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evaluation Product List and Ranking from 124 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

evaluation Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. ユーロフィンFQL Kanagawa//Service Industry
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 大同分析リサーチ Aichi//Service Industry
  5. 5 null/null
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evaluation Product ranking

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. Eurofins FQL Co., Ltd. | Business Information ユーロフィンFQL
  2. Evaluation of Various Materials Using the No. 9 T-Plot Method (Basic Edition)
  3. Reliability testing of materials and chemical analysis evaluation after testing. アイテス
  4. 4 Why do batteries degrade? Unraveling battery evaluation from material properties. TA Instruments Japan （TAInstruments）
  5. 4 FEMFAT spectral extension module: Vibration fatigue strength evaluation マグナ・インターナショナル・ジャパン マグナパワートレイン・ECS（Engieering Center Steyr）

evaluation Product List

181～210 item / All 381 items

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Simultaneous evaluation of hundreds of small component measurement items in 30 seconds - 'OptoCloud S'

Simultaneous evaluation of hundreds of small component measurement items in 30 seconds - 'OptoCloud S'

Utilizing 3D reconstruction technology, it is possible to perform measurements of hundreds of items in 30 seconds.

"OptoCloud S" is an advanced optical measurement system that combines multiple lasers with high-precision rotational axes and optimized optical configurations. It performs 360° measurements without the need for positional adjustments of the parts. In a single measurement cycle, it captures millions of data points from different perspectives and constructs the 3D shape of the part within 30 seconds, simultaneously evaluating dozens of characteristics for complex shapes and structural components. 【Features】 - Significantly reduces the time for inline inspection. Can be used as an alternative to contact gauges and three-dimensional measuring machines. - Reduces equipment costs and installation space by minimizing the need for dedicated gauges. - Eliminates the influence of operators, achieving stable and reproducible measurements. - Capable of measuring delicate and complex shapes (soft surfaces, winding, hairpins, laminated materials) that are difficult or impossible to measure with contact methods. *For more details, please refer to the PDF document or feel free to contact us.

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  • Other inspection equipment and devices
  • Optical Measuring Instruments
  • Other measurement, recording and measuring instruments
  • evaluation

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Solving your soldering problems! ~Implementation Technology Case Studies~ Free distribution now available!

Solving your soldering problems! ~Implementation Technology Case Studies~ Free distribution now available!

"I want to know the recent profile trends!" "I want to see examples of solder evaluation!" We will directly solve your problems related to soldering!

We have compiled a handbook of implementation technology-related case studies for engineers struggling with defect improvement in mass production sites. Supervised by Mr. Kazuo Kawai, who has achieved defect improvements in many sites as an implementation advisor. As implementation technology advances with the miniaturization and complexity of products, we present various recent case studies (with photos) on trends in profiles and soldering evaluations, reflecting the era that demands serious technical responses. This handbook is available for free to all engineers involved in implementation sites! 【Contents】 1. Recent trends in profiles 2. Creating temperature profiles 3. Evaluation of solder 4. Company overview *For more details, please download the PDF or feel free to contact us.

  • Reflow Equipment
  • evaluation

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Multifaceted evaluation to ensure the quality and safety of antibody pharmaceuticals.

Multifaceted evaluation to ensure the quality and safety of antibody pharmaceuticals.

High-precision measurement of size variants, aggregates, and stability using light scattering detectors and LC-MS.

In the development of antibody drugs and antibody-drug conjugates (ADCs, etc.), it is essential to maximize the efficiency of the development process while ensuring the quality and safety of the products. By using light scattering detectors to evaluate size variants, aggregates, stability, and other factors from the early stages of development, it is possible to identify the characteristics of potential candidate antibodies early on and avoid risks and dropouts in the later stages of development. Combining this with LC-MS allows for even more comprehensive characterization. By clicking "Submit," you are deemed to have agreed to Waters' use and processing of the information provided on this site in accordance with Waters' Terms of Use and Privacy Notice. Terms of Use and Privacy Notice www.waters.com/legalandprivacy

  • Light Scattering Photometer
  • High Performance Liquid Chromatograph
  • Mass Spectrometer
  • evaluation

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Naito Densō Kōgyō Co., Ltd. Design and Evaluation Division Evaluation Department Business Information

Naito Densō Kōgyō Co., Ltd. Design and Evaluation Division Evaluation Department Business Information

We provide solutions tailored to your needs with our comprehensive technical capabilities.

