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Electron microscope Product List and Ranking from 35 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 ロンビック Mie//Resin/Plastic
  5. 5 大同分析リサーチ Aichi//Service Industry
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Electron microscope Product ranking

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields! アズサイエンス 松本本社
  2. Announcement of the introduction of Talos F200E アイテス
  3. JSM-IT800 Field Emission Scanning Electron Microscope アズサイエンス 松本本社
  4. 4 Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  5. 5 [Slice&View] Three-Dimensional SEM Observation Method 一般財団法人材料科学技術振興財団　MST

Electron microscope Product List

121～150 item / All 164 items

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[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB

[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB

Observation of cross-sections with an accuracy of several tens of nanometers and a size of several hundred micrometers is possible!

We offer wide-area cross-sectional SEM observation (C0610) using Xe-PFIB. The metal bonding that electrically connects the electrodes of integrated circuits, electrodes, printed circuit boards, and semiconductor packages has a diameter of several tens of μm to several hundred μm. With Xe-PFIB (Xe-Plasma Focused Ion Beam), we can target processing positions on the order of several tens of nm and create cross-sections of several hundred μm square, allowing for a detailed understanding of the entire view at the center of the bonding. 【Measurement and Processing Methods】 ■ [SEM] Scanning Electron Microscopy ■ X-ray CT Method ■ [FIB] Focused Ion Beam Processing *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis
  • Electron microscope

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[Analysis Case] Local Area Evaluation of Positive Electrode Active Material in Secondary Batteries (C0614)

[Analysis Case] Local Area Evaluation of Positive Electrode Active Material in Secondary Batteries (C0614)

Composition, crystal structure, and chemical state evaluation near the surface of living materials are possible!

Our company conducts local area evaluation of positive electrode active materials for secondary batteries (C0614). It is known that in lithium-ion secondary batteries, the crystal structure of the active material surface and the valence of metal elements change due to ion extraction and insertion during charge and discharge, as well as degradation. In a case where TEM was used for local area evaluation to assess composition, crystal structure, and chemical state, it was found through EDX that AlOx is coated on the outermost layer. Additionally, electron diffraction and EELS revealed that the crystal structure and valence differ between the surface and the interior of the active material. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ [TEM-EELS] Electron Energy Loss Spectroscopy *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

We will introduce examples of observing polymer materials using SEM-STEM and (S)TEM!

Our organization offers (S)TEM observation of polymer materials using electron staining. Since polymer materials are composed of light elements, it is difficult to obtain clear contrast in (S)TEM observations. Staining can enhance the contrast for such materials. This document introduces examples of staining and observation using a method called electron staining with ruthenium tetroxide (RuO4), osmium tetroxide (OsO4), and phosphotungstic acid (H3[P(W3O10)4]·xH2O, abbreviated as PTA). [Measurement and Processing Methods] ■ [(S)TEM] (Scanning) Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis
  • Electron microscope

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[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

We will introduce examples of observations of hair cell membrane complexes (CMC)!

Our organization offers (S)TEM analysis of the fine structure of hair cross-sections. The hair cell membrane complex (CMC) serves as a pathway for chemicals during processes such as bleaching and dyeing hair. In particular, the CMC between the cuticle layers has a three-layer structure, which we have visualized. We present a case where osmium tetroxide (OsO4) was used for electron staining targeting unsaturated fatty acids in lipids, followed by TEM observation and STEM-EDX analysis. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ Ultramicrotome processing ■ Others *For more details, please download the PDF or feel free to contact us.

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  • Electron microscope

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[Analysis Case] Evaluation of Solution Components Before and After Adsorption and Zeolite Structure

[Analysis Case] Evaluation of Solution Components Before and After Adsorption and Zeolite Structure

We capture the ion exchange process from the ion content in the solution and the structural changes of the adsorbent.

Zeolites are porous crystalline aluminosilicates with fine pores of a few nanometers, widely used as adsorbents for molecular adsorption in fine pores and cation exchange within the crystal for water treatment. Due to the freedom of design, they can be tailored to specific purposes; however, evaluating whether the performance aligns with the design requires an assessment from both a macroscopic perspective of water components and a microscopic perspective of the adsorbent's fine structure. This analysis presents a case study of an immersion experiment of zeolite in ammonia water, capturing the changes in ion content in the water before and after immersion, as well as the structural changes in the zeolite.

