using GC/MS, and the dry residue of the electrolyte using TOF-SIMS.
![[Analysis Case] Local Area Evaluation of Positive Electrode Active Material in Secondary Batteries (C0614)](https://image.mono.ipros.com/public/product/image/387108/IPROS15602713706541963129.png?w=280&h=280)
Composition, crystal structure, and chemical state evaluation near the surface of living materials are possible!
Our company conducts local area evaluation of positive electrode active materials for secondary batteries (C0614). It is known that in lithium-ion secondary batteries, the crystal structure of the active material surface and the valence of metal elements change due to ion extraction and insertion during charge and discharge, as well as degradation. In a case where TEM was used for local area evaluation to assess composition, crystal structure, and chemical state, it was found through EDX that AlOx is coated on the outermost layer. Additionally, electron diffraction and EELS revealed that the crystal structure and valence differ between the surface and the interior of the active material. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ [TEM-EELS] Electron Energy Loss Spectroscopy *For more details, please download the PDF or feel free to contact us.
Introduction to cancer drug evaluation using CellPet FT with cancer organoids! [Free technical materials available]
This document contains technical information on "Fragmentation of F-PDOs / Evaluation of Anticancer Drugs" using the spheroid fragmentation and dispersion device "CellPet FT." It features photographs showing the condition after processing immediately, as well as at 3, 9, and 13 days of culture, using a 70μm mesh filter. Please feel free to contact us if you have any inquiries. *For more details, please refer to the PDF document or feel free to contact us.*
The automatic culture device "MakCell" has less variation in temperature compared to manual culture! [Free technical materials available]
We will introduce a comparative evaluation between the tabletop automatic cell culture device "MakCell" and manual culture. Compared to manual culture, cell culture using MakCell showed an increase in the number of cells obtained. Regarding cell morphology, no significant changes were observed, and floating cells were confirmed in both MakCell and manual culture. ~Limited Information~ Only 2 units available in stock (as of March 2023), the list price of 13,700,000 yen (excluding tax) will be offered at a discounted price of 9,800,000 yen (excluding tax) for deliveries by the end of June 2023, which is approximately a 28.5% discount! [Delivery adjustment fee: 300,000 yen (excluding tax) separately] *For more details, please refer to the PDF document or feel free to contact us.
![[DL Available/GD-OES Analysis and Measurement] Cleaning Evaluation of Plated Substrates](https://image.mono.ipros.com/public/product/image/f75/2000737635/IPROS38283696874673980014.png?w=280&h=280)
With GD-OES (Glow Discharge Optical Emission Spectroscopy), you can understand the film thickness and concentration of nickel plating. Please also use it for the analysis of other surface treatments.
Glow Discharge Optical Emission Spectrometry (GD-OES) is a method for analyzing the composition of a sample by sputtering atoms from its surface, exciting those atoms into a plasma state, and measuring the resulting emission. In this case, we will introduce the "investigation of substrate cleaning effects before the plating process" using GD-OES. Please take a moment to read the PDF materials. In addition to this case, our company has numerous analytical achievements related to plating. We also conduct various surface analyses, including XPS and Auger, in addition to GD-OES. If you have any questions, please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.
We are holding a "free seminar" on reliability evaluation, analysis, and quality technology.
Although it is irregular, we hold "free seminars" on quality technology, including reliability evaluation, analysis, and other topics, several times a year. ■Examples of themes■ We send out announcements of the seminars to customers who have subscribed to our company’s email newsletter. In addition to free seminars, we also provide information about special campaigns and offers. We encourage you to consider registering.
Reliability evaluation of power modules and power devices. We offer proposals from the construction of test environments tailored to your power cycle specifications to investigation and analysis!