Naito Densoe Kogyo Co., Ltd. is engaged in the electronic device business, focusing on device evaluation and analysis. We have a consistent system from reliability testing to analysis. With a wide variety of equipment, we meet our customers' needs. 【Business Content】 ■ Reliability evaluation and analysis of semiconductor devices, etc. *For more details, please refer to our catalog or feel free to contact us.

  • Other semiconductors
  • Other contract services
  • Other analyses
  • evaluation

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Safety evaluation and certification acquisition services (EMC testing)

Safety evaluation and certification acquisition services (EMC testing)

Free consulting available at the exhibition! Leave your EMC testing (product safety evaluation and certification acquisition) for Europe and North America to us!

~We will be exhibiting at the EMC and Noise Control Technology Exhibition (Techno Frontier)~ Dates: July 23 (Wed) to July 25 (Fri) Venue: Tokyo Big Sight Booth Number: 2D-210 【Events on the Day of the Exhibition】 ★EMC engineers will be on-site to provide 20 minutes of free consulting! (Reservation required)★ - During the event, customers who conduct business negotiations or sign contracts at our booth will be offered special trial prices! - During the event, customers who negotiate at our booth will have a chance to win a QUO card through a lottery! (To be shipped later) ○Highlights: Providing product safety certification support services such as CE marking, SEMI, KC/KCs, etc. We sincerely look forward to your visit. 【Example of Services】 ■CE Marking Compliance Assessment Service → Declaration of compliance with CE marking when exporting to the EU → Compliance assessment for Machinery Directive (MD), Low Voltage Directive (LVD), ATEX Directive (Explosion Protection), Pressure Equipment Directive (PED), EMC Directive (EMC) ■Field Labeling (Regulations for Industrial Equipment in North America) → Business partnership with QPS, registered with the US NRTL. Field labeling can be applied before shipment if possible. ☆We will do our best to accommodate urgent EMC testing requests!

  • EMC Testing
  • Public Testing/Laboratory
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Analysis and Countermeasures for Appearance Defects in Polymer Materials

Analysis and Countermeasures for Appearance Defects in Polymer Materials

A book that incorporates analysis and evaluation know-how that can be utilized when faced with actual problems in the field of material development and molding processing!

Contents Chapter 1: Introduction 1. Microscopic Infrared Method 2. Applications to Polymer Materials Chapter 2: Fundamentals of Surface, Interface, and Local Analysis and the Information Obtained Section 2.1: Infrared Spectroscopy Section 2.2: Raman Spectroscopy Section 2.3: X-ray Photoelectron Spectroscopy (XPS, ESCA) Section 2.4: Time-of-Flight Secondary Ion Mass Spectrometry Section 2.5: Electron Microscopy (SEM, TEM) Section 2.6: Atomic Force Microscopy Chapter 3: Practical Applications of Surface, Interface, and Local Analysis Section 3.1: Foreign Substance Analysis Section 3.2: Analysis of Bleed Section 3.3: Analysis of Whitening Section 3.4: Analysis of Surface Roughness and Cracks Section 3.5: Analysis of Coloring and Discoloration Chapter 4: Fracture and Deformation of Polymer Materials Chapter 5: Deterioration and Lifetime Prediction of Polymer Materials

  • Technical and Reference Books
  • Other polymer materials
  • plastic
  • evaluation

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[Book] Granting Antibacterial and Antiviral Properties (No. 2093BOD)

[Book] Granting Antibacterial and Antiviral Properties (No. 2093BOD)

Technical Specialty Book: A Thorough Explanation of Materials and Surface Designs That Prevent Bacteria and Viruses from Adhering!

Book Title: Granting Antibacterial and Antiviral Properties to Materials, Processing Technologies, and Evaluation --- ◎ Thorough explanation of materials and surface designs that prevent bacterial and viral adhesion! ◎ What are the indicators for measuring antibacterial and antiviral properties? Detailed explanation of evaluation technologies! ◎ Includes research, testing, and evaluation examples related to the novel coronavirus (SARS-CoV-2)! --- ■ Key Points of This Book ◆ Mechanisms of Bacterial and Viral Proliferation, Mechanisms of Antibacterial and Antiviral Action ◆ ・What are the types and characteristics of bacteria and viruses? How do they proliferate? What are the control methods? ・What are the mechanisms of action for organic and inorganic antibacterial agents and various antiviral agents? ◆ Design and Development of Antibacterial and Antiviral Properties, Technologies for Granting Properties to Materials, Processing Technologies ◆ ・Control technologies for antibacterial and antiviral performance, granting technologies, processing technologies ・Performance control using light ・Antibacterial and antiviral effects of silver and copper and the development of materials utilizing them ◆ Overview of Antibacterial and Antiviral Performance Testing and Evaluation Methods ◆ ・What are the evaluation testing methods and technologies for antibacterial and antiviral performance? ・What are the evaluation methods for antibacterial and antiviral products?

