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analysis(tem) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Last Updated： Aggregation Period:Mar 04, 2026～Mar 31, 2026
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analysis Product List

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Japan MarTech Nagoya Lab's analytical equipment

Japan MarTech Nagoya Lab's analytical equipment

We are introducing the machines used in our contract analysis service for materials and structures!

We would like to introduce the analytical equipment held by the Nagoya Lab of Japan MarTech. We offer services in material analysis and structural analysis, supported by 4 FIBs and 4 TEMs. We conduct contract analysis services using equipment such as FIB-G4, FIB-NOVA, TEM-Talos, and Glovebox. Please feel free to contact us for more details. 【Equipment Available】 ■FIB-G4×2 (1 unit with EDX) ■FIB-G5×1 (added and operational since March 2022) ■FIB-NOVA×1 (with Cryo Stage) ■TEM-Talos×2 (with EDX) (1 unit added and operational since April 2022) ■TEM-Titan×1 (with EDX and EELS) ■TEM-NEOARM×1 (with Cs-STEM, EELS, and EDX) ■Glovebox×1 (designed for non-atmospheric exposure) *For more details, please refer to the PDF document or feel free to contact us.

  • Other Analysis
  • analysis

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Fine structure analysis | TEM/STEM (Transmission Electron Microscopy Analysis)

Fine structure analysis | TEM/STEM (Transmission Electron Microscopy Analysis)

Nano to angstrom resolution! Observation of fine morphology and composition analysis at the atomic level.

TEM/STEM is an analytical method that uses an electron beam to image samples. The spatial resolution of TEM/STEM is approximately 1 to 2 Å. High-energy electrons (80 to 200 keV) can penetrate electron-transparent samples (up to about 100 nm thick). While the spatial resolution of TEM/STEM is superior to that of SEM, it often requires complex sample preparation. Additionally, in recent years, the introduction of AC-STEM (STEM with spherical aberration-corrected lenses) has enabled higher resolution analysis compared to conventional STEM. EAG Laboratories owns more than 20 TEM/STEM instruments and over 30 FIB-SEM systems for sample preparation. We also have multiple EDS/EELS systems for elemental analysis. With a sufficient number of facilities for analysis, we can always respond to TEM/STEM analysis requests with short turnaround times (standard delivery: 6 to 8 business days / expedited delivery: upon inquiry).

  • Electron microscope
  • Contract Analysis
  • Contract measurement
  • analysis

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FIB low acceleration processing

FIB low acceleration processing

FIB: Focused Ion Beam Processing

In the method for preparing thin film samples for TEM observation using FIB, high-energy Ga ions (acceleration voltage of 30 kV) are used, resulting in the formation of a damage layer on the processed surface, which causes a deterioration in the image quality of the TEM. By performing processing at a lower acceleration (2 kV) than conventional methods, the damage layer can be reduced, leading to improved image quality. By reducing the damage on the FIB processed surface through low-acceleration FIB processing, high-quality and reliable data can be obtained in TEM image observation and EELS measurements.

  • Contract Analysis
  • analysis

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Physical Analysis of DLC

Physical Analysis of DLC

Various analyses of DLC (Diamond-Like Carbon) are possible!

We will introduce the evaluation of the crystallinity, film thickness structure, hydrogen content, density, and hardness of DLC (Diamond-Like Carbon).

  • Contract Analysis
  • analysis

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K-kit: A Tool for Observing Liquid Samples under an Electron Microscope

K-kit: A Tool for Observing Liquid Samples under an Electron Microscope

You can evaluate the properties of nanomaterials, strong aggregates, and weak aggregates (NOAAs) in liquids!

The "K-kit" is a single-use, sealable carrier equipped with microchannels inside. It is designed to facilitate the observation of liquid samples in TEM and SEM, allowing for the characterization of nanomaterials, strong aggregates, and weak aggregates (NOAAs) in liquid. It is suitable for the analysis of nanoparticles and their aggregates and clusters across various industries, including electronics, cosmetics, food, and biomedical. 【Features】 ■ High versatility ■ Reliability of materials and structure ■ High-quality TEM images ■ Sample preparation methods: wet method and dry method *For more details, please refer to the PDF document or feel free to contact us.