When power semiconductors and power modules are repeatedly turned ON and OFF, the self-heating and cooling of the components and modules cause distortion due to the differences in expansion of the bonding materials, leading to a deterioration in bonding reliability. We offer power cycle testing that takes into account the heating operation due to repeated self-heating and cooling cycles. ■ Components, units, and devices where the adoption of power semiconductors and power modules is progressing: - Traction inverters for electric vehicles (EVs) and hybrid electric vehicles (HEVs) - On-board chargers and DC-DC converters - Motor control, robots, machine tools, elevators - Industrial inverters and uninterruptible power supplies (UPS) - Solar power generation systems and wind power generation systems
Introduction of technical information such as A measurements conducted by dividing the unit work area into equal intervals both vertically and horizontally, and B measurements of air concentration!
I will introduce the evaluation of work environment measurement. Measurement A refers to the measurement conducted by dividing a unit workplace into equal intervals both vertically and horizontally to grasp the average state of harmful substance concentration in the air. Measurement B is a supplementary measurement to Measurement A, which involves measuring the air concentration at locations and times where the exposure level for workers is considered to be maximum. 【Overview】 ■ Measurement A: A measurement conducted by dividing a unit workplace into equal intervals both vertically and horizontally to grasp the average state of harmful substance concentration in the air. ■ Measurement B: A supplementary measurement to Measurement A, which involves measuring the air concentration at locations and times where the exposure level for workers is considered to be maximum. ■ First evaluation value: 5% of the unit workplace exceeds this concentration. ■ Second evaluation value: Arithmetic mean. *For more details, please refer to the related links or feel free to contact us.
A multifunction printer is a versatile device that can perform multiple functions with just one machine. Therefore, it is necessary to conduct tests from all angles!
Our company is dedicated to detecting defects (bugs) in software before shipment through software evaluation, and we strive daily to contribute to the improvement of software quality. Among these efforts, we particularly focus on the software evaluation of digital color/monochrome multifunction printers.
We undertake performance evaluation through various analyses, suspension manufacturing, production of lightweight and high-rigidity parts, and evaluation of vehicle body and frame performance.
We will conduct strength analysis using CAE. We will analyze strength, motion, and fluids. We also manufacture special suspensions such as wheel-in-motor systems. We create simple jigs and can produce welded structural components in a short lead time, as well as high-precision parts based on post-welding heat treatment and machining. We manufacture lightweight parts using high-strength steel, titanium, and composite materials. We will produce original frames and modified frames according to your budget and performance requirements.
The most anticipated "water treatment membrane" technology in the growing market of the "water business"! A detailed explanation of the basic mechanisms of permeability and filtration of water treatment membranes, as well as the latest water treatment membrane technologies!
○Publication Date: January 30, 2012 ○Format: B5 size hardcover, 276 pages ○Price: 60,000 yen (excluding tax) → STbook member price: 56,952 yen (excluding tax) ○Authors: Yu Kurihara, Toray Industries, Inc. / Hiroki Tominaka, Toray Industries, Inc. / Yoshiyuki Tanaka, Toray Industries, Inc. / Eiji Iriya, Nagoya University / Seiji Katagiri, Nagoya University / Hidetoshi Matsuyama, Kobe University / Masahiro Henmi, Toray Industries, Inc. / Haruki Shimura, Toray Industries, Inc. / Atsuo Kumano, Toyobo Co., Ltd. / Takuji Shintani, Nitto Denko Corporation / Osamu Nakatsuka, Daisen Membrane Systems, Inc. / Shinichi Minegishi, Toray Industries, Inc. / Kenji Komori, Toray Industries, Inc. / Rigen Kaminishi, Mitsubishi Rayon Co., Ltd. / Toru Morita, Sumitomo Electric Fine Polymer, Inc. / Minoru Tsuru, Hiroshima University / Taro Urase, Tokyo University of Technology / Yoshaki Kiso, Toyohashi University of Technology / Kazuho Nakamura, Yokohama National University / Yoshikou Watanabe, Hokkaido University / Hiroshi Yamamura, Asahi Kasei Chemicals Corporation / Masatoshi Kato, Katayama Naruko Co., Ltd. / Hidetoshi Matsumoto, Tokyo Institute of Technology / Akihiko Tanioka, Tokyo Institute of Technology / Masahiko Matsukata, Waseda University / Mitsuru Higa, Yamaguchi University / Mikihiro Nomura, Shibaura Institute of Technology
Optimize press forming simulation to quickly correct product and die face development through springback analysis in the early stages.
