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Electron microscope Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ロンビック Mie//Resin/Plastic
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. アイテス Shiga//Electronic Components and Semiconductors
  5. 5 ジャスコインタナショナル 第二事業部 Tokyo//others
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Electron microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Examples of observing plastics and resin materials using TEM and SEM. ロンビック
  2. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  3. [Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
  4. 4 Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  5. 5 Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields! アズサイエンス 松本本社

Electron microscope Product List

76～90 item / All 147 items

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Schottky field emission scanning electron microscope 'JSM-7900F'

Schottky field emission scanning electron microscope 'JSM-7900F'

It excels in operability and consistently delivers high performance without relying on the operator's skills!

We offer the next-generation electronic optical control system "Neo Engine," which integrates lens control systems and automatic function technology, in our Schottky field emission scanning electron microscope 'JSM-7900F.' Even when changing the electronic optical conditions, there is almost no deviation in the optical axis, significantly improving operability and observation accuracy, allowing anyone to easily harness the device's inherent performance. 【Features】 ■ Enhanced automatic functions - Focus can be adjusted in a few seconds ■ Improved magnification accuracy - High-precision length measurement is also possible ■ Enhanced usability of the energy filter - Even with significant changes to the settings, there is almost no deviation in the field of view or focus *For more details, please contact us.

  • Electron microscope
  • Scanning Electron Microscope

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Tabletop Electron Microscope "JCM-7000 Neo Scope"

Tabletop Electron Microscope "JCM-7000 Neo Scope"

Seamless from optical imaging to SEM observation! Elemental analysis while observing simultaneously!

We offer the tabletop electron microscope 'JCM-7000 Neo Scope', which allows for simultaneous elemental analysis during observation. The observation range is from 10x to 100,000x, and all SEM functions can be easily operated. It automatically magnifies from low-magnification optical images to SEM images, allowing for the observation of non-conductive samples as they are. 【Features】 ■ Observation range from 10x to 100,000x ■ All SEM functions are easy to operate ■ Automatic magnification from low-magnification optical images to SEM images - Zeromag - (new feature) ■ Simultaneous elemental analysis during observation - Live Analysis - (new feature) *Optional ■ Standard micro dimension measurement function, among others *For more details, please feel free to contact us.

  • Electron microscope

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Information on morphological observation and component analysis using an electron microscope.

Information on morphological observation and component analysis using an electron microscope.

It is capable of various analyses such as point analysis, line analysis, and mapping in the sample area, as well as multifunctional component analysis.

The Tokai Technical Center, a general incorporated foundation, offers "morphological observation and component analysis using an electron microscope." Observations can be made without the time-consuming and labor-intensive pre-treatment, resulting in reduced time until observation and easier evaluation of component analysis after observation. Additionally, simultaneous composition observation allows for understanding the distribution of different compositions while performing morphological observation. Distance measurement between two points of interest within the sample is also possible. 【Features】 - Observations can be made without the time-consuming and labor-intensive pre-treatment. - Simultaneous composition observation allows for understanding the distribution of different compositions. - Distance measurement between two points of interest within the sample is possible. - Point analysis, line analysis, and mapping within the sample area are also possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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[Analysis/Test] Introducing a case of 50% reduction in outsourcing costs from existing manufacturers!

[Analysis/Test] Introducing a case of 50% reduction in outsourcing costs from existing manufacturers!

Specialized in contract analysis/testing! Introducing examples of electron microscope observation/component analysis and solution analysis (ICP-MC)! Leave the comparison and consideration of contract analysis/testing to us!

We would like to introduce a case where we proposed an evaluation and analysis manufacturer for outsourcing contracts. In the field of battery-related electron microscope observation/component analysis, our proposal resulted in a 40% reduction in outsourcing costs compared to existing manufacturers. Additionally, in the area of material-related solution analysis (ICP-MC), our proposal led to a 50% reduction in outsourcing costs compared to existing manufacturers. [Case Summary] ■ Battery-related electron microscope observation/component analysis: 40% reduction in outsourcing costs ■ Material-related solution analysis (ICP-MC): 50% reduction in outsourcing costs We are also capable of handling a wide range of analyses/tests beyond the above. For more details, please refer to the PDF document or feel free to contact us.

  • Public Testing/Laboratory

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Tabletop Scanning Electron Microscope 'Phenom ProX'

Tabletop Scanning Electron Microscope 'Phenom ProX'

Overwhelming beauty on a large screen! The sample holder can be easily set into the device with a sliding mechanism.

We would like to introduce the tabletop scanning electron microscope 'Phenom ProX' that we handle. Equipped with a high-brightness, long-life CeB6 electron gun. It displays SEM images just 30 seconds after sample introduction, allowing for barrier-free analysis right away. Additionally, it is resistant to vibrations and offers a resolution of 6nm anywhere. Please feel free to contact us if you have any inquiries. 【Features】 ■ Equipped with a high-brightness, long-life CeB6 electron gun ■ Stunning beauty displayed on a large screen ■ Vibration-resistant with a resolution of 6nm anywhere ■ Innovative user interface ■ SEM image displayed in 30 seconds, analysis completed in 3 minutes *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes

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[Data] Case Study of Material System Analysis

[Data] Case Study of Material System Analysis

It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!