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  • others
  • Technical and Reference Books
  • Technical and Reference Books
  • evaluation

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Whisker evaluation

Whisker evaluation

The inspector observes without missing anything! Consistent whisker evaluation is possible from reliability testing to analysis.

While lead-free solder is becoming widespread, whiskers formed from Sn plating or solder joints have a significant impact on the reliability of electronic components. Our company offers a consistent whisker evaluation process from reliability testing to analysis. Inspectors carefully observe which components and pins on the substrate have whiskers. 【Features】 ■ Conduct visual inspections of assembled boards after reliability testing to determine the presence of whiskers. ■ If whiskers are detected during visual inspection, observe and measure them using a digital microscope. ■ For more detailed observation and analysis, perform surface SEM/EDX analysis. ■ If necessary, observations and analyses such as cross-sectional observation (SEM) and crystal orientation analysis (EBSD) are also possible. *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
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Material evaluation using a ultra-micro hardness tester.

Material evaluation using a ultra-micro hardness tester.

Useful for long-term quality control! Ultra-microhardness measurement of materials such as metals, polymers, and ceramics.

Our "Ultra-Micro Hardness Measurement for Material Evaluation" allows for the ultra-micro hardness measurement of materials such as metals, polymers, plastics, and ceramics. Additionally, since hardness can be quantified, it is also useful for long-term quality control. The hardness is determined by directly reading the depth of the indentation while applying a load to the indenter. It is also possible to determine characteristic values related to recovery behavior. 【Device Overview】 ■ Test force range: 0.4mN to 1000mN, Accuracy: ±0.02mN ■ Indentation range: 1nm (0.01μm) to 700μm *For more details, please refer to the PDF document or feel free to contact us.

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  • Contract Analysis
  • Analysis Services
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Evaluation of transmittance and yellowness (yellow degree) using a color difference meter.

Evaluation of transmittance and yellowness (yellow degree) using a color difference meter.

Digitizing transparency and color into numerical data! Objectively evaluating transparency rate and yellowing degree!

This introduction covers the evaluation of transmittance and yellowing (yellowness) using a color difference meter. By making the product's constituent materials transparent and richly colored, necessary functional characteristics, artistic qualities, and design elements for the product's application are imparted. However, yellowing (discoloration) can occur due to the environment in which they are used, potentially compromising those characteristics. By quantifying transparency and color not through human perception but as numerical data, objective evaluation becomes possible. 【Overview】 ■ Principles of color difference measurement and acquired data (XYZ Yxy color space) - Light emitted from a light source passes through a transparent sample, and within an integrating sphere box, data on the transmitted wavelengths (transmittance) and converted color space data are obtained. *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services
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Reliability testing of materials and chemical analysis evaluation after testing.

Reliability testing of materials and chemical analysis evaluation after testing.

Introducing a case where the changes in molecular structure of materials were verified through IR analysis! We also creatively accommodated a variety of sample setups.

Reliability testing of materials that make up the product under thermal and humidity loads is essential, but analysis and evaluation after testing is also an indispensable process. Constant temperature and humidity testing is a device that applies temperature and humidity loads to products and materials to check for changes in physical properties, characteristics, appearance, and lifespan. Our company has also devised various methods for setting up a wide range of samples. In this document, we will introduce a case where changes in the molecular structure of materials before and after constant temperature and humidity testing were verified through IR analysis. We encourage you to read it. [Contents] ■ Examples of reliability testing equipment (constant temperature and humidity testing equipment) ■ Innovations in sample setup ■ Comparative evaluation before and after testing through chemical analysis *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services
  • evaluation

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Evaluation of distortion and birefringence of products/materials by WPA.

Evaluation of distortion and birefringence of products/materials by WPA.

