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Electron microscope Product List and Ranking from 37 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ロンビック Mie//Resin/Plastic
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. アイテス Shiga//Electronic Components and Semiconductors
  5. 5 ジャスコインタナショナル 第二事業部 Tokyo//others
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Electron microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Examples of observing plastics and resin materials using TEM and SEM. ロンビック
  2. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  3. [Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
  4. 4 Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  5. 5 Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields! アズサイエンス 松本本社

Electron microscope Product List

61～75 item / All 146 items

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Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Introduction to observation and evaluation analysis of low vacuum SEM that does not require coating processes such as vacuum deposition!

Our company is engaged in the analysis solutions business. In low vacuum SEM, coating treatments (pre-treatments) such as vacuum deposition are not required for sample preparation. Even for samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be used directly for other analyses. [Contents] ■ Overview ■ Analysis Examples ・ Observation and evaluation of adhesive interfaces *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
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[Example] Cross-sectional observation of a car door handle cover.

[Example] Cross-sectional observation of a car door handle cover.

Conducting magnified observation and elemental mapping using a scanning electron microscope (SEM)! Introducing examples of cross-sectional observation.

We present a case study where we created a cross-section to investigate the plating layer of a car door handle cover, followed by magnified observation and elemental mapping using a scanning electron microscope (SEM). For the plated section, we created a cross-section using ion milling and measured the thickness. The total plating thickness was found to be approximately 11-12 μm, with the thin outermost plating (chrome) measuring about 85 nm, and the second layer of plating underneath measuring about 850 nm. Additionally, the elemental mapping results confirmed that the substrate was a thick copper plating, with nickel plating applied on top of it, followed by chrome plating. [Case Overview] - Investigation Sample: Car Door Handle Cover - Cross-Section Observation: Measurement of Plating Thickness - Elemental Mapping: Investigation of Element Distribution *For more details, please refer to the PDF document or feel free to contact us.*

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[Case] Investigation of the Cause of Discoloration of the Metal Part of the Clipboard

[Case] Investigation of the Cause of Discoloration of the Metal Part of the Clipboard

Observation and analysis of discoloration due to metal corrosion! Introducing case studies on the investigation of discoloration causes.

We would like to introduce a case where discoloration due to common metal corrosion was observed and analyzed at our company. Upon observation with a scanning electron microscope (SEM), traces of corrosion were confirmed. This discoloration is presumed to have occurred due to the corrosion of iron material beneath the nickel plating, resulting in the precipitation of rust, which is the product of that corrosion, on the surface. 【Case Overview】 ■Observation of Discolored Area: Magnified view of the discolored area ■Magnified Observation and Elemental Analysis: Further magnified observation and elemental analysis of the discolored area ■Structural Analysis: Structural analysis using Raman spectroscopy ■Cause of Discoloration: The discoloration is primarily due to the corrosion of iron, known as "red rust." *For more details, please refer to the PDF document or feel free to contact us.

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[Example] Measurement of the thickness of chromate treatment film

[Example] Measurement of the thickness of chromate treatment film

A chromate layer confirmed on approximately 1μm thick zinc plating! Introducing examples of film thickness measurement.

We would like to introduce a case where we measured the thickness of a chromate treatment film at our company. For colored chromate metal parts, we performed cross-section processing using ion milling, and observed the cross-section using a field emission scanning electron microscope (FE-SEM) to measure the film thickness. When observing the cross-section of the film with FE-SEM, a chromate layer was confirmed on top of a zinc plating of just over 1μm. Further magnification revealed that the thickness of the chromate layer was approximately 420nm. 【Case Overview】 ■Sample investigated: Chromate ■Cross-sectional film thickness measurement: Measurement of chromate film thickness *For more details, please refer to the PDF document or feel free to contact us.

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Learning from Japan Electron Optics Laboratory, a long-established manufacturer of electron microscopes, about after-sales service reform.

Learning from Japan Electron Optics Laboratory, a long-established manufacturer of electron microscopes, about after-sales service reform.

Centralized management of basic information and related information for 40,000 parts using PIM/DAM, and renewal of the after-sales service system that serves as the front for customer service.

Revamping the after-sales service system, which serves as the front for customer service. We will introduce the case of Japan Electronics, which built a new system utilizing Contentserv's PIM (Product Information Management) / DAM (Digital Asset Management) and integrated it with existing ERP and e-commerce sites, thereby solving traditional challenges all at once. [Contents] - Revamping the after-sales service system, which serves as the front for customer service - Seeking PIM/DAM tools that are more user-friendly and accessible - Solving technical challenges together with EXA, who joined the project from the construction phase - Contributing to groundbreaking operational efficiency and improved customer satisfaction *For more details on the research report, please refer to "PDF Download."

