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Microscope Product List and Ranking from 74 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 関西電力送配電 技術試験センター Hyogo//Electricity, Gas and Water Industry
  3. 早坂理工 Saitama//Trading company/Wholesale
  4. 4 アクティブウェーブ Osaka//Optical Instruments
  5. 5 null/null
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Microscope Product ranking

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. Digital Microscope "VHX-X1 Series"
  2. [Introduction to Testing Equipment] Digital Microscope VHX-6000 関西電力送配電 技術試験センター
  3. [Technical Documentation] Basic Operations for Taking Clear Photos
  4. 4 Digital Microscope DSX2000 4K [Product Catalog] 早坂理工
  5. 5 Digital Microscope VHX Application Case Studies: Electrical and Electronics Industry Edition

Microscope Product List

136～150 item / All 242 items

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Haleration Microscope "PS..S7Z16R100-2"

Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.

Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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New product! Halation Microscope

New product! Halation Microscope

"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.

The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Halleation Microscope

Halleation Microscope

Observation of curved surfaces and R surfaces is also possible with unique lighting effects 'PS-100-S7Z45R100A'

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt on cylindrical objects like shafts, which are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a specular reflection image can be obtained with external lighting, it enables observation of surface protrusions and other features "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. The halation microscope "PS-100-S7Z45R100A" is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The moving image shown below is a comparative image captured using the halation microscope "PS-100-S7Z45R100A" (medium magnification) for curved surface observation, depicting a 2φ shaft illuminated with both halation lighting and incident lighting. The incident lighting image captures only the apex of the shaft, while the halation lighting image covers over 60°.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS-100-S7Z90A"

Haleration Microscope "PS-100-S7Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image taken with the high-magnification halation microscope "PS-100-S7Z90A" for planar observation, capturing the ITO and spacers of the LCD using halation lighting and incident lighting. The image captured with incident lighting does not show the ITO, while the image captured with halation lighting clearly recognizes both the ITO and the spacers.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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【Special Campaign Price】Haleration Microscope

【Special Campaign Price】Haleration Microscope

Easily, quickly, and reliably inspect for dents, scratches, and dirt on surfaces! Achieve outstanding high-definition images!

※ Free distribution of sample evaluation images ※ Using a halation lighting system that utilizes specular reflection, we achieve outstanding high-definition images of cracks, scratches, and dirt on cylindrical objects such as shafts, which are difficult to see with conventional incident lighting. (Comparison images with incident lighting are available) Since a specular reflection image is obtained through external lighting, it is now possible to observe surface protrusions and conduct quality inspections "more easily," "more reliably," and "more quickly" than before. 【Reasons to Choose Us】 ■ Images are obtained without loss due to the specular reflection from external illumination. ■ We adopt a halation lighting system that divides a semicircle (140°) into ten parts. ■ The raised condition of dents, scratches, and dirt on the shaft surface can be confirmed. 【Limited-Time Campaign Benefits】 ■ Free provision of images taken of your work! ■ Special campaign price for a limited time! ■ We can visit for a demonstration if requested. For more details, please download the catalog or contact us. 【Information on Flat Observation and New Halation Three-Eye Tube Stereo Microscope】 ⇒ For more details, please refer to the 'Special Site.'

  • Microscope

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Low-cost microscope

Low-cost microscope

Low-cost microscope

Recommendation for Introducing an Image Magnification System Achieve high performance microscopes at low prices!! 20x to 110x magnification ● Enables quality inspection and verification report creation, as well as observations by multiple people ● Can be connected to a PC using the SL-62/CMOS camera (sold separately), allowing for easy measurement and image processing.

  • Microscope

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Digital Microscope "SDM2"

Digital Microscope "SDM2"

High resolution that cannot be achieved with conventional zoom microscopes.

The digital microscope "SDM2" is a fully automatic digital microscope system that can observe a wide range from low to high magnification. By using a high-resolution zoom microscope, it is also possible to observe with an optical resolution of less than 1μm. It can quickly move to registered coordinates using an automatic XY stage. Additionally, it is equipped with an autofocus function, achieving high resolution that cannot be realized with conventional zoom microscopes. For more details, please download the catalog.

  • Electron microscope

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Appearance observation using a digital microscope.

Appearance observation using a digital microscope.

Accurately grasping defects! It is possible to conduct extensive bulk observations as well as partial magnifications, accommodating various types of observations.

By observing shapes clearly that might be overlooked by the inspector's visual inspection alone, it is possible to accurately grasp defects. Wide-range bulk observation and partial magnification are also possible, accommodating various types of observation. Additionally, we have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, provide consultations, and address various observation-related concerns. 【Features】 ■ Wide-range bulk observation and partial magnification are possible ■ Accommodates various types of observation ■ Clear magnified observation is possible regardless of the location after overall observation ■ Additional observation of unexpected areas is also easy ■ IPC-A-610 certified IPC specialists are on staff *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Other contract services

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[Data] Whisker Observation

[Data] Whisker Observation

Support from reliability testing observations to 3D measurement! It is possible to conduct whisker evaluations while eliminating transportation risks.