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  • Contract measurement
  • Structural Analysis
  • Evaluation Board
  • Electron microscope

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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other polymer materials
  • Other metal materials
  • Electron microscope

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Observation of the cutting edge surface of single crystal diamond chips.

Observation of the cutting edge surface of single crystal diamond chips.

Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics

The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other machine elements
  • Processing Contract
  • Electron microscope

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Scanning Electron Microscope (SEM) Observation

Scanning Electron Microscope (SEM) Observation

Observation of non-conductive samples without deposition is possible! Scanning electron microscopy is ideal for surface observation of fibers and similar materials.

A "Scanning Electron Microscope (SEM)" is a device that irradiates and scans a finely focused electron beam on a sample, detects secondary and backscattered electrons, and displays their intensity as an image on a monitor to obtain magnified images of the object. Although it is not suitable for high magnification observation due to reduced image quality, it can use low vacuum mode, allowing for non-coating observation of difficult-to-conduct samples. [Observation Items] ■ Surface observation at magnifications of 5 to 300,000 times ■ Elemental analysis (B to U) using an energy-dispersive X-ray spectrometer (EDS) as an accessory ■ Element identification in micro-regions (qualitative and semi-quantitative analysis) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Electron microscope

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Transmission Electron Microscopy (TEM) Observation

Transmission Electron Microscopy (TEM) Observation

Electron microscope observation capable of identifying crystalline substances and analyzing crystal orientations! Applicable to all types of metallic materials.

The "Transmission Electron Microscope (TEM)" irradiates a sample with a high-voltage electron beam and obtains transmission electron images and electron diffraction patterns by magnifying the electrons that have passed through the sample using electromagnetic lenses. In transmission electron images, features such as grain boundaries, defects, strain, and the presence of precipitates can be observed, while electron diffraction patterns allow for the identification of crystalline materials and the analysis of crystal orientation. 【Features】 ■ Observation at magnifications from 1,000 to 1,000,000 times ■ Element identification in ultra-micro regions through EDS analysis (qualitative and semi-quantitative analysis of elements from C to U) ■ Identification of crystalline materials and analysis of crystal orientation *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Electron microscope

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Superior Corporation Business Introduction

Superior Corporation Business Introduction

We are striving for extreme business development in the fields of healthcare and information to meet the social needs of the 21st century!

Superior Co., Ltd. is a company that specializes in the manufacturing of special coils as a professional in precision winding, and also engages in the assembly of machinery, including the assembly of electron microscope units and ultra-precision assembly of semiconductor-related units. Additionally, we accept orders for integrated services from design to manufacturing of resin processing for cleaning tanks used in semiconductor manufacturing equipment and rationalization machinery and equipment. 【Business Activities】 ■ Special coil manufacturing ■ Machinery assembly ■ Resin processing related to industrial machinery ■ Precision parts processing *For more details, please refer to our catalog or feel free to contact us.

  • Inductor Coil
  • Electron microscope
  • Electron microscope

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Technical Information Magazine 202001-01 in-situ STEM

Technical Information Magazine 202001-01 in-situ STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, there has been a growing demand for high-sensitivity and low-power consumption devices, leading to increased attention on magnetic memory and magnetic sensors in the field of spintronics. These devices widely utilize the MTJ (magnetic tunnel junction) structure due to its ability to achieve high magnetoresistance effects. The MTJ structure consists of thin layered films on the order of a few nanometers, where the film thickness, roughness, and crystallinity at the atomic level significantly influence the properties. Additionally, since the magnetic characteristics change with annealing temperature, this paper presents a case study using in-situ TEM to analyze the changes in crystallinity and elemental distribution during heating at the nanometer level. **Table of Contents** 1. Introduction 2. Samples and Evaluation Methods 3-1. Changes in Crystallinity 3-2. Analysis of Crystal Orientation 3-3. Analysis of In-Plane Crystal Orientation 4. Conclusion 5. Acknowledgments 6. Closing Remarks

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  • Technical and Reference Books
  • Electron microscope