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JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

We have adopted our new concept colors, Pure White and JEOL Silver, resulting in a more refined form design.

NEOARM, developed by Japan Electron Optics Corporation, is equipped with a cold field emission electron gun (Cold-FEG) developed with our unique technology and a new spherical aberration corrector (ASCOR) capable of correcting up to higher-order aberrations, enabling atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. Additionally, we have developed our proprietary aberration correction algorithm and incorporated a system that automatically performs fast and accurate aberration correction. This provides high-throughput atomic resolution observation. 〇 Features - Spherical aberration corrector ASCOR (Advanced STEM corrector) - Automatic aberration correction software JEOL COSMO (Corrector System Module) - New ABF (Annular Bright Field) detector system - Perfect sight detector *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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JEM-F200 Multifunctional Electron Microscope

JEM-F200 Multifunctional Electron Microscope

A field emission transmission electron microscope developed with the concept of energy conservation and CO2 reduction.

Japan Electron Optics Corporation's JEM-F200 is a field emission transmission electron microscope developed with the concept of energy saving and CO2 reduction. It features a new operating system that enhances spatial resolution and analytical performance while considering usability for various applications. With a smart appearance that appeals to both beginners and experienced users, it includes: - Smart design - Quad-Lens condenser system - Advanced Scan system - Pico stage drive - Automatic holder insertion and extraction device - ECO mode as standard *For more details, please download the PDF or feel free to contact us.*

  • Electron microscope

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CRYO ARM 200 Field Emission Cryo-Electron Microscope

CRYO ARM 200 Field Emission Cryo-Electron Microscope

Achieving further enhancement of contrast in biological samples.

The CRYO ARM 200, manufactured by Japan Electron Optics Laboratory Co., Ltd., is a cryo-electron microscope equipped with a cold cathode field emission electron gun, an in-column energy filter (omega filter), a side-entry liquid nitrogen cooling stage, and an automatic sample exchange mechanism capable of storing up to 12 samples. By combining a newly designed omega filter with a hole-free phase plate, it has achieved further enhancement of contrast for biological samples. 〇 Features - Automatic sample exchange mechanism - Cold cathode field emission electron gun - In-column energy filter (omega filter) - Automatic image acquisition software for single particle analysis - Hole-free phase plate - Automatic adjustment function *For more details, please download the PDF or feel free to contact us.

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JSM-IT800 Field Emission Scanning Electron Microscope

JSM-IT800 Field Emission Scanning Electron Microscope

It is expected that information that has not been obtained until now can be acquired, and improvements can be made to the measurements that are causing difficulties.

Japan Electron Co., Ltd. JSM-IT800 Field Emission Scanning Electron Microscope features a "In-Lens Schottky Plus Field Emission Electron Gun" for achieving high-resolution observation, a next-generation electron optical control system "Neo Engine," and a GUI "SEM Center" developed for high-speed elemental mapping, all integrated with our proprietary EDS on a common platform. By replacing the objective lens of the SEM with a modular design, we provide equipment tailored to various needs. 〇 Features - In-Lens Schottky Plus Field Emission Electron Gun (FEG) - Equipped with a next-generation electron optical control system that incorporates the essence of JEOL's electron optical technology - SEM Center and EDS integration - SMILE VIEW Lab - Smile Navigation *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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JSM-IT510 InTouchScope Scanning Electron Microscope

JSM-IT510 InTouchScope Scanning Electron Microscope

The observation work of SEM has become more efficient and easier to perform.

Japan Electron Optics Corporation JSM-IT510 InTouchScope Scanning Electron Microscope The Scanning Electron Microscope (SEM) has become an essential tool not only for research but also for quality assurance and manufacturing environments. In such settings, it is necessary to repeatedly perform the same observation tasks, leading to a demand for process efficiency. The JSM-IT510, with its newly added Simple SEM function, allows for more efficient and easier SEM observation tasks. 〇Features - Simple SEM: Just select the field of view you want to capture - Safe and easy! Sample exchange guidance - Zeromag: Magnifying the optical image reveals the SEM image - Live Analysis / Live Map: Continuous elemental analysis during observation - Comprehensive features *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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JIB-PS500i FIB-SEM system

JIB-PS500i FIB-SEM system

Cutting-edge technologies for sample preparation, observation, and analysis.