  • Other Analysis
  • analysis

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[Analysis Case] Composite Evaluation of the Active Layer of SiC Power MOSFETs

[Analysis Case] Composite Evaluation of the Active Layer of SiC Power MOSFETs

Evaluate the shape of the active layer and the dopant.

We will introduce a case study evaluating the distribution of the diffusion layer in commercially available SiC power MOSFET devices. In the SiC MOSFET manufacturing process, the channel is formed through ion implantation, activation heat treatment, and epitaxial layer formation. During the active layer formation process, we understood the device structure through TEM observation and evaluated the diffusion layer distribution of the p-type/n-type cross-section and the epitaxial layer from SCM measurements, as well as the depth concentration distribution of dopant elements (N, Al, P) from SIMS measurements. Measurement methods: SIMS, SCM, TEM Product field: Power devices Analysis purpose: Trace concentration evaluation, shape evaluation, product investigation For more details, please download the materials or contact us.

  • Contract Analysis
  • analysis

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Distortion evaluation using SEM equipment

Distortion evaluation using SEM equipment

EBSD: Electron Backscatter Diffraction

Measurements can be performed in bulk state without the need for thinning processes like TEM (NBD: Nano Beam Diffraction). It has the high spatial resolution characteristic of SEM and relatively high strain sensitivity. Additionally, there is a possibility of detecting local lattice strain as tensor data.

  • Contract Analysis
  • analysis

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[Analysis Case] Evaluation of Contact Electrodes for SiC Power MOSFETs

[Analysis Case] Evaluation of Contact Electrodes for SiC Power MOSFETs

Identification of the interface between contact electrodes and SiC layer, and evaluation of elemental distribution.

We will introduce an analysis case of commercially available SiC power MOSFET devices. In SiC materials, it is essential to control the materials in a system that includes not only Si but also C, which differs from the conventional manufacturing methods of Si semiconductors. In the process of forming ohmic junctions between the contact electrodes and the SiC layer, we evaluated the elemental distribution and crystal phases, including C, using EDX/EELS analysis with TEM and electron diffraction.

  • Contract Analysis
  • analysis

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What is a HAADF-STEM image?

What is a HAADF-STEM image?

HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy

■Principle HAADF-STEM (High-angle Annular Dark Field Scanning TEM) images are obtained by scanning a finely focused electron beam across the sample and detecting the electrons that are scattered at high angles using an annular detector. ■Features Materials with a larger Z2ρ scatter more at high angles ↓ Heavy elements appear dark in STEM images and bright in HAADF-STEM images. Since contrast is obtained that is proportional to atomic number (Z), it is also referred to as Z-contrast imaging.

  • Contract Analysis
  • analysis

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[FIB] Focused Ion Beam Processing

[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

FIB refers to a focused ion beam with diameters ranging from several nanometers to several hundred nanometers, which can be used to etch specific areas (sputtering) or deposit materials such as carbon (C), tungsten (W), and platinum (Pt) onto specific regions by scanning the sample surface. Additionally, the shape of the processed sample can be recognized through SIM images, which detect secondary electrons generated by irradiating the sample with the ion beam. - Arbitrary shape processing through etching in micro-regions (several nanometers to several tens of micrometers) is possible (typical processing size: around 20 μm) - Sample preparation for SEM, SEM-STEM, and TEM imaging (cross-sections of specific areas can be produced) - Fine pattern deposition and thin film formation (C, W, Pt deposition) are possible in the range of several micrometers to several tens of micrometers - High-resolution SIM (Scanning Ion Microscope) imaging is possible (acceleration voltage 30 kV: 4 nm) - Observation of metal crystal grains (Al, Cu, etc.) is possible with SIM images.

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  • セミナー.jpg
  • Contract Analysis
  • Contract measurement
  • Contract Inspection
  • analysis

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[Analysis Case] Discrimination between Anatase and Rutile Types of Titanium Dioxide

[Analysis Case] Discrimination between Anatase and Rutile Types of Titanium Dioxide

TEM-EELS enables elemental identification and chemical state analysis in micro-regions.