By evaluating the orientation, strain, and birefringence of the material, you can understand the internal stress and strain state!

The materials that make up the product are varied, but if there is significant or uneven internal stress during the manufacturing process, it can lead to issues such as deformation, cracking, and reduced performance due to usage and environmental conditions. By using 'WPA (Wide Polarization Analysis)', it becomes possible to understand internal stress and strain states by evaluating the orientation, strain, and birefringence of the material. Please feel free to consult with us. 【Features】 ■ Ability to understand internal stress and strain states ■ Clarification of material strain and birefringence from a molecular perspective ■ Analysis of defects and theories through multiple methods in a matrix - Raman spectroscopy (qualitative/strain/crystallinity), XRD (X-ray diffraction), AFM/SEM/TEM (crystal structure observation), DSC (degree of crystallization), etc. *For more details, please refer to the PDF document or feel free to contact us.

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Evaluation of particle size of positive electrode active material

Evaluation of particle size of positive electrode active material

Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!

We would like to introduce a case of particle size measurement of cathode active materials using laser diffraction conducted by our company. In air or liquid, laser light is irradiated onto particles, and the angular dependence of the intensity of light scattered by the particles is measured. The angular dependence of the scattered light intensity is measured, and from that data, the particle size distribution (particle size distribution) is calculated. Commercially available reagents were used as samples, and measurements were conducted in a dry state without dispersing in a solvent. The particle size measurement results for NMC oxide showed a monodisperse state with particle sizes below several tens of micrometers, and the median diameter was calculated to be 12 μm. 【Case Overview】 ■ Measurement Method ・Dry ■ Particle Size Measurement Results for NMC Oxide ・Monodisperse state with particle sizes below several tens of micrometers ・Median diameter is 12 μm *For more details, please refer to the PDF document or feel free to contact us.

  • Laser microscope
  • Other measurement, recording and measuring instruments
  • evaluation

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Distortion evaluation using SEM equipment

Distortion evaluation using SEM equipment

EBSD: Electron Backscatter Diffraction

Measurements can be performed in bulk state without the need for thinning processes like TEM (NBD: Nano Beam Diffraction). It has the high spatial resolution characteristic of SEM and relatively high strain sensitivity. Additionally, there is a possibility of detecting local lattice strain as tensor data.

  • Contract Analysis
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Cryo-SEM analysis: Evaluation of the dispersion state of microparticles in liquid.

Cryo-SEM analysis: Evaluation of the dispersion state of microparticles in liquid.

By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★

When evaluating the particle size and structure of fine particles used in a liquid dispersion, it is common practice to dry the liquid to extract the fine particles as a powder and measure them using an electron microscope. However, this measurement method is not suitable for investigating how the particles are dispersed, as changes in the dispersion state and deformation of the particles can occur due to drying. In MST, to directly assess how fine particles are dispersed within a liquid sample, cryo-processing followed by SEM analysis (cryo-SEM analysis) is performed for evaluation.

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Evaluation of the ionization potential of semiconductors

Evaluation of the ionization potential of semiconductors

UPS: Ultraviolet Photoelectron Spectroscopy

In semiconductors, it is possible to determine the ionization potential from the valence band maximum (VBM) and the rising position on the high binding energy side (Ek(min)). Measurements are conducted after Ar ion sputter cleaning to remove surface organic contamination. ■ Determination of the valence band maximum (VBM) The spectrum near the valence band edge is extrapolated linearly to find the intersection with the background. ■ Calculation of the ionization potential Ionization potential (I.P.) = hν - W hν: Energy of the incident ultraviolet light (He I line 21.22 eV) W: Energy width of the spectrum (Ek(min) - VBM)

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Valence evaluation of metal oxides by chemical shift

Valence evaluation of metal oxides by chemical shift

XPS: X-ray Photoelectron Spectroscopy

In XPS analysis, the binding state evaluation of the material surface is conducted by observing the energy of photoelectrons obtained through X-ray irradiation. It allows for the assessment of whether metal elements are in an oxidized state, and for elements with significant energy shifts (chemical shifts) due to oxidation, it also enables the evaluation of the presence and proportion of multiple valences. Below are the main metal elements and oxides for which multiple valence evaluations are possible.

