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Electron microscope Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ロンビック Mie//Resin/Plastic
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. アイテス Shiga//Electronic Components and Semiconductors
  5. 5 ジャスコインタナショナル 第二事業部 Tokyo//others
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Electron microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Examples of observing plastics and resin materials using TEM and SEM. ロンビック
  2. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  3. [Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
  4. 4 Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  5. 5 Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields! アズサイエンス 松本本社

Electron microscope Product List

46～60 item / All 146 items

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Identification of resistance anomalies due to absorption current

Identification of resistance anomalies due to absorption current

You can identify high resistance and open areas in the wiring from the absorption current image.

- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation

  • Contract Analysis
  • Contract measurement

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[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

High-resolution HAADF-STEM images reflect the atomic arrangement of crystals, and by simulating STEM images corresponding to various crystal orientations, they help in accurately understanding the relative orientations between crystal grains and the observed images in polycrystalline materials. This document presents a case where STEM images were simulated from the crystal orientation information obtained by the EBSD method for the crystal grains in a polycrystalline neodymium magnet, and compares them with actual high-resolution HAADF-STEM images.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] TEM Analysis under Atmosphere Control and Cooling (B0156)

[Analysis Case] TEM Analysis under Atmosphere Control and Cooling (B0156)

Observation with a high-resolution SEM equipped with FIB without atmospheric exposure (controlled atmosphere)!

Our organization has established a system that suppresses atmospheric exposure through atmosphere control, and further cools the samples for processing, observation, and analysis. We can produce TEM thin samples while maintaining the original structure of the specimen, allowing for observation and analysis. Even with unstable materials, we can perform thinning processing while cooling, and by maintaining a vacuum during the transfer between processing and observation devices, we enable cross-sectional TEM/SEM observation that minimizes atmospheric exposure and thermal alteration. 【Measurement and Processing Methods】 ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ Processing under atmosphere control ■ Cryo-processing *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] (S)TEM Observation by Negative Staining

[Analysis Case] (S)TEM Observation by Negative Staining

Examples of morphological observation of liposomes, CNF, microparticles, proteins, etc.!

Our organization offers (S)TEM observation using negative staining. Organic functional materials, such as fine particles and fibrous substances, are primarily composed of light elements like C (carbon), H (hydrogen), O (oxygen), and N (nitrogen), which do not provide sufficient contrast for morphological observation in (S)TEM. Therefore, by applying staining to these materials, we can enhance the contrast and enable observation. In this instance, we will introduce a case where negative staining was performed using phosphotungstic acid (H3[P(W3O10)4]·nH2O, abbreviated as PTA). 【Measurement Method / Processing Method】 ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

We will introduce many examples of cross-sectional observation and structural analysis using TEM, FE-SEM, EBSD, etc., for metal microstructure observation and phase analysis!

This case study collection introduces examples related to "cross-sectional observation and structural analysis." It includes numerous analytical cases covering the objectives, methods, and results of "metallic structure observation of wire (spring material)," "phase analysis of duplex stainless steel," and "evaluation of semiconductor insulating films using STEM-EDS." Additionally, it presents observations, phase analyses, insulating film analyses, and measurements, among other topics. We encourage you to read it. [Contents] ■ Metallic structure observation of wire (spring material) ■ Phase analysis of duplex stainless steel ■ Evaluation of semiconductor insulating films using STEM-EDS ■ EBSD measurement of samarium cobalt magnets ■ Analysis of connector terminal contact defects using STEM ■ Cross-sectional observation of biological samples (Morpho butterfly scales) *For more details, please refer to the PDF document or feel free to contact us.

  • Other analyses
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FE-SEM (with EDS/EBSD observation)

FE-SEM (with EDS/EBSD observation)

A finely focused electron beam is irradiated onto the sample! An electron microscope that can also analyze crystal orientation and crystal structure!