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Technical Information Magazine 201910-03 In-situ Heating Method

Technical Information Magazine 201910-03 In-situ Heating Method

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Regarding the LIB positive electrode active material LiCoO2, gas analysis using TPD-MS and two in-situ heating methods (in-situ heating TEM) were employed to investigate the relationship between the gases emitted from LiCoO2 particles during heating and the changes in morphology, organization, and structure. The results demonstrated that gas generation is closely related to structural changes. Changes similar to charge-discharge behavior were also observed, and a series of measurements with temperature as a parameter provided important insights for analyzing actual materials. Additionally, it was shown that microscopic structural changes (such as the formation of domain structures), which cannot be detected without high resolution (approximately 40 nm field of view), can be visualized and quantitatively analyzed using ASTAR* (with *ASTAR being a registered trademark of NanoMEGAS) at a field of view of over 1 μm. **Table of Contents** 1. Introduction 2. Experimental Methods 3. Observation of Gas Generation Behavior Using TPD-MS 4. Observation of Structural Changes by in-situ Heating TEM 4-1. Observation of Morphological and Organizational Changes in STEM Images 4-2. Observation of Crystal Structure Changes in HRSTEM Images 4-3. Observation of Morphological, Organizational, and Structural Changes Above 650°C 5. Conclusion

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  • Technical and Reference Books
  • Electron microscope

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Technical Information Magazine 201910-02 DDS Technology

Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

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  • Technical and Reference Books
  • Electron microscope

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Technical Information Magazine 201902-01 Polymers Using DPC-STEM

Technical Information Magazine 201902-01 Polymers Using DPC-STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Differential Phase Contrast (DPC) - Scanning Transmission Electron Microscopy (STEM), one of the measurement techniques of STEM, enables the measurement of electric fields at microscopic regions. By applying this method to polymer alloys, we discovered that contrast of phase separation structures, which are difficult to observe with conventional electron microscopy, emerges. **Table of Contents** 1. Introduction 2. Visualization of Soft Materials through Elemental Analysis 3. Application of DPC-STEM Method 4. Conclusion

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  • Technical and Reference Books
  • Electron microscope

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Observation of the crystalline structure of resin and the morphology of polymer alloys using TEM.

Observation of the crystalline structure of resin and the morphology of polymer alloys using TEM.

It is possible to observe and evaluate the crystalline structure and dispersion state of the resin!

Our website introduces "Observation of Crystal Structure and Morphology of Polymer Alloys using Transmission Electron Microscopy (TEM)." To observe the crystal structure of polymers and the morphology of polymer alloys using TEM, it is necessary to prepare ultra-thin sections. Additionally, staining is required to create differences in electron beam transmission. We provide a table of main staining agents and resins that can be stained, as well as examples of observations, so please take a look. [Contents] ■ Main staining agents and resins that can be stained ■ Observation examples - Crystal structure of HDPE - Observation example of the dispersion structure of polymer alloys *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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TEM observation of CNF (cellulose nanofiber) in ink.

TEM observation of CNF (cellulose nanofiber) in ink.

Observing the CNF in the ink solid content of cellulose nanofiber ballpoint pens!

We would like to introduce our observation of cellulose nanofibers (CNF) using transmission electron microscopy (TEM). Utilizing the know-how we have developed in observing resin materials with TEM, we examined the CNF in the ink solids of commercially available cellulose nanofiber ballpoint pens. We observed CNF with a width of approximately 10 nm that appeared to be entangled with ink pigments, and it was found that the ink contains CNF with varying degrees of fibrillation. [Observation Results] - CNF with a width of approximately 10 nm that appeared to be entangled with ink pigments was observed. - Submicron-width CNF was also observed. - Several thin microfibrils, around a few nanometers in diameter, bundle together to form fibers approximately 100 nm thick. - The ink contains CNF with varying degrees of fibrillation. *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Observation of cellulose nanofibers (CNF) in resin (polyethylene)

Observation of cellulose nanofibers (CNF) in resin (polyethylene)

Observation of the dispersion state of fine CNF and the lamellar crystals of resin! We also introduce the features of TEM and SEM observations.

