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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  5. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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probe Product ranking

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部

probe Product List

331～345 item / All 665 items

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Contact probe

Contact probe

Contact probe, pitch 0.45mm and above, long lifespan, high quality, available for purchase from Misumi starting from one piece.

【Product Catalog】【Usage Instruction Materials】 Contact probes (also known as pogo pins or test probes) have been used for continuity testing of electronic components. Our company has over 30 years of experience as a specialized manufacturer of probe pins. The structure consists of a spring inside a tube, and the tip (the plunger) makes contact with the electrode being tested with the appropriate load by stroking. The product catalog offers a lineup of 15 types for each pitch (the spacing between probes). Each series has multiple tip shapes available. Our probe pins are manufactured in-house, from processing the parts to assembly. Therefore, we can produce custom specifications to meet various requirements. 【We also accept resin board processing】 In addition to providing probes, we also offer processing of the resin that secures the probes. Furthermore, we can provide the probes with sockets integrated into the board and wiring to connectors. We also accept requests for resin processing only, so please feel free to contact us. *For more details, please download the PDF or contact us.

  • Other electronic parts
  • Other FA equipment
  • Inspection fixture

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Semiconductor inspection probe tip material and tip shape... various selections available.

Semiconductor inspection probe tip material and tip shape... various selections available.

A semiconductor testing probe that can be customized with various selections for the probe tip material, surface treatment, tip shape, etc., to match the measurement target device!

Probes for semiconductor testing can be selected according to the measurement environment. - Probes made from our unique alloy material that enhance contact performance for lead-free applications. - Heat-resistant probes that utilize special springs to avoid load reduction due to thermal effects. - High-level non-magnetic material probes that can also be used for testing magnetic sensor components. - Short high-frequency probes that maximize signal transmission characteristics. We respond to various user requests. 【Features】 ■ Excellent quality backed by years of experience ■ A wide range of products ■ Various selections available for probe tip material, surface treatment, tip shape, etc., tailored to the measurement target device ■ Custom specifications are also available, allowing for arbitrary settings of total length, tip diameter, and spring pressure beyond standard specifications. *For details, please request materials or view the PDF data available for download.

  • Semiconductor inspection/test equipment

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Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]

Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]

Support for inspection of various electronic components! Precision research of TOTAL TEST SOLUTION!

This is an introduction to Seiken Co., Ltd., which handles contact probes used for electrical testing, semiconductor wafer inspection probe cards, and IC sockets. We offer a lineup of products including "contact probes" that cater to both standard and special specifications, "IC sockets" that can be configured with housing materials suited to specific applications, and "probe cards" that accommodate various inspection conditions, including narrow pitch through fine processing technology. Examples of inspection conditions: - Support for narrow pitch (MIN P=80μ) - High current testing (pre-process testing of IGBT devices) - Non-magnetic testing (probes made from non-magnetic materials) Leveraging the technology we have cultivated over many years, we continue to develop solutions that provide a more efficient inspection environment and meet more detailed requests. An overview of our products is available in the documentation. [Contents] ■ Introduction ■ Product and technology introduction (Contact Probes) - Introduction of new product technology ■ Technology introduction (IC sockets, probe cards) ■ Other various products and services (precision processing, etc.) *For more details, please refer to the PDF document or feel free to contact us.

  • Other semiconductors

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Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Make contact by bringing one side of the plunger into contact with the electrodes or relay pins of the relay board! L=20mm to 1.5mm, φ1mm to φ0.1mm.

This is an introduction to our "Contact Probe (Dual Pin)" that we handle. We offer two types: one with movable plungers on both sides and one with a movable plunger on only one side. The sizes range from long and thick ones with an overall length of 20mm and a thickness of approximately φ1.0mm, to shorter and thinner ones with an overall length of L=1.5mm and a thickness of φ0.1mm. The tip shape can be selected similarly to standard contact probes. 【Features】 ■ Two types are available: one with movable plungers on both sides and one with a movable plunger on only one side ■ The tip shape can be selected similarly to standard contact probes ■ The plunger on one side makes contact with the electrode of the relay board ■ Wiring is also possible using enamel wire attached to metal terminals ■ When in use, 2 to 3 boards are utilized *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Increase the allowable current per unit. CNT probe (high current probe)

Increase the allowable current per unit. CNT probe (high current probe)

We were able to significantly improve the performance of the probes even in high current measurements! It is also possible to increase the allowable current value, including the housing.

Recently, the conditions for inspection targets have become stricter, such as lead-free solder, contact with aluminum electrodes, and high current measurements, leading to cases where traditional processing is insufficient in performance. CNTs are strong against current and heat and have features that improve contact with aluminum. By incorporating them into the gold plating of probes, we have successfully enhanced the electrical performance of the gold plating. As a result, even when the contact probe is in contact with aluminum electrodes, it can maintain stable contact for a longer period. Additionally, in high current measurements where traditional pins would physically break due to current overload, we have significantly improved the performance of the probes. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Advanced tips. Durable rare metal bonding contact probes.

Advanced tips. Durable rare metal bonding contact probes.

We were able to incorporate rare metals into the components of a probe that requires complex processing! Please consider the contact with the hard terminals.

The needle-shaped probe itself is processed from a metal with good machinability, and we have succeeded in bonding rare metals such as iridium and rhodium to its tip. This technology has enabled us to incorporate rare metals, which could only be shaped into simple forms through polishing, into components of probes that require complex machining. The hardness of BeCu (beryllium copper), which is the material commonly used for probes, is about HV400, while iridium and rhodium have hardness exceeding HV1000. In addition to their hardness, these materials also exhibit excellent electrical properties. Therefore, they can maintain stable contact with electrodes of various materials for an extended period, allowing for an extended maintenance cycle. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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High heat-resistant probe capable of inspection up to nearly 300℃.

