We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Electron microscope.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Electron microscope Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  3. ロンビック Mie//Resin/Plastic
  4. 4 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  5. 5 JAPAN TESTING LABORATORIES Gifu//Testing, Analysis and Measurement
Go to Company Ranking

Electron microscope Product ranking

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

  1. Announcement of the introduction of Talos F200E アイテス
  2. Examples of observing plastics and resin materials using TEM and SEM. ロンビック
  3. [Introduction of Testing Equipment] Multi-Angle Lens VHX-D510 関西電力送配電 技術試験センター
  4. 4 Tabletop Electron Microscope JCM7000
  5. 5 [Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins カネカテクノリサーチ 本社、東京営業所、名古屋営業所、大阪分析センター、高砂分析センター

Electron microscope Product List

136～148 item / All 148 items

Displayed results
Introduction of recommended products from Azusa Science.

Introduction of recommended products from Azusa Science.

It can be utilized in various fields such as medicine, biology, metals, semiconductors, and ceramics.

Here, we introduce three products from Japan Electron Optics Laboratory Co., Ltd., recommended by Azusa Science, which are electron microscopes. ■ JSM-IT200 InTouchScope Scanning Electron Microscope The features of this higher-end model have been simplified for easier use. With a user-friendly sample exchange guide, it allows for easy sample setup, finding the field of view, and starting SEM image observation. It integrates software for analytical tasks. ■ JCM-7000 NeoScope Desktop Scanning Electron Microscope With the concept of "Anyone can operate SEM/EDS," it meets the needs for improved work efficiency, ease of operation, and enhanced analysis and measurement performance. Placing one next to an optical microscope allows for faster and more detailed foreign object analysis and quality control. ■ JSM-IT510 InTouchScope Scanning Electron Microscope In quality assurance and manufacturing environments, it is necessary to repeatedly perform the same observation tasks, leading to demands for process efficiency. The JSM-IT510 features a newly added Simple SEM function that allows for "hands-free" repetitive tasks. It has become easier and more efficient to conduct SEM observation tasks.

  • JSM-IT200 InTouchScope? 走査電子顕微鏡.png
  • JSM-IT510 InTouchScope? 走査電子顕微鏡.png
  • Electron microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
For research in organic chemistry and materials science, as well as observations at atomic resolution!

For research in organic chemistry and materials science, as well as observations at atomic resolution!

Introduction to recommended electron microscopes, polarizing microscopes, and mass spectrometers by Azusa Science.

Here are three recommended products: ◆ JEOL Ltd. JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold field emission gun (Cold-FEG) and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations as standard, it enables atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. This makes it easier to observe materials containing light elements with clear contrast. ◆ Nikon Solutions Co., Ltd. Polarized/Dispersion Microscope ECLIPSE LV100ND POL/DS This microscope can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and elongation, aiding in the identification of asbestos. It allows for dispersion staining observation at a magnification of 400 times. ◆ JEOL Ltd. JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer This high-throughput mass spectrometer aims for high productivity with features such as multi-ionization, robustness, and easy maintenance. It is capable of analyzing a wide range of samples from low polarity to high polarity.

  • JEM-ARM200F.png
  • JMS-T100LP.png
  • ECLIPSE LV100ND POL-DS.png
  • Analytical Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Free participation! Report on the determination of absolute stereochemistry using MicroED.

We will hold a webinar titled "Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 - Determining Absolute Stereochemistry Using MicroED." This time, referred to as "Part 2," we will introduce the determination of "absolute stereochemistry" while fully considering the effects of multiple scattering of electrons. This method is an excellent technique that demonstrates remarkable power in determining absolute stereochemistry in molecules composed solely of light elements. As a case study, this webinar will report on the determination of absolute stereochemistry using MicroED for complex natural products and synthetic pharmaceutical raw materials. [Event Overview] ■ Date and Time: October 15, 2024 (Tuesday) 14:00 - 14:45 ■ Participation: Free ■ Venue: Webinar held via Microsoft Teams *For more details, please refer to the related links or feel free to contact us.

  • Structural analysis contract
  • Seminar

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Tabletop scanning electron microscope

Tabletop scanning electron microscope

Far higher resolution than optical microscopes! Suitable for surface observation and checking surface irregularities at the micro level.