Our website introduces "Morphological Observation of Cellulose Nanofiber (CNF) Composites." We have included photos of "TEM Observation Examples of HDPE/CNF" and "SEM Observation Examples of HDPE/CNF." In TEM observation, the dispersion state of fine CNF and the lamellar crystals of the surrounding resin can be observed, while SEM observation allows for the observation of the dispersion state of relatively larger CNF. [Published Photos] ■ TEM Observation Examples of HDPE/CNF ■ SEM Observation Examples of HDPE/CNF *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations

Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations

Observing the structure of cellulose nanofibers (CNF) using scanning electron microscopy (SEM) and transmission electron microscopy (TEM)!

We would like to introduce the "Cellulose Nanofiber (CNF) Observation" conducted by our company. Utilizing the expertise we have developed in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observation of resin materials, we observed commercially available cellulose nanofiber (CNF) samples. We were able to clearly view individual CNF microfibrils with thicknesses on the order of nanometers from the surface or cross-section. [Observation Details] ■ Scanning Electron Microscopy (SEM) Observation - More finely dispersed CNF ■ Transmission Electron Microscopy (TEM) Observation - Cross-sectional observation of finely dispersed CNF *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Analysis of food container packaging: Observation of the layer composition of plastic containers.

Analysis of food container packaging: Observation of the layer composition of plastic containers.

With the morphology observation techniques developed through SEM so far, it is possible to observe the layer composition of food container packaging materials!!

The container for solid roux has a multi-layer structure due to the need for food preservation. By observing the cross-section of such food containers with an electron microscope, the layer composition can be clarified. It was found that a commercially available solid roux container has a seven-layer multi-layer structure with a thickness of approximately 3μm to approximately 40μm, as determined by FE-SEM observation. Based on this, further material analysis (＊1) was conducted using FT-IR and Raman analysis, allowing us to understand the materials of each layer. Additionally, the preservation properties of the container can also be assessed through measurements of oxygen permeability and water vapor permeability (＊2). *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Observation of dispersed structures in plant-derived straw using a field emission scanning electron microscope.

Observation of dispersed structures in plant-derived straw using a field emission scanning electron microscope.

Observe the dispersion state of plastic composite materials from low magnification to high magnification, according to your purpose!

Our company conducts observations of the dispersed structures in plant-derived straw using a field emission scanning electron microscope (FE-SEM). We observe the dispersion of islands of plant fibers (cellulose) in a sea of natural plant-derived resin, with circular starch islands present at the interface. We examine the dispersion state of various plastic composite materials from low magnification (a few hundred times: relatively large aggregated structures) to high magnification (around 100,000 times: fine structures), depending on the purpose. [Features] ■ Observation of the dispersion state of various plastic composite materials from low to high magnification, according to the purpose. *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Dispersion structure of block polypropylene observed by transmission electron microscopy (TEM)

Dispersion structure of block polypropylene observed by transmission electron microscopy (TEM)

TEM observation of the dispersed structure of block PP! Elastomers and other resins can also be observed.

We conduct dispersion structure analysis of block polypropylene using transmission electron microscopy (TEM). The EPR components inside the rubber domain and the lamellar crystals of PE can be clearly observed, as well as the lamellar crystals in the PP matrix. We can also observe composites that include not only block PP alone but also elastomers, other resins, and filler components such as cellulose nanofibers (CNF), so please feel free to contact us. ■ EPR components and lamellar crystals of PE inside the rubber domain can be confirmed ■ Lamellar crystals in the PP matrix can be clearly observed ■ Composites with added filler components can also be observed *For more details, please download the PDF or feel free to contact us.

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  • Electron microscope

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Quantification (image analysis) of transmission electron microscope (TEM) images.

Quantification (image analysis) of transmission electron microscope (TEM) images.

Not only can image analysis be performed from TEM images, but it can also be done from SEM images! Various mechanical property evaluations can also be conducted.

