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analysis Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. ビーエルテック Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. 西進商事 Hyogo//Industrial Machinery
  4. 4 同仁グローカル Kumamoto//others
  5. 5 大同分析リサーチ Aichi//Service Industry
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analysis Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Certified single-element and mixed standard solutions for ICP-AES/ICP-MS wet analysis. 西進商事
  2. Continuous Flow Analysis System (CFA) "MiSSion" ビーエルテック
  3. Simple screening test for residual antibiotics in milk: "Charm DIP Test"
  4. 4 Fluorine, Cyanide, and Phenol Measurement Device SWAT ビーエルテック
  5. 5 Equipment Diagnostic Device Online Vibration Meter Mitaro Series MK-64 JFEアドバンテック 計測診断事業部

analysis Product List

106～120 item / All 646 items

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[Analysis Case] Evaluation of Odor Components in Essential Oils

[Analysis Case] Evaluation of Odor Components in Essential Oils

Concentration analysis of odor components using solid-phase microextraction (SPME).

The concentration of volatile components that humans perceive as odors can be very low, and they may not be detectable using the conventional HS (Headspace) method for GC/MS measurements used for analyzing volatile components. By using Solid-Phase Micro Extraction (SPME), it becomes possible to concentrate the volatile components and introduce them into GC/MS, allowing for the detection of many trace components. This document presents a case study analyzing odor components in trace amounts of essential oils.

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[Analysis Case] Evaluation of Carrier Distribution in Near-Infrared VCSEL Using SMM

[Analysis Case] Evaluation of Carrier Distribution in Near-Infrared VCSEL Using SMM

We can consistently perform everything from disassembly and processing of the implemented product to measurement of the diffusion layer.

We disassembled a near-infrared VCSEL (vertical-cavity surface-emitting laser) implementation to extract a tiny chip, and after cross-section processing, we conducted SMM measurements. A high-resistance current confinement layer was observed surrounding the aperture of the VCSEL. Additionally, near the active layer, films of different materials were stacked, and this composition was measured as a contrast. Contrast was also confirmed within layers of the same composition, which is believed to reflect differences in carrier concentration and band bending.

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[Analysis Case] Evaluation of Impurity Concentration in Gallium Oxide Ga2O3 Films Using SIMS

[Analysis Case] Evaluation of Impurity Concentration in Gallium Oxide Ga2O3 Films Using SIMS

It is possible to quantitatively evaluate impurity elements.

Gallium oxide (Ga2O3) has a higher band gap and superior physical properties compared to SiC and GaN, making it a material of interest for power devices that can be expected to be high-efficiency and low-cost. Controlling the impurity concentration, which affects the characteristics, is crucial in wafer development. This document presents a case study of impurity concentration analysis in Ga2O3 films. It is found that B and C are below the background level, while Si is present. MST offers a range of Ga2O3 standard samples and can quantify over 30 types of impurities.

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[Analysis Case] Evaluation of Liquid Inside Smartphone Cases

[Analysis Case] Evaluation of Liquid Inside Smartphone Cases

Non-target analysis of liquid components using GC/MS is possible.

Products containing liquid in smartphone cases are being sold, but there have been incidents of skin injuries such as chemical burns due to leaks of this liquid, as well as cases of people experiencing health issues due to unpleasant odors. In response, the National Consumer Affairs Center issued a warning in April 2016, and in some cases, liquids with modified ingredients have been used. Here, we conducted non-target analysis using GC/MS on the liquid inside cases that were sold before the warning was issued to investigate what components are present.

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[Analysis Case] Evaluation of Carrier Concentration Distribution in Si-IGBT Chips

[Analysis Case] Evaluation of Carrier Concentration Distribution in Si-IGBT Chips

SRA evaluation of field stop layers and lifetime killers.

SRA can analyze the depth profile of carrier concentration distribution over a wide range from shallow regions (a few hundred nm) to deep regions (a few hundred μm). It is also possible to evaluate the in-plane distribution of resistance values at the sample surface or at specified depths. As an example, we will introduce a case where the depth profile of carrier concentration distribution for a commercially available Si-IGBT chip was evaluated, including the entire chip, the field stop layer, and the lifetime killer, as well as the in-plane distribution of resistance values at the irradiation depth of the lifetime killer using SRA.

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Analysis of trace metal elements in the environment

Analysis of trace metal elements in the environment

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

Metal elements suspended in environments such as clean rooms and production lines can adhere to or contaminate products, potentially leading to a deterioration in product performance. With ICP-MS, exposure tests can be conducted on clean Si wafers, allowing for the measurement of the amount of metal elements adhered to the surface at ppt levels. Additionally, we also offer the loan of Si wafers that have been pre-cleaned.

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[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases

[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases

You can evaluate the causes and total amount of organic contamination in the manufacturing process.