By correcting the springback prediction adjustment, which is usually performed in the final stage of press forming simulation, at an earlier stage, it becomes possible to carry out the process more easily and cost-effectively after mold processing. 【Contents】 - Simulation applying more accurate material information - Mesh and control parameters effective for measuring springback - Simulation of parts that replicate the production plan - Construction of a safe "green" simulation - Notes on setting up springback analysis and measurement *For more details, please refer to the PDF document or feel free to contact us.
We conducted a cleaning evaluation using samples created under conditions that are likely to leave residues intentionally!
In the field of power semiconductors for automotive and industrial applications, the adoption of "sintering bonding" as a joining technology that achieves high resistance and high reliability against thermal stress is expanding, replacing solder bonding. Similar to no-clean soldering technology, sintering bonding is fundamentally designed for "no-clean" processes. However, the currently mainstream sintering bonding methods are performed under high temperature and high pressure conditions, which can lead to residues generated and adhered during the bonding process that may affect subsequent processes and long-term reliability. Cleaning is one potential solution to this issue. Although there is a "no-pressure" method for sintering bonding, its applications tend to be limited from the perspective of strength and reproducibility. Additionally, while it is residue-free, it is not "zero residue," so cleaning can also be a viable solution for achieving reliability. *For detailed content of the column, please refer to the related link. For more information, feel free to contact us.*
We will exhibit at the "Healthcare and Medical Device Development Exhibition (MEDIX)" held on October 23, with a minimum half-day estimate.
Our company is a fabless manufacturer that handles precision machined parts. We are engaged in three essential areas of manufacturing and assist our customers' production with the networks and information we have cultivated. - Procurement of precision machined parts - Measurement and evaluation of processed parts and developed products - Design and production of machinery and dedicated jigs Our unique "business model" in procurement, along with our wide range of "processing technologies" and "inspection equipment," may be of assistance to you. We will also be exhibiting at the "MEDIX" Medical Device and Healthcare Development Exhibition, so we hope you can come and see us in person to learn more about our company. You can view our "company brochure" by downloading it from the link below. From metals to plastics, we are ready to handle your prototype and development part machining needs. If you have any questions, please feel free to contact us. *The image shows our booth at the "Tokyo Mechanical Elements Technology Exhibition."
Technical documentation on the "Surface Distortion Scanning Sensor" for measuring and evaluating the distortion of target object surfaces.
The "Surface Distortion Scanning Sensor STRIPER" from Hachiko Automation Co., Ltd. calculates curvature from the amount of change (displacement) in the stripe pattern and measures/evaluates the distortion of the object's surface. Why "curvature" instead of "displacement"? When trying to evaluate micro-distortion of a few micrometers as "displacement," it becomes buried within the displacement of the measurement surface, making it difficult to distinguish and extract the distorted areas. When evaluating micro-distortion as "curvature," the gentle changes and slopes of the measurement surface result in a large curvature radius, making the curvature almost "0," while the distorted areas have a small curvature radius, leading to significant changes in curvature that are easy to distinguish. [Contents] ■ What is curvature? ■ Advantages For more details, please refer to the catalog or feel free to contact us.
Equipped with a calculation method for blackness evaluation of piano black. It enables not only the management of color, gloss, and fluorescence but also the evaluation of blackness.
German-made BYK-Gardner spectrophotometer and color difference meter. The Spectro 2 Guide (spectrophotometer and color difference meter) is a measuring instrument that combines a colorimeter with fluorescence and gloss meters, providing a total solution for color measurement. It enables comprehensive color management with high performance while pursuing simplicity in operation, featuring a 3.5-inch touch color display. The live view displayed on the screen allows for pinpoint measurements, creating a new tactile experience as if you are touching the color. Additionally, it includes a dedicated calculation formula for blackness evaluation for piano black finishes, enabling assessments that were previously impossible.