Titanium dioxide (TiO2), used in electronic materials, catalytic materials, ultraviolet absorbers, and photocatalysts, exists in two forms with the same composition but different crystal structures: anatase and rutile. We conducted measurements on a polycrystalline TiO2 sample with a thickness of 20 nm, deposited on a Si substrate (Photo 1), using an electron beam probe focused down to approximately 1 nmΦ (FWHM). The EELS spectra obtained from the sample match the standard spectra of anatase TiO2 for both Ti and O (Figures 1 and 2).

  • Contract Analysis
  • analysis

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Composition and state analysis of magnetic metal multilayer films.

Composition and state analysis of magnetic metal multilayer films.

The characteristics of magnetic resistance elements are important to analyze by combining various analytical methods!

We would like to introduce our "Composition and State Analysis of Magnetic Metal Multilayers." GMR elements and MTJ elements (spintronic devices that include magnetic metal multilayers) are being advanced for practical use in HDD magnetic heads and MRAM. The characteristics of such magnetoresistive elements can vary significantly due to their structure and interfaces, making it important to analyze their behavior using a combination of various analytical methods. 【Interface State Analysis】 ■XPS ■HAXPES ■TEM-EELS ■3DAP (APT) *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • analysis

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Cross-sectional processing using the ion polish method.

Cross-sectional processing using the ion polish method.

A method for removing the surface of a sample by utilizing the sputtering phenomenon, where sample atoms are ejected from the sample surface.

The IP method utilizes the sputtering phenomenon, where sample atoms are ejected from the sample surface when an ion beam with aligned energy and direction is irradiated onto the sample. It is also referred to as the CP method (Cross-section Polish). The ion species used is typically a noble gas (Ar in MST) that does not pose concerns for chemical reactions with the sample. In the AES analysis of the processed surface, the components of the shielding plate (Ni, P) were below the detection limit. ■Features - Wide-area cross-section processing is possible (approximately 500μm to 1mm) - No impact from mechanical polishing damage - Minimal surface contamination - Non-exposure to the atmosphere, cooling processing is possible

  • Contract Analysis
  • Contract measurement
  • analysis

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Focused Ion Beam Processing Observation Device [Examples of Processing Available]

Focused Ion Beam Processing Observation Device [Examples of Processing Available]

Nano-order processing technology with a few microns or less! Low-damage processing (high precision and high quality) is possible with ultra-low acceleration voltage!

【PR Points】 - Ultra-fine hole processing of φ1um or smaller is possible - Fine structure processing is possible ...etc 【Principle of Focused Ion Beam (FIB) Processing】 By scanning a focused ion beam, concentrated to a few tens of nanometers, across the surface of a sample, secondary electrons generated can be detected, allowing for the observation of microscopic images and processing of the sample surface. The ion source of the FIB uses gallium ions, and when this ion beam is irradiated onto the surface of the sample, secondary electrons are generated from the sample surface. Additionally, since gallium ions are much heavier than electrons, a phenomenon known as sputtering occurs, where atoms constituting the sample are ejected. These ejected atoms become secondary ions and fly away from the sample. By utilizing these phenomena, observation and processing are performed. 【Specifications】 - Maximum work size: 50(X)×50(Y)×10(Z)mm - Minimum processing size (guideline): Groove width: 100nm (up to L/D=3), Hole diameter φ200nm (up to L/D=5) - High-speed and large-area processing with high probe current - Low-damage processing with ultra-low acceleration voltage (for TEM sample preparation, etc.) *Examples and achievements of processing are currently available. For more details, please contact us or download the catalog to view.

  • Processing Contract
  • analysis

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Surface analysis X-ray photoelectron spectroscopy (ESCA・XPS)

Surface analysis X-ray photoelectron spectroscopy (ESCA・XPS)

We provide contract analysis services equipped with devices for physical analysis, and we also offer on-site analysis.

The main equipment includes "HR-TEM," "Q-pole type SIMS," "μESCA," and "RAMAN." We have accumulated know-how in micro and nano-level surface analysis, allowing us to provide highly reliable data in a short period. We also offer advice on the analysis of unknown samples. 【Surface Analysis: X-ray Photoelectron Spectroscopy (ESCA/XPS)】 ○ A method that identifies elements and analyzes composition and chemical bonding states by analyzing the energy of photoelectrons emitted from the surface of a sample when irradiated with X-rays, from a depth of a few nanometers. ○ It is suitable for surface analysis of insulators and allows for depth analysis using Ar ion etching and localized analysis with a beam diameter of 10 μm. ● For more details, please download the catalog or contact us.

