analysis - メーカー・企業40社の製品一覧とランキング

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analysisのメーカー・企業ランキング

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ビーエルテック Tokyo//Testing, Analysis and Measurement
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
西進商事 Hyogo//Industrial Machinery
4 同仁グローカル Kumamoto//others
5 大同分析リサーチ Aichi//Service Industry

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analysisの製品ランキング

更新日：Oct 01, 2025 集計期間:Sep 03, 2025～Sep 30, 2025
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Certified single-element and mixed standard solutions for ICP-AES/ICP-MS wet analysis. 西進商事
Continuous Flow Analysis System (CFA) "MiSSion" ビーエルテック
Simple screening test for residual antibiotics in milk: "Charm DIP Test"
4 Fluorine, Cyanide, and Phenol Measurement Device SWAT ビーエルテック
5 Equipment Diagnostic Device Online Vibration Meter Mitaro Series MK-64 JFEアドバンテック計測診断事業部

analysisの製品一覧

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State analysis using EPMA

Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.

In the state analysis using EPMA, changes (shifts and shapes) in the characteristic X-ray peak wavelengths due to differences in the chemical bonding states (ionic valence, crystal structure, coordination number) of oxides and silicates are utilized to estimate the bonding states by comparing with standard spectra. In the identification of two types of copper oxides, when distinguishing between black CuO and red Cu2O by color is difficult, especially for microscopic objects that require an electron microscope, it is possible to grasp the oxidation state using EPMA. Additionally, while XPS is effective for measuring thin oxide layers on aluminum surfaces, EPMA can be used to understand the oxidation state of small foreign particles, bulk materials, and composites. 【Device Specifications】 ■ Manufacturer: JEOL Ltd. Jeol-8200 ■ Analysis Method: Wavelength Dispersive X-ray Analysis (WDX) ■ Analyzable Elements: B to U ■ Energy Resolution: 20 eV (EDX is approximately 130 eV) ■ Detection Limit: 0.01% and above ■ Maximum Sample Size: 100x100 mm *For more details, please refer to the PDF document or feel free to contact us.

企業：アイテス
価格：Other

Analysis Services
Contract Analysis

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[Data] Cross-sectional observation of solar cell modules

We have published cross-sectional observations of the fracture surface and elemental maps of the fracture area!

This document introduces the cross-sectional observation of solar cell modules. An inspection was conducted on a solar cell module that underwent thermal shock testing, and upon performing a cross-sectional observation of the identified abnormal areas, it was confirmed that the interconnector solder joint had fractured. [Contents] - Cross-sectional observation of the fracture - Element map of the fracture *For more details, please refer to the PDF document or feel free to contact us.

企業：アイテス
価格：Other

Contract Analysis
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Contract Analysis

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Reliability testing of materials and chemical analysis evaluation after testing.

Introducing a case where the changes in molecular structure of materials were verified through IR analysis! We also creatively accommodated a variety of sample setups.

Reliability testing of materials that make up the product under thermal and humidity loads is essential, but analysis and evaluation after testing is also an indispensable process. Constant temperature and humidity testing is a device that applies temperature and humidity loads to products and materials to check for changes in physical properties, characteristics, appearance, and lifespan. Our company has also devised various methods for setting up a wide range of samples. In this document, we will introduce a case where changes in the molecular structure of materials before and after constant temperature and humidity testing were verified through IR analysis. We encourage you to read it. [Contents] ■ Examples of reliability testing equipment (constant temperature and humidity testing equipment) ■ Innovations in sample setup ■ Comparative evaluation before and after testing through chemical analysis *For more details, please refer to the PDF document or feel free to contact us.

企業：アイテス
価格：Other

Other contract services

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[Example of TOF-SIMS] Analysis of Li

It is possible to detect with high sensitivity! We will introduce a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, it is difficult to detect Li with general EDX, excluding windowless EDX. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF document or feel free to contact us.

企業：アイテス
価格：Other

Contract measurement

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Analysis of trace metal elements in liquid crystals

Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, along with quantification. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. Ionic substances are known to increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES and ICP-MS are used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

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Analysis Services

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[SSRM] Scanning Spreading Resistance Microscopy

Local resistance measurement at the nanometer level is possible.