Japan Electron Co., Ltd. JIB-PS500i offers three solutions to assist in TEM sample preparation. You can work with a reliable and high-throughput workflow from sample preparation to TEM observation. 〇 Features - The dual-axis tilt cartridge and TEM holder facilitate the link between TEM and FIB. - The cartridge can be easily attached to a dedicated TEM sample holder with one touch. - Accurate and rapid pickup operations are possible. - Seamlessly transition from TEM sample preparation to STEM observation. - The automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. *For more details, please download the PDF or feel free to contact us.

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In various fields such as the semiconductor industry, polymer material development and research, and quality control!

In various fields such as the semiconductor industry, polymer material development and research, and quality control!

Introduction of recommended electron microscopes, photoelectron spectrometers, and internal oblique compound microscopes by Azusa Science.

We would like to introduce three recommended products from Azusa Science. ◆ JEOL Ltd. JEM-1400Flash Electron Microscope This transmission electron microscope features a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function between optical microscope images and electron microscope images. It is utilized across a wide range of fields, including biology, nanotechnology, polymers, and advanced materials. ◆ JEOL Ltd. JPS-9030 X-ray Photoelectron Spectroscopy (XPS) System Equipped with a Kaufman-type etching ion source and twin anodes as standard, this versatile XPS system also offers extensive expandability with high-temperature heating systems and gas cluster ion sources. It is widely used from universities to factories as a highly versatile analytical method in material research and development, as well as in quality control. ◆ Nikon Solutions Co., Ltd. Internal Oblique Stereo Microscope SMZ445/460 This stereo zoom microscope series from Nikon boasts excellent optical performance similar to that of their cutting-edge models. It is suitable for inspecting and observing resin molded products and metal processed parts. It meets the needs for component inspection and quality control.

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JSM-IT210 Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

It is a new generation SEM that is compact and capable of unmanned operation.

The JSM-IT210 scanning electron microscope from JEOL Ltd. is the most compact scanning electron microscope among JEOL's benchtop models. The newly developed stage features all five axes driven by motors, allowing for safer and faster operation. ○ Features - "Sample Exchange Navigation" for easy observation after inserting the sample - "Zeromag" for magnifying optical images into SEM images - "Live Analysis" for continuous elemental analysis during observation - "Simple SEM" for a variety of automatic measurements - Functions that strongly support automatic measurements - Faster analysis - Standard equipped with a 60 mm² large-diameter EDS *For more details, please refer to the PDF or feel free to contact us.

  • Electron microscope

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JSM-IT710HR Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

Because I can see it, I want to pursue it.

JEOL Ltd. JSM-IT710HR Scanning Electron Microscope In addition to its resolution and analytical performance at the nanometer scale, throughput during data acquisition is also important. The newly developed JSM-IT710HR is a fourth-generation model in JEOL's HR series, themed "Anyone can easily capture high-resolution images with SEM." It features enhanced operability with expanded automatic functions and improved observation performance with a new detector system. ○ Features - SEM images are visible in conjunction with optical images - High-resolution electron gun for better visibility - Automatic measurement function: Simple SEM/EDS - Real-time 3D image construction: Live 3D - New low vacuum secondary electron detector LHSED - Stability of the Schottky FE electron gun enhanced to over four times compared to previous models *For more details, please refer to the PDF or feel free to contact us.

  • Electron microscope

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Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields!

Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields!

Analysis of chemical bonding states, research in fields from biology to nanotechnology, polymers, cutting-edge materials, and the electrical, electronic, automotive, mechanical, chemical, and pharmaceutical industries.

We would like to introduce three products from Japan Electronic Corporation that can be utilized in various fields. If you are interested, please feel free to contact us. 〇 JPS-9030 Photoelectron Spectrometer (XPS) This is a general-purpose XPS that realizes "anyone can use it easily and immediately." It comes standard with a Kaufman-type etching ion source and twin anodes, and despite being a general-purpose XPS, it also has a wide range of expandability, including a high-temperature heating system and gas cluster ion source. 〇 JEM-1400Flash Electron Microscope This transmission electron microscope is equipped with a high-sensitivity sCMOS camera and incorporates powerful new features such as an ultra-wide field montage system and optical microscope image linking functionality. 〇 JCM-7000 NeoScope Desktop Scanning Electron Microscope This desktop scanning electron microscope aims to allow anyone to observe and analyze. It features a low vacuum mode that requires no pre-treatment and a stage navigation system for easy field searching. It includes functions such as Zeromag, which allows direct transition from optical images to SEM images, Live Analysis for elemental analysis while observing, and Live 3D for three-dimensional observation during SEM observation.

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