The "Tabletop Scanning Electron Microscope" is a microscope that scans the surface of a sample with a finely focused electron beam in a vacuum, detecting information that comes from the sample and displaying it in an enlarged form. It has a much higher resolution than optical microscopes, making it suitable for surface observation and checking surface irregularities at the micro level. In addition to surface observation, it is also possible to confirm what elements are present on the sample surface and in what quantities through EDS elemental analysis using an X-ray detector. 【Features】 ■ Effective for samples that are difficult to process or that need to be observed as they are ■ Can accommodate samples up to a maximum size of W100mm × D100mm × H40mm on the testing stage ■ By utilizing a user-centric holder, tilting and rotation of the sample is possible ■ Suitable for surface observation and checking surface irregularities at the micro level ■ EDS elemental analysis using an X-ray detector allows for confirmation of what elements are present on the sample surface and in what quantities *For more details, please refer to the PDF document or feel free to contact us.

  • 1.PNG
  • 2.PNG
  • Electron microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Introduction of Testing Equipment] Multi-Angle Lens VHX-D510

[Introduction of Testing Equipment] Multi-Angle Lens VHX-D510

In addition to observations at the atomic level ranging from 0.1nm to 1nm, it is also possible to synthesize images from optical lenses and ultra-depth lenses, enabling the acquisition of detailed images!

We would like to introduce our testing device, the "Multi-Angle Lens VHX-D510." This device irradiates the sample surface with an electron beam and projects the reflected electron beam as an image for observation. The sample chamber is maintained in a vacuum state, and the sample is captured using a super-depth lens (electron beam irradiation). It is possible to synthesize images from both optical lenses and super-depth lenses to obtain detailed images. 【Device Specifications】 ■ Magnification: 30x to 5000x *For more details, please refer to the PDF document or feel free to contact us.

  • 4.PNG
  • Testing Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Contracted service for cross-section sample polishing | JTL

Contracted service for cross-section sample polishing | JTL

We will create cross-section samples for analysis and observation according to your request.

We will carry out the necessary sample preparation processes for observing the cross-sections of solder joints and welds, analyzing the cross-sections of foreign objects, and confirming the interiors of assembly products, including "cutting the target object → resin embedding → polishing." We accept requests for sample preparation alone, as well as comprehensive services that include observation and analysis after preparation. - Polyester resin Used for embedding large products Does not contain chlorine in the resin - Acrylic resin High transparency Resistant to scratches - Epoxy resin Has a low curing shrinkage rate and is less prone to cracking (catalog value 0.5%) Excellent heat, water, chemical, and weather resistance Superior adhesion to non-substrates Contains trace amounts of chlorine in the resin - Polisher Short production time for cross-section samples (fewer steps to mirror polishing) Mainly used for polishing resin materials and steel materials. - Precision polisher Allows for setting polishing pressure and time. Can suppress distortion even when polishing hard materials such as carbide and ceramics.

  • Other services
  • Processing Contract
  • Plastic processing machines (cutting and rolling)

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Analysis of high-performance materials with 'Materials Studio'

Analysis of high-performance materials with 'Materials Studio'

Analysis simulation of high-performance materials, as well as material development simulation software compatible with various types of materials.

"Materials Studio" A suite of molecular modeling/simulation tools for next-generation materials development equipped with quantum mechanics (density functional theory), classical mechanics (molecular dynamics calculations), mesoscale (dissipative particle dynamics calculations, etc.), statistics, and analysis/crystallization tools. 【Features】 ■ Simulation software that streamlines materials development Available for use by those engaged in research, development, design, and manufacturing across various industries and fields. ■ Compatible with various types of materials ■ All tasks, including crystal structure creation, calculation condition settings, and calculation result display, can be performed on a single GUI screen. 【Examples】 Tribochemical (lubrication) reactions Analysis of CFRP (carbon-based materials) Research and development of crystal growth, thin film formation, fuel cells, lubricants, etc. Catalysts, polymers and mixtures, metals and alloys, batteries and fuel cells, etc. *For more details, please feel free to contact us.*

  • others
  • Image analysis software

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Analysis, Measurement, and Analysis Field

Analysis, Measurement, and Analysis Field

Utilizing preprocessing and analysis techniques to solve problems! Supporting development through various material analyses and evaluations.