SSRM is a method that visualizes the spreading resistance directly beneath the probe by scanning the surface of a sample with applied bias using a conductive probe and measuring the distribution of resistance values in two dimensions. When measuring silicon semiconductor devices, it is sensitive to carrier concentrations of 10^16 cm^-3 or higher, depending on spatial resolution. - Local resistance measurement at the nanometer level is possible - Effective for measuring the dopant concentration distribution in semiconductors - Cannot determine the polarity of semiconductors (p-type/n-type) - Quantitative evaluation is not possible

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
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[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

FIB refers to a focused ion beam with diameters ranging from several nanometers to several hundred nanometers, which can be used to etch specific areas (sputtering) or deposit materials such as carbon (C), tungsten (W), and platinum (Pt) onto specific regions by scanning the sample surface. Additionally, the shape of the processed sample can be recognized through SIM images, which detect secondary electrons generated by irradiating the sample with the ion beam. - Arbitrary shape processing through etching in micro-regions (several nanometers to several tens of micrometers) is possible (typical processing size: around 20 μm) - Sample preparation for SEM, SEM-STEM, and TEM imaging (cross-sections of specific areas can be produced) - Fine pattern deposition and thin film formation (C, W, Pt deposition) are possible in the range of several micrometers to several tens of micrometers - High-resolution SIM (Scanning Ion Microscope) imaging is possible (acceleration voltage 30 kV: 4 nm) - Observation of metal crystal grains (Al, Cu, etc.) is possible with SIM images.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
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[Analysis Case] Evaluation of Main Components of Lithium-ion Secondary Battery Electrolyte

We will dismantle and analyze regardless of the experimental cell.

This is an example of evaluating the organic solvent components of an electrolyte using GC/MS analysis. The measurement of the electrolyte in lithium-ion secondary batteries revealed that the main components of the organic solvents are ethylene carbonate (EC) and propylene carbonate (PC). Other components detected included diethyl carbonate (DEC) and sulfur compounds, with the latter possibly originating from additives.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract measurement

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[Analysis Case] Evaluation of the Distribution of Hair Care Ingredients in Hair 1

Visualizing the penetration state of each component into the hair.

We investigated the penetration state of components under various immersion conditions by soaking unconditioned hair, specifically facial hair, in a conditioner or treatment. In the facial hair soaked in conditioner, it was observed that siloxanes penetrated to the hair cortex over time, while high fatty acids appeared to be lost. In the facial hair soaked in treatment, nitrogen-containing organic substances did not penetrate the hair cortex and were only distributed around the cuticle.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

This shows the results of extracting the qualitative spectra of each layer by performing cutting processing of organic EL devices under controlled atmosphere. By conducting the cutting process of the organic EL devices under atmosphere control, we were able to obtain spectra of each layer that are closer to the true state.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

To extend the lifespan of organic EL devices, it is essential to evaluate the degradation caused by electromigration, making it important to investigate the diffusion state of electrode metal components into the organic layer. However, whether analyzed directly from the cathode side or through the SSDP method from the anode side, the depth resolution decreases, making it difficult to assess the diffusion from the interface into the organic layer. (Note: SSDP method refers to analysis from the backside. For details on the analytical method, see section B0013.) Therefore, by using special processing to expose the cathode/organic layer interface and the organic layer/anode interface, it has become possible to evaluate the organic layer with high depth resolution.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials

We will conduct an evaluation that combines various methods to solve the problem.

Lithium-ion secondary batteries have excellent characteristics among secondary batteries and are widely used as power sources for various portable devices. However, there are still various challenges remaining, such as increasing output, capacity, longevity, and reliability. Comprehensive evaluation of battery materials is possible using various analytical methods.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] High-Sensitivity Analysis of Light Elements in Semiconductor Substrates Using SIMS

SIMS analysis allows for the evaluation of elements such as H, C, N, O, and F down to levels below 1 ppm.

It is possible to detect H, C, N, and O in semiconductor substrates at concentrations below 1 ppm (approximately 5E16 atoms/cm3) and F at concentrations below 1 ppb (approximately 5E13 atoms/cm3) using this method. Examples of measurements in actual FZ-Si (Figure 1) and the background levels of III-V semiconductors are presented (Table 2). In addition to III-V semiconductors, standard samples have been prepared for various materials such as metal films and insulating films, enabling highly sensitive quantitative analysis. This method is ideal for bulk analysis of various materials, including semiconductor substrates, and for evaluating the contamination of gas components during semiconductor processes.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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