  • Food Testing/Analysis/Measuring Equipment
  • analysis

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Diotec Semiconductor AG Company Profile

Diotec Semiconductor AG Company Profile

Active in a highly competitive market for over 40 years! We provide customized solutions.

Our affiliated company, Diotec Semiconductor AG, specializes in semiconductor diodes and rectifiers. We provide customized solutions tailored to the configuration of semiconductor chips, packages, and leads. We have been active in this highly competitive market for over 40 years. Please feel free to contact us when needed. 【Products Offered】 ■ Semiconductor Diodes ■ Rectifiers * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Contract manufacturing
  • analysis

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[Electronic Components, Defense Systems] GeneSiC Company Profile

[Electronic Components, Defense Systems] GeneSiC Company Profile

Electronic components operate at low temperatures! This enables the efficient acquisition of renewable energy sources.

Global leading manufacturer of industrial and defense systems By using GeneSiC products, we enhance performance and efficiency. GeneSiC technology products play a crucial role in saving energy in various high-power systems. The technology enables the efficient harnessing of renewable energy sources. Additionally, the electronic components can operate at low temperatures. 【Products Offered】 ■ Electronic Components *You can download the English version of the catalog. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other electronic parts
  • analysis

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Comprehensive characterization for the development and manufacturing of safe and highly effective vaccines.

Comprehensive characterization for the development and manufacturing of safe and highly effective vaccines.

Efficient evaluation of potency, safety, and stability using light scattering detectors and LC-MS.

To quickly deliver safe and highly effective vaccines to the market, thorough characterization analysis is necessary. By using light scattering detectors, a wealth of information can be obtained regarding the vaccine's size, aggregation, stability, interactions, composition, and conformation. By combining MALS (Multi-Angle Light Scattering) and DLS (Dynamic Light Scattering), information about the conformation (shape and structure) of molecules can be derived from the ratio of Rh (hydrodynamic radius) to Rg (radius of gyration). Furthermore, by combining separation techniques such as SEC (Size Exclusion Chromatography) and FFF (Field Flow Fractionation), high-resolution size and molecular weight distribution measurements can be achieved. In LC-MS, peptide mapping allows for the confirmation of primary sequences and monitoring of post-translational modifications. By clicking [Submit], you are deemed to have agreed that Waters will use and process the information provided on this site in accordance with Waters' Terms of Use and Privacy Notice. Terms of Use and Privacy Notice www.waters.com/legalandprivacy

  • Other separation and analysis equipment
  • High Performance Liquid Chromatograph
  • Chromatography Consumables
  • analysis

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Strong support for research and development: "Contract Analysis Services"

Strong support for research and development: "Contract Analysis Services"

We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

MST offers various materials and research contract analysis, contract evaluation, and contract assessment services. Our knowledgeable sales representatives will propose the optimal analysis plan! With assured quality and reliable support, we leave no questions unanswered for our customers. We broadly accommodate contract analysis and contract evaluation in the electronics field, including semiconductors, metals, and batteries, as well as in the life sciences field, including pharmaceuticals, cosmetics, and food. - We accept inquiries regarding analysis methods. - Please feel free to contact us for a cost estimate for analysis. - Inquiries and applications regarding analysis are accepted via phone or contact form. 【Examples of Contract Analysis Data】 ○ TEM Analysis: Observation at the atomic level ○ SIMS Analysis: Evaluation of impurity concentration ○ XRD Analysis: Identification of crystals using X-rays For more details, please download the catalog or contact us.

  • Contract Analysis
  • Contract measurement
  • Contract Inspection
  • analysis

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Kenic system's LCD controller

Kenic system's LCD controller

"Easy and Useful" is our policy.

【Features】 ・Externally, it seems like a dedicated IC. ・therefore, it can quickly support the discontinuance of the LCD or specificaitons change. ・The image frame buffer appears to be SRAM from Host-CPU, therefore software disign is easy. ・「Direct connection to the Host-CPU with 8bit」and there is a complete, one-to-one correlation between the mapping coordinates of the pixels and addresses as seen from the Customer’s CPU. ・Power supply is a 3.3V single power supply.