It is known that the adsorption of organic substances on the wafer surface can lead to various issues, such as the degradation of gate oxide film breakdown voltage. Therefore, as the miniaturization and high integration of semiconductor devices progress, it has become increasingly important to monitor not only inorganic substances but also trace amounts of organic substances. Here, we present a case where silicon wafers were stored in two types of wafer cases, and the organic contamination components adhered to the entire wafer surface were concentrated using a wafer analyzer and evaluated using GC/MS.

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Shotgun analysis of proteins

Shotgun analysis of proteins

LC/MS/MS: Liquid Chromatography-Mass Spectrometry

In protein composition analysis, there are methods to examine only the target protein after electrophoresis, but this document introduces "shotgun analysis," which comprehensively investigates proteins. In shotgun analysis, after separating proteins and obtaining mass information using LC/MS/MS measurements, a database search is conducted to comprehensively analyze the proteins present in the solution.

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[Analysis Case] Evaluation of Pharmaceutical Crystal Polymorphism

[Analysis Case] Evaluation of Pharmaceutical Crystal Polymorphism

It is possible to evaluate the structure of crystalline polymorphs.

The majority of pharmaceuticals are crystalline and are known to have multiple crystal forms. Even for the same substance, the physical and chemical properties, such as solubility, can differ depending on the crystal form, which can also affect the efficacy and safety of the drug. Therefore, the identification of crystal forms is extremely important. In this case, XRD analysis was conducted to evaluate the crystal forms of the active pharmaceutical ingredient in question, both for the pure active pharmaceutical powder and for the commercial products.

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Sample introduction method in Karl Fischer volumetric titration.

Sample introduction method in Karl Fischer volumetric titration.

Karl Fischer titration method

The Karl Fischer titration method is a way to evaluate the moisture content, and the method of introducing the sample into the device varies depending on the properties of the sample. Here, we will introduce two sample introduction methods for titration.

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[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

Detailed information about the valence band, conduction band, and gap states of the material can be obtained.

Understanding the band structure, including valence bands, conduction bands, and gap states, is an extremely important evaluation criterion for controlling various properties of materials. However, there are limited analytical methods available for direct and detailed assessment of these aspects. Simultaneous measurements of X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) using synchrotron radiation allow for a comprehensive understanding of the band structure, as well as detailed information regarding the attribution of the elements and orbitals that compose it. This document presents the XAS and XES spectra of GaN substrates as an example of measurement.

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[Analysis Case] Analysis of Fucoidan Food Standards and Specifications

[Analysis Case] Analysis of Fucoidan Food Standards and Specifications

MST is a designated testing organization for the JHFA standard (fucoidan food).

Fucoidan is a high molecular weight polysaccharide found in seaweeds, and various functional properties, including anti-cancer effects, have been reported. The Japan Health and Nutrition Food Association (JHFA) announced the standards for fucoidan foods in July 2017, and MST was registered as a designated testing institution capable of conducting the necessary analyses. The JHFA standards specify fucoidan food regulations for three types: Okinawa mozuku, mekabu, and gagome kombu. The testing items include not only the fucoidan content in raw materials and products but also tests to confirm the safety of the products, such as arsenic and bacterial count tests.

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[Analysis Case] Surface Imaging of Soft Contact Lenses in Liquid AFM

[Analysis Case] Surface Imaging of Soft Contact Lenses in Liquid AFM

Quantitative evaluation of surface properties can be performed using AFM analysis in an aqueous solution.

There are materials in polymers that change shape depending on the environment. To observe the original shape of the sample, measurements in real environmental conditions are necessary. This document presents a case study that visualizes the surface shape of soft contact lenses in saline solution. By measuring under conditions close to the actual environment, it is possible to evaluate while maintaining the original shape of the sample.

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[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye

[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye

It is possible to process the eyeball and visualize the drug components (imaging).

Knowing how administered drugs distribute within the body is important information for drug development. In this case, the drug was directly administered into the vitreous body of fish eyes, and the distribution of the drug components was evaluated in cross-sections of the eyeball. As a result, the drug components were strongly detected near the administration site, showing their distribution within the eye. By using a mass microscope called TOF-SIMS, it is possible to apply this to the pharmacokinetics of various biological organs, including the eyeball.

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[Analysis Case] Damage Assessment of Single Crystal Si Surface

[Analysis Case] Damage Assessment of Single Crystal Si Surface

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

In the semiconductor manufacturing process, ion irradiation is sometimes performed for the purpose of surface modification. It is known that irradiating the surface of single-crystal Si with ions of inert elements can cause structural damage and lead to the formation of an amorphous layer. Utilizing the fact that high-resolution XPS spectra detect c (single-crystal) Si and a (amorphous) Si with different peak shapes, we will introduce a case where this damage-derived a-Si was separated from c-Si and quantitatively evaluated.

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