This document is a collection of case studies summarizing material analysis conducted by Hanai Corporation's Electron Microscope Technology Research Institute. The "Ultra Microtome" is suitable for producing high-quality ultra-thin sections and cross-sections across a wide range of fields, including biological tissues, metal plating layers, inorganic deposition layers, and nanoparticles. Our company has started offering contract analysis services. We will conduct material analysis in collaboration with partner organizations. [Published Cases] - Structural analysis of liposomes - Structural analysis of HIPS - Structural analysis of lens cross-sections - Cross-sectional observation of candy bags - Morphological observation of metal particles using the dispersion method (metal microparticles/metal-supported carbon) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope
  • Other microscopes

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[Case Analysis] Hepatocytes (Pig Liver)

[Case Analysis] Hepatocytes (Pig Liver)

Insert photo ×7,000 Analysis of the cell membrane (×100,000)! It can be seen that the cell membrane has a double structure approximately 7nm wide.

We would like to introduce a case study of the analysis of 'hepatocytes (pig liver)' conducted by our company. The liver has many functions, including lipid and protein synthesis, metabolism and removal of drugs, and energy storage, most of which are composed of hepatocytes. There are also other components such as bile canaliculi (BC) and blood vessels (HS), within which blood cells (EC, Kf) can be observed. The inserted photo shows an enlargement of the cell membranes of adjacent cells, revealing that each cell membrane has a double structure approximately 7nm wide. Additionally, hepatocytes possess typical organelles that are often referenced when explaining the structure and function of general cells. [Analysis Overview] ■ Analysis Subject: Hepatocytes (pig liver) ■ It is evident that each cell membrane has a double structure approximately 7nm wide. ■ Hepatocytes have typical organelles that are frequently cited when explaining the structure and function of general cells. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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Contract observation using an electron microscope.

Contract observation using an electron microscope.

We offer surface observation using a scanning electron microscope (FE-SEM): Resolution (sensitivity, etc.): up to 200,000 times.

■Once you send us the sample, we will create a sample stage, take images, and convert them into image files (jpeg) before sending them back to you. ■We have set a low price, so please take advantage of it.

  • Contract measurement

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CD-SEM

CD-SEM

CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.

【Equipment Modification】 ■ Sale of refurbished used equipment ■ Modification for small diameter and compound wafers ■ SMIF to open cassette modification ■ Modification for multiple wafer types (using tray) 【Regular Maintenance】 ■ Chip replacement 【Relocation Services】 ■ In-house relocation ■ Factory relocation 【Troubleshooting】

  • Semiconductor inspection/test equipment

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Low Voltage Electron Microscope 'LVEM25'

Low Voltage Electron Microscope 'LVEM25'

Nanoparticle observation is used worldwide as a screening TEM.

The "LVEM25" is a low-voltage electron microscope that provides high-contrast images from samples prepared using conventional methods. Three powerful imaging modes are available in a compact single device. Switching between modes can be easily operated via software, allowing for rapid imaging of the same area of interest in TEM, STEM, and ED modes. 【Main Technical Features】 ■ Compact design ■ No special facilities required: can be installed in various locations ■ Permanent magnet lens: no cooling needed ■ Electrostatic field emission gun: high contrast ■ Control unit and software: complete imaging control, etc. *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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Tabletop Low Voltage Electron Microscope 'LVEM 5'

Tabletop Low Voltage Electron Microscope 'LVEM 5'

Nano-scale on the tabletop! Equipped with four imaging modes on a single benchtop.

The "LVEM 5" is a tabletop low-voltage electron microscope that seamlessly combines four different imaging functions into a single benchtop device, eliminating the need to move samples between microscopes. Furthermore, with just a click of a button, you can image the same area of interest in TEM, SEM, and STEM modes. 【Features】 ■ High-contrast nanoscale imaging ■ Unique benchtop design ■ Simple workflow *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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Transmission electron microscope

Transmission electron microscope

The fine structure of the sample can be observed at the nanoscale using a transmission electron microscope (TEM)!

Our company is capable of producing high-precision thin film samples for TEM observation and achieving clear sub-nanometer order structural observations through advanced TEM observation techniques.

  • Contract Analysis

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Basic Analysis Methods for Things that are Similar Yet Different

Basic Analysis Methods for Things that are Similar Yet Different

Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscope observation to SEM observation and EDX elemental analysis. Observation using an optical microscope is one of the fundamental observation techniques, allowing for quick examination of general shapes and other features. Its advantage lies in the ability to obtain color information, making it effective for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "observation using SEM" and "elemental analysis using EDX" with the help of photos and graphs. We encourage you to read it. [Contents] ■ Observation using an optical microscope ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services

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