The "FE-SEM (Field Emission Scanning Electron Microscope)" is a device that irradiates and scans a finely focused electron beam onto a sample, allowing for clearer magnified images compared to general-purpose SEMs. Additionally, by utilizing a finely focused strong electron beam and employing the Electron Back-Scatter Diffraction (EBSD) method, it is possible to analyze crystal orientation and crystal structure. 【Applicable Targets】 ■ General metal materials ■ Ceramics ■ Fibers (requires deposition treatment) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Electron microscope

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Examples of observing plastics and resin materials using TEM and SEM.

Examples of observing plastics and resin materials using TEM and SEM.

Introducing observations of CNF in PE and the higher-order structure of cell walls in PE foams, along with photos!

On our company website, we introduce examples of resin material observation using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). In the TEM observation examples, we include observations of CNF in PE, the higher-order structure of cell walls in PE foams, and the lamellar structure near the surface of HDPE. Additionally, in the SEM observation examples, we present comparisons before and after weather resistance tests of ABS resin, as well as cross-sectional structural analysis of automotive bumper materials. Please take a look. [Content Included (Partial)] ■ TEM Observation Examples - Observation of CNF in PE - Higher-order structure of cell walls in PE foams - Observation of lamellar structure near the surface of HDPE - Morphology observation examples of HIPS/ABS systems - Morphology observation in PC/ABS system materials *For more details, please refer to the related links or feel free to contact us.

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Observation of PE/CNF (Cellulose Nanofiber) using TEM

Observation of PE/CNF (Cellulose Nanofiber) using TEM

We are introducing examples of observing the dispersion state of CNF (cellulose nanofiber) in PE.

On our company website, we introduce "Observation of CNF composite materials using Transmission Electron Microscopy (TEM)." By utilizing the techniques developed through the observation of polymer crystal structures and the morphology of polymer alloys, including the production of ultra-thin sections with staining, we have made it possible to observe CNF (cellulose nanofiber) incorporated into resins. We also include photographs of the dispersion state of CNF in PE and enlarged images. Please take a look. [Published Photos] ■Observation of CNF dispersion state in PE - PE/CNF dispersion state observation - PE/CNF enlarged photos *For more details, please refer to the related links or feel free to contact us.

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Morphological observation of foamed resin materials using TEM.

Morphological observation of foamed resin materials using TEM.

You can observe the crystal structure within the cell walls of the foam!

We conduct "observation of foams using Transmission Electron Microscopy (TEM)" as a form of morphological observation. By applying and enhancing the technology for producing ultra-thin sections, which we have developed through the observation of crystalline structures in polymers and the morphology of polymer alloys, it is possible to observe the crystalline structure within the cell walls of foams. Additionally, we have observation results for resins and composite materials other than PE, and by combining staining techniques, we can observe the dispersion state of the cell walls in polymer alloys. 【Features】 ■ Observation results available for resins and composite materials other than PE ■ The dispersion state of the cell walls in polymer alloys can be observed by combining staining techniques ■ Observation possible for soft material foams *For more details, please refer to the related links or feel free to contact us.

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Observation of the fine structure of styrene-based elastomers using transmission electron microscopy.

Observation of the fine structure of styrene-based elastomers using transmission electron microscopy.

If you are interested in TEM observation of the fine structure of block copolymers or graft copolymers, please feel free to consult with us.

Our company conducts fine structure observation of styrene-based elastomers using Transmission Electron Microscopy (TEM). We observe the fine structure (microphase separation structure) in styrene-based thermoplastic elastomers such as Styrene-Ethylene/Butylene-Styrene block copolymers (SEBS) using TEM. Additionally, the dispersion state of styrene-based elastomers within composite materials can also be observed using our electron staining technology in TEM. 【Features】 ■ The dispersion state of styrene-based elastomers within composite materials can be observed using electron staining technology in TEM. *For more details, please download the PDF or feel free to contact us.

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Observation of fine dispersed rubber in styrene-based resin using transmission electron microscopy.

Observation of fine dispersed rubber in styrene-based resin using transmission electron microscopy.

Observation of the salami structure of micro-dispersed rubber domains (butadiene rubber)! The differences in structure are clearly distinguishable.