Our company conducts quantification (image analysis) of transmission electron microscope (TEM) images. By analyzing high-resolution TEM and scanning electron microscope (SEM) images, it is possible to quantify the dispersion state of micro-dispersed rubber domains within the resin. Additionally, we can understand how the dispersion state of rubber domains affects the mechanical properties of the resin. 【Features】 ■ By applying binary processing to TEM images, we extract rubber domains and create a histogram of domain diameter (evaluation parameter) based on this, allowing for the evaluation of domain diameter distribution. ■ Other evaluation parameters that can be obtained include the lengths of the major and minor axes of the domains, the number of domains, occupancy area, and area ratio. *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • Image analysis
  • Electron microscope

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Notice of Participation in the "Food Forum Tsukuba Business Exchange Exhibition 2023"

Notice of Participation in the "Food Forum Tsukuba Business Exchange Exhibition 2023"

We will introduce our services at the corporate exchange exhibition!

We will be exhibiting at the Food Forum Tsukuba corporate exchange exhibition to be held on November 8, 2023 (Wednesday) at the Tsukuba International Conference Center. This exhibition is an opportunity for companies involved in the food industry to showcase their products and technologies. In addition to displaying equipment and products, we will also conduct demonstrations and distribute samples. At our booth, we will introduce the following services: - Electron microscopy observation of food - Analysis of amino acids and dipeptides We would be grateful if you could visit us when you are in the area. We look forward to seeing you all.

  • Contract Inspection
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  • Electron microscope

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[Analysis Case] Observation of the Dispersion State of Abrasives in Polishing Slurry

[Analysis Case] Observation of the Dispersion State of Abrasives in Polishing Slurry

We will introduce an example of visualizing abrasive particles in a grinding slurry.

Materials with fine particles dispersed in liquids, such as dispersions and slurries, are utilized in many fields including batteries, paints, and cosmetics. In these materials, the dispersion of particles significantly affects the performance and quality of the products, making the evaluation of the dispersion state very important. However, in conventional scanning electron microscope (SEM) observations, the process is conducted in a vacuum, which can lead to particle aggregation and structural changes due to drying, making it difficult to accurately assess the original dispersion state in the liquid. This document presents a case study of visualizing abrasive particles in polishing slurries using SEM observations with a liquid cell, which allows for the observation of liquids even in a vacuum. **Analysis Samples** - Diamond slurry - Alumina slurry **Analysis Method** We conducted SEM observations of polishing particles in slurries both with and without the use of a liquid cell. By using a liquid cell, we were able to visualize the dispersion state of fine particles in the liquid without the need for dilution or drying treatment, even for highly viscous slurry materials. SEM observations using a liquid cell enable the observation of the presence of fine particles in dispersions and slurries in their liquid state.

  • Contract measurement
  • Electron microscope

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Analysis services using scanning electron microscopy and energy-dispersive X-ray spectroscopy.

Analysis services using scanning electron microscopy and energy-dispersive X-ray spectroscopy.

Sample preparation can be performed through resin embedding, cutting, and grinding, allowing for cross-sectional shape observation and elemental analysis.

At Sanko Analysis Center Co., Ltd., we conduct analyses using a scanning electron microscope (SEM) and an energy-dispersive X-ray spectrometer (EDS). With the scanning electron microscope (SEM), we scan the sample with an electron beam and observe the shape of the sample by converting secondary electrons and backscattered electrons emitted from the surface into images. (30x to 300,000x) With the energy-dispersive X-ray spectrometer (EDS), we perform qualitative elemental analysis by detecting characteristic X-rays emitted from the sample when the electron beam is scanned, and we conduct quantitative elemental analysis using the fundamental parameter method by measuring the intensity of the characteristic X-rays. Additionally, we take photographs of the SEM images of the specified areas and report them. Length measurement and 3D imaging are available upon request. *For more details, please download the PDF or feel free to contact us.

  • X-ray fluorescence analyzer
  • Spectroscopic Analysis Equipment
  • Electron microscope

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Technical Data: Low Vacuum SEM

Technical Data: Low Vacuum SEM

We will introduce a case where the cross-sectional structure of a solar panel was analyzed using only cutting and polishing as a preprocessing step!