  • controller
  • analysis

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Analysis Service | JTL

Analysis Service | JTL

We support consistent evaluation from the identification of analysis areas to sample preparation, observation, and analysis, regardless of organic or inorganic materials.

We provide comprehensive support from advanced sample preparation using precision grinding, ion milling, and FIB, to observation and analysis using SEM and EPMA. Additionally, we can perform non-destructive internal structure observation using SAT and X-ray CT. In chemical analysis, we conduct various analyses of target components using FT-IR, ICP, GC, and HPLC.

  • Public Testing/Laboratory
  • Contract measurement
  • Other services
  • analysis

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STR analysis (for cell authentication)

STR analysis (for cell authentication)

Conducting STR analysis using the GenePrint24System! Determining the STR genotypes at 24 specific locations.

At Fasmac, we offer STR analysis (for cell authentication). We conduct STR analysis using the GenePrint24System (from Promega). After performing multiplex PCR with the kit, we carry out capillary electrophoresis to determine the STR genotypes at 24 specific locations, including CODIS and ESS loci, as well as Y chromosome loci. The allele data we report can be used for cell authentication by cross-referencing with public databases. 【Details】 ■ Delivery time: 1 week ■ Items to be sent - DNA sample (20ng or more) *Please send it via refrigerated or frozen shipping - Printed order sheet ■ Deliverables - Allele data (Excel), waveform data (PDF/fsa file) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Contract Analysis
  • Analysis Services
  • analysis

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[Research Material] Global Market for Cathode Materials for Lithium Batteries

[Research Material] Global Market for Cathode Materials for Lithium Batteries

World Market for Lithium Battery Cathode Materials: LCO, NCM, LMO, LFP, NCA, Automotive, Aerospace, Home Appliances, Others

This research report (Global Positive Electrode Materials for Li-Batteries Market) investigates and analyzes the current state and outlook for the global market of positive electrode materials for lithium batteries over the next five years. It includes information on the overview of the global lithium battery positive electrode materials market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The segments by type in the lithium battery positive electrode materials market include LCO, NCM, LMO, LFP, and NCA, while the segments by application cover automotive, aerospace, home appliances, and others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa, to calculate the market size for lithium battery positive electrode materials. It also includes the market share of major companies in lithium battery positive electrode materials, product and business overviews, and sales performance.

  • Other services
  • analysis

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Xiner Semiconductor Technology

Xiner Semiconductor Technology

Xiner was established in 2013.

Xiner was established in 2013 and has received joint investment from well-known institutions such as Shenzhen Zhengyuan Technology, Shenzhen State-owned Assets Supervision and Administration Commission, Shenzhen Talent Innovation Fund, Dachen Venture Capital, Fangguang Capital, and Xiamen Falcon. We focus on the development, application, and sales of IGBT chips, IGBT driver chips, and high-power intelligent power modules. Xiner has an experienced and practical team, with key personnel accumulating over 10 years of industry experience and successfully achieving mass production of IGBT products based on FST technology for the first time in China. Xiner has research and development centers in Shanghai and Shenzhen, and has established sales offices in Shenzhen, Shanghai, Qingdao, Shunde, and Hangzhou to respond quickly to customer needs. Xiner adheres to a business philosophy of application-oriented research and development and open cooperation. We deeply explore customer application requirements, focus on the research and development and design of IGBT-related products, and collaborate with the best partners in the industry to provide customers with the most stable and cost-effective power devices.

  • Transistor
  • analysis

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Elemental Analysis Service by EDX | JTL

Elemental Analysis Service by EDX | JTL

Qualitative and quantitative analysis of elements (B to U) contained on the sample surface will be conducted.

The elemental analysis service using Energy Dispersive X-ray Spectroscopy (EDX) measures the energy of characteristic X-rays excited by directing an electron beam from the EDX device onto the sample, allowing for elemental analysis of the sample surface from the obtained spectrum. It is possible to analyze where on the sample surface certain elements are present (qualitative) and in what quantities (quantitative).

  • Contract measurement
  • Contract Analysis
  • Analytical Equipment and Devices
  • analysis

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