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probe Product List and Ranking from 156 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 31, 2025～Jan 27, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 31, 2025～Jan 27, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  3. 精研 本社 Tokyo//Electronic Components and Semiconductors
  4. 4 null/null
  5. 5 マーポス Tokyo//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Dec 31, 2025～Jan 27, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 5 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

probe Product List

661～666 item / All 666 items

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Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Optimal for the collection of "falling and adhering foreign substances" under a microscope.

■This is a tungsten probe (needle) optimized for handling micro-sized objects. ■You can choose the size according to the condition of the sample, ensuring stable operation at all times. ■Probes with a tip diameter of less than 1μm are particularly optimized for use with micromanipulators. ■It also has flexibility, allowing the tip to be bent for use. *For bending, the use of a probe bender is recommended. *For more details, please contact us via the link below.

  • Other electronic parts
  • probe

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Light Probes

Light Probes

Light Probes

This is an optical probe used for testing the lighting and blinking of LEDs, lamps, and displays, incorporated into an automatic testing machine.

  • Other optical parts
  • Sensors
  • probe

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
  • probe
  • probe

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【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

  • probe
  • probe

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AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device
  • probe

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device
  • probe

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