Our company is engaged in the analysis solution business. This document presents a case study where the cross-sectional structure of an insulator solar panel composed of organic-inorganic composites was analyzed using low vacuum SEM and FT-IR, with only cutting and polishing as the pretreatment. In low vacuum SEM, coating treatments (pretreatment) such as vacuum deposition are not required for sample preparation. For samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be directly used for other analyses. [Contents] ■ Overview ■ Analysis Case ・ Analysis of Solar Panels (Insulators) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other services
  • Electron microscope

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"Contract analysis services in a non-contact air environment" *Analysis sample materials provided*

"Contract analysis services in a non-contact air environment" *Analysis sample materials provided*

Such as Na, Mg, and Li. Supporting the development of new materials and new products in the fields of automobiles, electronic devices, and machine parts.

Our company offers "analysis services tailored to individual needs." Among these, we provide "analysis services in a non-contact air environment," which allow for the analysis of substances such as lithium, sodium, and potassium that change their surface state when exposed to moisture and oxygen in the air, while keeping them in an active state. We respond to needs in the research and development of new materials and products in the automotive, electronics, chemical, and mechanical parts industries, including the development of new materials and products, discovery of hidden properties, and verification of basic data. ◎ Examples of requests - I want to know if the behavior of thermal decomposition of oil that has dissolved during the manufacturing process differs in an atmosphere of hydrogen, nitrogen, etc. - I want to know if alloys react with atmospheric gases such as hydrogen and nitrogen, and what the reaction temperature is. - I want to know how the data changes when the atmosphere is altered. ◎ Items handled Scanning Electron Microscope (SEM) Thermogravimetric, Differential Thermal, and Temperature-Programmed Desorption Mass Spectrometry (TG-DTA-MS) Powder X-ray Diffraction (XRD) Pressure-Composition Isotherm (PCT) measurement High-Pressure Differential Scanning Calorimetry (DSC) Fourier Transform Infrared Spectroscopy (FT-IR) *Samples for analysis in a non-contact air environment can be viewed via PDF download. Please feel free to contact us for inquiries or analysis requests.

  • Contract Analysis
  • Other microscopes
  • Electron microscope

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NeoScope Tabletop Scanning Electron Microscope

NeoScope Tabletop Scanning Electron Microscope

By placing one unit next to the optical microscope, foreign substance analysis and quality control can be performed more quickly and in greater detail.

Japan Electronics Corporation JCM-7000 NeoScope is a tabletop scanning electron microscope with the concept of "anyone can operate SEM/EDS." It features functions such as "Zeromag," which allows observation of SEM images by magnifying optical images, "Live Analysis," which identifies elements in the field of view without starting up the analysis device, and "Live 3D," which enables three-dimensional observation during SEM observation. 〇 Features - Quick and easy observation and analysis without treatment using the tabletop SEM JCM-7000! - Functions designed for "anyone to operate SEM/EDS." *For more details, please download the PDF or feel free to contact us.

  • Optical microscope
  • Electron microscope

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JEM-1400Flash Electron Microscope

JEM-1400Flash Electron Microscope

New transmission electron microscope

Japan Electronics Co., Ltd. JEM-1400Flash is a new transmission electron microscope with an acceleration voltage of 120kV, featuring a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function for optical microscope images and electron microscopy. It allows for efficient and high-speed data acquisition. 〇Features - High-sensitivity sCMOS camera Instant Flash camera - New feature Ultra-wide field montage system Limitless Panorama (LLP) - New feature Optical microscope image linking function Picture Overlay - New design Collaboration of pure white color and LED lamp *For more details, please download the PDF or feel free to contact us.

  • Electron microscope
  • Electron microscope

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CRYO ARM 300 II 電界放出形クライオ電子顕微鏡

CRYO ARM 300 II 電界放出形クライオ電子顕微鏡

短時間に、簡単操作で、高コントラスト・高分解能の画像を取得

日本電子株式会社 CRYO ARM300 II は、タンパク質に代表される電子線照射に弱い試料の観察に特化した、クライオ電子顕微鏡です。単粒子構造解析やトモグラフィー、電子線結晶構造解析などの各手法に対応しています。 〇特長 ・顕微鏡の安定性とスループットの更なる向上 ・操作性もよりシンプルに ・サンプルのスクリーニングから画像データ取得までを一体化 ・ユーザーに合わせた運用を可能にする高い自由度 ・簡単な操作で質の高い顕微鏡写真が取得 ※詳細はPDFをダウンロードしていただくか、お気軽にお問い合わせください。

  • Electron microscope
  • Electron microscope

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