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Evaluation of the orientation angle of organic film materials

Evaluation of the orientation angle of organic film materials

XAFS: X-ray Absorption Fine Structure

Self-assembled monolayers (SAMs), which are oriented organic films, have their functions and properties, such as surface wettability and adsorption, altered by orientation and orientation angle. Using XAFS with synchrotron radiation, it is possible to evaluate the orientation and orientation angle of organic film materials by analyzing the X-ray incidence angle dependence of peak intensity.

  • Other contract services
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High-precision quantitative evaluation of impurities in SiGe.

High-precision quantitative evaluation of impurities in SiGe.

SIMS: Secondary Ion Mass Spectrometry

In the quantitative and compositional evaluation of impurities in the semiconductor material SiGe using SIMS, the following considerations must be taken into account during analysis: ● If appropriate quantification corrections are not made according to the Ge concentration, the impurity quantification values may differ by more than 50% from the actual values. Standard samples corresponding to each composition are necessary for quantitative evaluation. ● It is known that the sputtering rates differ between Si and SiGe. In samples where the composition varies with depth, the sputtering rate changes with depth as well. At MST, high-precision compositional analysis is possible through the preparation of standard samples. Additionally, by using calibration curves, impurity analysis and sputtering rate corrections for each composition of SiGe can be performed.

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Evaluation of organic contamination using a wafer analyzer with GC-MS.

Evaluation of organic contamination using a wafer analyzer with GC-MS.

GC/MS: Gas Chromatography-Mass Spectrometry

The WA (Wafer Analyzer) is a device that heats wafers with a diameter of φ76 to 300mm to elevate their temperature, gasifying organic contaminants adhered to the wafer surface and trapping them in a collection tube. As a result, it can concentrate compounds such as phthalate esters and cyclic siloxanes, which are considered causes of device characteristic impacts and manufacturing troubles, allowing for high-sensitivity measurement using GC/MS. Quantification using hexadecane is also possible. - Evaluation of organic contaminants on one side of the wafer is possible. - Detection of easily volatile components is possible since vacuum pumping is not required. - Organic components can be detected with high sensitivity (for 300mm wafers, on the order of 0.01ng/cm²). - Quantification using hexadecane conversion is possible.

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Evaluation of metal contamination on the Si wafer surface

Evaluation of metal contamination on the Si wafer surface

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

The purpose of evaluating metal contamination on the surface of Si wafers using ICP-MS includes not only the contamination assessment of the Si wafers themselves but also the evaluation of contamination within semiconductor devices and the assessment of the working environment due to Si wafer exposure. Therefore, the analysis of the Si wafer surface is conducted for various purposes. ICP-MS analysis can sensitively obtain the amount of metal contamination on the surface of Si wafers, and it is also possible to specify the evaluation area according to the purpose.

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Surface shape evaluation using a laser microscope.

Surface shape evaluation using a laser microscope.

Laser microscope

This introduces the evaluation of surface shape using a laser microscope.

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Qualitative and quantitative evaluation of metallic impurities in non-alkali glass.

Qualitative and quantitative evaluation of metallic impurities in non-alkali glass.

TOF-SIMS, D-SIMS: Secondary Ion Mass Spectrometry

In semiconductor manufacturing processes, the contamination of impurities can lead to a decrease in characteristics and manufacturing yield, making the prompt identification and quantification of impurity elements crucial. At MST, we qualitatively analyze impurity elements using TOF-SIMS (Static-SIMS) and quantitatively measure the detected elements in the depth direction using D-SIMS (Dynamic-SIMS), enabling the evaluation of impurities within devices. This document presents a case study of measuring metal impurities in alkali-free glass.

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Evaluation of wafer warpage using a non-contact three-dimensional measurement device.

Evaluation of wafer warpage using a non-contact three-dimensional measurement device.

Non-contact three-dimensional measurement device

Non-contact three-dimensional measurement device

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[Analysis Case] Evaluation of the Distribution of Active Ingredients in Tablets

[Analysis Case] Evaluation of the Distribution of Active Ingredients in Tablets

The distribution of main components and additives can be visualized.

Among the various forms of medication, tablets are widely used, but not much is known about the state of each component within them. To gain insights into the distribution of active ingredients within tablets, we conducted TOF-SIMS analysis on the cross-section of commercially available cold medicine tablets. In the outer layer of the tablet, SiO2, presumed to be derived from lubricant components, was detected almost uniformly, while inside, the active ingredients acetaminophen, anhydrous caffeine, dl-methyl ephedrine, and noscapine were found to be dispersed in different areas.

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