Our company utilizes data analysis (AI/machine learning, etc.) to support the enhancement of product value and business improvement. Experts in material development, analysis, and data analysis will quickly resolve the challenges and issues at hand. A team of specialists will collaborate on projects to meet your needs in a one-stop manner. Please feel free to contact us when you require assistance. 【Main Equipment We Own】 ■ FE-TEM (3D, precession), FE-SEM, FE-EPMA ■ FT-IR, Raman, NMR, AFM, laser microscope ■ X-ray CT, XPS, XRF, XRD ■ TG/DTA (steam gasification), DSC ■ GC (MS), LC (MS), TOFMS, HPLC, IC, ICP, GPC, DART, AAS ■ Various magnetic measurement devices such as VMS *For more details, please refer to the PDF document or feel free to contact us.

  • Company：KRI
  • Price：Other
  • Analytical Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Accelerating development through "visualization" inside the battery.

Accelerating development through "visualization" inside the battery.

Clarifying uncertain phenomena and unknown phenomena in battery development! KRI's one-stop service for secondary batteries.

At our company, battery and system engineers, materials engineers, and analytical engineers collaborate from their respective perspectives to elucidate phenomena and mechanisms. In the fusion technology of operando CT and image analysis (cell thickness and displacement analysis), we acquire three-dimensional images while intermittently and continuously charging and discharging, analyze the images, and evaluate changes. We provide a one-stop solution to clarify uncertain and unknown phenomena in battery development. 【Ultra-high resolution SEM and NMR (partial)】 ■ Potential contrast observation to distinguish materials that are difficult to differentiate through compositional analysis based on differences in conductivity. ■ Observation of sharp fiber shapes without "bulking" due to deposited films. ■ Understanding the bonding state of silane coupling agents chemically bonded to the substrate surface. ■ Observation of intermolecular interactions between phosphine oxide and the substrate. *For more details, please download the PDF or feel free to contact us.

  • Company：KRI
  • Price：Other
  • Technology Development
  • Other analysis and evaluation services

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Market Report] World Market for Scanning Electron Microscopes

[Market Report] World Market for Scanning Electron Microscopes

The global market for scanning electron microscopes is expected to drive scientific discoveries and experience significant growth.

The global market for scanning electron microscopes (SEM) is at the forefront of scientific exploration, achieving approximately $3.83 billion in revenue in 2022. Industry experts predict that this market will reach $7.84 billion in sales by 2031. This forecast implies a compound annual growth rate (CAGR) of 8.3% during the forecast period from 2023 to 2031. Scanning electron microscopes serve as a window into the microscopic world, revealing complex details of structures and materials that are not visible to the naked eye. From fundamental research to advanced industrial applications, SEMs are essential tools for scientists, engineers, and researchers to unravel minute mysteries. For application methods, please check the [PDF download] button or apply directly through the related links.

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Contracted service for ion milling processing | JTL

Contracted service for ion milling processing | JTL

We will produce cross-sectional samples without any taper using the ion milling method.

We will perform precise sample preparation necessary for high-magnification observation using the ion milling method for cross-sectional processing. In conventional mechanical polishing using polishing paper and abrasives, issues such as deformation due to stress during polishing, collapse of voids, and cracking could occur. Even for samples prone to such phenomena, by performing polishing with a very weak ion beam, we can produce cross-sectional samples suitable for high-magnification observation and analysis of micro-regions, as well as crystal orientation analysis (EBSD).

  • Other services
  • Processing Contract
  • Surface treatment contract service

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Column] The Difference Between Digital Microscopes and Electron Microscopes

[Column] The Difference Between Digital Microscopes and Electron Microscopes

What is the difference between a digital microscope and an electron microscope? It is important to choose the right equipment.

The electron microscope and digital microscope each have different areas of observation in which they excel. If you choose one without knowing their respective features and usability, you may not be able to conduct observations that align with your intentions. This column introduces the characteristics and differences between digital microscopes and electron microscopes. If you are unsure which one to implement, please use this as a reference. For more details, please see the related links. [Content Included] ■ Characteristics of digital microscopes and electron microscopes ■ Differences between digital microscopes and electron microscopes ■ Choose the one suited for each application *You can view the detailed content of the column (such as blogs) from the related links. For more information, please feel free to contact us.

  • Microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Related Categories of Electron microscope

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.