While lead-free solder is becoming widespread, whiskers formed from Sn plating or solder joints have a significant impact on the reliability of electronic components. Our company observes whiskers using a digital microscope with depth composition capabilities and conducts three-dimensional measurements to evaluate whisker growth. By collaborating with the reliability testing group, we can implement whisker evaluations quickly and eliminate transportation risks. 【Features】 ■ Support from observation to three-dimensional measurement in reliability testing ■ Observation of whiskers using a digital microscope with depth composition capabilities ■ Ability to conduct whisker evaluations quickly and eliminate transportation risks *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Other contract services

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Observation of diamond clarity

Observation of diamond clarity

A microscope allows you to observe tiny defects that cannot be seen with the naked eye!

The quality of diamonds is determined by the 4Cs (Cut, Color, Carat, Clarity). Clarity refers to the degree of inclusions and blemishes. I took a look at the clarity using a microscope, and I would like to share my findings. Even items that appear clean at first glance may have inclusions or cracks when magnified. The microscope allows us to observe tiny defects that cannot be seen with the naked eye. Additionally, the microscope is also used for the inspection and observation of semiconductor electronic components and silicon chips. Please feel free to contact us if you need our services. [Features] - The microscope can observe tiny defects that cannot be seen with the naked eye. - Inspections and observations of semiconductor electronic components and silicon chips are also conducted. *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • Other microscopes
  • Contract measurement

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[Analysis Case] Observation of Puff Surface Shape

[Analysis Case] Observation of Puff Surface Shape

Observation of the puff surface using a digital microscope.

The surface shape of foundation puffs and the adhesion of cosmetics were evaluated using a digital microscope. The digital microscope has a greater depth of field compared to optical microscopes, allowing for accurate observation of large uneven objects that could not be focused on with a microscope. The observation results of commercially available foreign puffs are shown in Figures 1 to 4. The surface shape of the puffs and the adherence of the foundation can be confirmed. Additionally, as shown in Figure 5, it is also possible to directly observe the surface of the hand.

  • Contract Analysis

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PC Microscope SKM-S30C-PC Rental

PC Microscope SKM-S30C-PC Rental

Adopts a continuous variable magnification method! A microscope that can display and save images on a PC.

The PC Microscope SKM-S30C-PC allows for high-quality magnified images equivalent to or better than higher-end models, displayed and saved on a computer screen with simple operation. The included stand provides excellent stability, enabling high-precision observation. It features a continuously variable magnification range from X15 to X180. Saving images to a PC is also easy. 【Features】 ■ Continuously variable from X15 to X180 ■ Easy image saving to PC ■ Simple setup with USB2.0 connection ■ Sturdy aluminum body ■ Comes with a stable stand *For more details, please contact us.

  • Other microscopes

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High-Definition Microscope 'DOLPHIN' Rental

High-Definition Microscope 'DOLPHIN' Rental

High-quality measurement with accurate color reproduction! A microscope that allows for multi-faceted observation of the skin.

The high-definition microscope "DOLPHIN" features three modes of LED lighting along with a macro mode, allowing for two types of imaging. The LED lighting modes include two types: the Detail Mode (reflected light) and the Skin Mode (polarized light). This enables multi-faceted observation of the skin. It uses a SONY CCD that offers excellent color reproduction, allowing you to realize that image quality is not just about pixel count. 【Features】 ■ Four types of imaging available ■ High quality and excellent color reproduction ■ Comfortable form that fits in your hand ■ Equipped with dedicated software (Core Image Hunter) For more details, please feel free to contact us.

  • Other microscopes
  • Microscope
  • Rental/lease

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Digital Microscope 'DSX110' Rental

Digital Microscope 'DSX110' Rental

An industrial microscope that enables "viewing, capturing, measuring, and sharing" all in one device.

The "DSX110" is a digital microscope that achieves high-quality images, intuitive operation, diverse observation methods, and excellent reproducibility. It also supports extended focus functionality, 3D imaging, a wide range of stitching imaging, and programmed sample imaging. Designed with actual work in mind, the reporting system enables smooth sharing of measurement and analysis results. Reports can be created with a single click and can be exported in various formats. 【Features】 ■ Advanced optical technology and digital technology ■ Easy operation for capturing images, similar to using a smartphone or tablet ■ Capable of advanced measurements such as 3D measurement and particle analysis ■ Reports can be created with a single click and can also be exported *For more details, please feel free to contact us.

  • Rental/lease

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