Our company conducts observations of micro-dispersed rubber in styrene-based resins (HIPS, ABS) using transmission electron microscopy (TEM). We observe the salami structure of micro-dispersed rubber domains (butadiene rubber) in high-impact polystyrene (HIPS) and acrylonitrile-butadiene-styrene (ABS) resins. The differences in the salami structures of both are clearly distinguishable. Please feel free to contact us if you have any inquiries. [Overview] ■ Observation of the salami structure of micro-dispersed rubber domains (butadiene rubber) ■ Clear distinction of the differences in salami structures *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

Quantitative evaluation of fillers blended into resin is possible! Here is an example of understanding the dispersion state per volume of filler.

In the fields of automobiles and aircraft, lightweight organic/inorganic composite materials with strength and rigidity are widely used. The size and dispersion state of inorganic fillers contained in organic/inorganic composite materials significantly affect mechanical properties, making it necessary to understand the distribution and orientation of inorganic fillers. This document presents a case study where fillers within a resin were evaluated in three dimensions using FIB-SEM. [Case Summary] ■ Analysis Sample - Automotive resin containing inorganic fillers ■ Analysis Results - It was found that the resin contains approximately 10Vol% of fillers. *For more details, please refer to the PDF document or feel free to contact us.

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Introduction to the Equipment of the Technology Development Office

Introduction to the Equipment of the Technology Development Office

We own microscopes and electron microscopes! We provide consistently stable quality plating using various analytical devices.

In our Technology Development Department, we analyze and manage the plating solutions from three factories using various analytical devices. By understanding the consumption of chemicals due to plating operations and controlling the supply amounts, we strive to consistently provide stable quality plating. Additionally, in 2015, we introduced a scanning electron microscope to conduct surface analysis and evaluation of plating films. By observing at the micron level, we clarify issues that are not noticeable to the naked eye, and we research plating conditions that match the surface state to our customers' needs. 【Equipment Owned (Partial)】 ■ Microscope ■ Electron Microscope, manufactured by JEOL: "SM-6010PLUS/LA" ■ Polishing Machine, manufactured by Sankeikaku: Automatic Polishing Machine "HA-FSA-83" ■ Cutting Machine, manufactured by Sankeikaku: Cutting Machine Alt Cut "CK260-90" ■ Manufactured by Shimadzu: Spectrophotometer "UVmini-1240" ■ Manufactured by Matsuzawa: Digital Microhardness Tester "SMT-3" *For more details, please refer to the PDF document or feel free to contact us.

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  • Plating Equipment
  • Contract manufacturing

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[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

Black foreign substances scattered from the unit cooler! Introduction of a case where the trouble was successfully resolved.

We received a request to investigate the "black foreign substances" being dispersed from the unit cooler in the factory. 【Case】 ■Issue - We would like you to investigate the "black foreign substances" being dispersed from the unit cooler. ■Solution - Elemental analysis using "Scanning Electron Microscopy - Energy Dispersive X-ray (SEM-EDX)" - Analysis of organic materials using "Fourier Transform Infrared Spectroscopy" and comparison of the surface and cross-section of the foreign substances.

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Technical Data: Electrode Deposits (Contacts)

Technical Data: Electrode Deposits (Contacts)

Introducing a case study that investigated contact surfaces with poor conductivity through electron microscope observation!

Our company is engaged in the analysis solution business. This document presents cases where non-contact, non-destructive observation of contact surfaces that experienced poor conductivity was conducted using an electron microscope at magnifications of 40 to 250 times, allowing for the observation of contaminants on the contact surfaces. By identifying the contaminants through qualitative elemental analysis using fluorescent X-ray analysis and qualitative compound analysis using micro-infrared spectroscopy, we can clarify the adhesion mechanism of the identified contaminants to the contacts, enabling an investigation into the causes of poor conductivity. [Contents] ■ Overview ■ Features ■ Analysis Cases - Electron Microscope Observation - Fluorescent X-ray Analysis, Micro-infrared Spectroscopy *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other services

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