High heat-resistant probe capable of inspection up to nearly 300℃.

We also offer probes that use springs with a heat resistance of 300 degrees, one rank higher than SUS material!

The spring material for general contact probes is piano wire. Essentially, it is designed for use at room temperature, but piano wire can also be used in environments around 100 degrees without significant loss of load. However, when the temperature exceeds 150 degrees, the load may decrease due to heat, which can result in an inability to achieve the specified contact pressure. In such cases, using springs made of SUS material can improve the situation, but when temperatures exceed 200 degrees, even this material can experience a decrease in load. At Seiken, we also offer probes that use springs rated for 300 degrees heat resistance, which is a step up from SUS material. Not only does the measurement environment involve high temperatures, but the high heat-resistant springs also contribute to stable measurements against the heat generated by passing large currents through the probes themselves. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Differential Pressure Gauge Probe / Part Number MD34SMF-2621T

Differential Pressure Gauge Probe / Part Number MD34SMF-2621T

Easy setup and measurement with smartphone/tablet.

● Easy setup and measurement with smartphone/tablet This device displays measurement data wirelessly on a smartphone/tablet using Bluetooth. By using the smartphone/tablet app, the operation is intuitive and easy, unlike previous measuring devices. To use it, simply turn on Bluetooth on your smartphone/tablet, launch the app, and press the probe button. This allows for measurements, and you can also obtain necessary calculated values in application mode. The smartphone/tablet is compatible with both Android and iOS devices. ● Graphical display and data saving/sending By using the smartphone/tablet app, measurement values can be displayed not only as current values but also in graphical formats such as trend graphs and reports. Even in current value display, it is possible to show values from multiple probes and calculated values simultaneously. Measurements can be taken as single or continuous, and the measured data can be saved in PDF/Excel format (Android only) and sent via email. The app supports multiple languages, including Japanese, in 11 languages.

  • Pressure

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Anemometer Probe Hot Wire / Model Number MD34SMF-2516T

Anemometer Probe Hot Wire / Model Number MD34SMF-2516T

Easy setup and measurement with smartphone/tablet.

● Easy setup and measurement with smartphone/tablet This device uses Bluetooth to wirelessly display measurement data on a smartphone/tablet. By using the app on your smartphone/tablet, the operation is intuitive and easy, unlike previous measuring instruments. To use it, simply turn on Bluetooth on your smartphone/tablet, launch the app, and press the button on the probe. This allows for measurement, and you can also obtain necessary calculated values in application mode. The smartphone/tablet is compatible with both Android and iOS devices. ● Graphical display and data storage/transmission By using the app on your smartphone/tablet, you can display not only the current measurement values but also trend graphs and reports in a graphical format, as well as log displays. Even in current value display, it is possible to show values from multiple probes and calculated values simultaneously. Measurements can be taken as single or continuous measurements, and the measured data can be saved in PDF/Excel format (Android only) and sent via email. The app supports multiple languages, including Japanese, with a total of 11 languages available.

  • Wind Speed/Volume Meter

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Thermometer Probe / Part Number MD34SMF-2016T

Thermometer Probe / Part Number MD34SMF-2016T

Easy setup and measurement with smartphone/tablet.

● Easy setup and measurement with smartphone/tablet This device displays measurement data wirelessly on a smartphone/tablet using Bluetooth. By using the smartphone/tablet app, the operation is intuitive and easy, unlike previous measuring instruments. To use it, simply turn on Bluetooth on your smartphone/tablet, launch the app, and press the probe button. This allows for measurement, and you can also obtain necessary calculated values in application mode. The smartphone/tablet is compatible with both Android and iOS devices. ● Graphical display and data storage/transmission By using the smartphone/tablet app, measurement values can be displayed not only as current values but also in graphical formats such as trend graphs and reports. Even in current value display, it is possible to show values from multiple probes and calculated values simultaneously. Measurements can be taken as single or continuous measurements, and the measured data can be saved in PDF/Excel format (Android only) and sent via email. The app supports multiple languages, including Japanese, with a total of 11 languages available.

  • Thermometer

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Temperature and Humidity Sensor Probe / MD34SMF-3716T

Temperature and Humidity Sensor Probe / MD34SMF-3716T

Temperature and Humidity Sensor Probe (Wireless Connection for Smartphone) / Model Number MD34SMF-3716T

Smartphone/Tablet Exclusive Smart Probe Series Wireless measurement of temperature/humidity Automatic calculation of dew point temperature, wet bulb temperature, and absolute humidity Send measurement data via email from the dedicated app Flexible probe head for measurements inside ducts

  • Thermo-hygrometer

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High Temperature Probe 'MODEL0205 (500mm Type)'

High Temperature Probe 'MODEL0205 (500mm Type)'

The probe length is half that of conventional products! It can be used for a wide range of applications.

The "MODEL0205" is a short 500mm high-temperature probe for the mid-to-high temperature anemometer that has been highly requested. The probe length is half that of conventional products, making it suitable for a wide range of applications. It is easy to handle, significantly reducing the risk of damage. It is compatible with other probes, allowing you to choose according to your needs. 【Features】 ■ The probe length is half that of conventional products, making it suitable for a wide range of applications. ■ The probe is easy to handle, significantly reducing the risk of damage. ■ It is compatible with other probes, allowing for selection based on application. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement and measuring equipment
  • Physical property measurement and component analysis equipment

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